Kink-related noise overshoot in SOI n-MOSFETS operating at 4.2 K (Englisch)
- Neue Suche nach: Simoen, E.
- Neue Suche nach: Dierickx, B.
- Neue Suche nach: Claeys, C.
- Neue Suche nach: Simoen, E.
- Neue Suche nach: Dierickx, B.
- Neue Suche nach: Claeys, C.
In:
Electronics Letters
;
28
, 6
;
577-579
;
1992
- Aufsatz (Zeitschrift) / Print
-
Titel:Kink-related noise overshoot in SOI n-MOSFETS operating at 4.2 K
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Beteiligte:
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Erschienen in:Electronics Letters ; 28, 6 ; 577-579
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Verlag:
- Neue Suche nach: IET Digital Library Archive
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Erscheinungsdatum:12.03.1992
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Format / Umfang:3 pages
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 28, Ausgabe 6
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