NBTI model for analogue IC reliability simulation (Englisch)
- Neue Suche nach: Maricau, E.
- Neue Suche nach: Gielen, G.
- Neue Suche nach: Maricau, E.
- Neue Suche nach: Gielen, G.
In:
Electronics Letters
;
46
, 18
;
1279-1280
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:NBTI model for analogue IC reliability simulation
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Beteiligte:Maricau, E. ( Autor:in ) / Gielen, G. ( Autor:in )
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Erschienen in:Electronics Letters ; 46, 18 ; 1279-1280
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Verlag:
- Neue Suche nach: The Institution of Engineering and Technology
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Erscheinungsdatum:02.12.2010
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Format / Umfang:2 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 46, Ausgabe 18
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