0.4 mW, 0.27 pJ/bit true random number generator using jitter, metastability and current starved topology (Englisch)
Freier Zugriff
- Neue Suche nach: Kumar, Dhirendra
- Neue Suche nach: Anand, Rahul
- Neue Suche nach: Singh, Sajai Vir
- Neue Suche nach: Misra, Prasanna Kumar
- Neue Suche nach: Srivastava, Ashok
- Neue Suche nach: Goswami, Manish
- Neue Suche nach: Kumar, Dhirendra
- Neue Suche nach: Anand, Rahul
- Neue Suche nach: Singh, Sajai Vir
- Neue Suche nach: Misra, Prasanna Kumar
- Neue Suche nach: Srivastava, Ashok
- Neue Suche nach: Goswami, Manish
In:
IET Circuits, Devices & Systems
;
14
, 7
;
1001-1011
;
2020
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:0.4 mW, 0.27 pJ/bit true random number generator using jitter, metastability and current starved topology
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Beteiligte:Kumar, Dhirendra ( Autor:in ) / Anand, Rahul ( Autor:in ) / Singh, Sajai Vir ( Autor:in ) / Misra, Prasanna Kumar ( Autor:in ) / Srivastava, Ashok ( Autor:in ) / Goswami, Manish ( Autor:in )
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Erschienen in:IET Circuits, Devices & Systems ; 14, 7 ; 1001-1011
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Verlag:
- Neue Suche nach: The Institution of Engineering and Technology
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Erscheinungsdatum:22.10.2020
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Format / Umfang:11 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:ring oscillator , parametric analysis , generated random signals , power 0.4 mW , speed dissipation , binary format , oscillators , logic gates , current starved topology , sampling blocks , generated random numbers , metastable block , Cadence Virtuoso tool , logic design , CMOS logic circuits , current starved inverter , statistical testing , CMOS technology environment , power dissipation , true random number generator , random number generation , post-layout simulation , Kolmogorov–Smirnov test , jitter extraction , timing jitter , jitter metastability , bit rate 1.5 Gbit/s , NIST 800.22 statistical test suite , frequency dividers , size 180.0 nm , Chi-square test , high-frequency divider block , Matlab , TRNG design
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Datenquelle:
Metadata by IET is licensed under CC BY 3.0
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