Charge-based testing BIST for embedded memories (Englisch)
- Neue Suche nach: Alorda, B.
- Neue Suche nach: Paul, I. de
- Neue Suche nach: Segura, J.
- Neue Suche nach: Alorda, B.
- Neue Suche nach: Paul, I. de
- Neue Suche nach: Segura, J.
In:
IET Computers & Digital Techniques
;
1
, 5
;
481-490
;
2007
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Charge-based testing BIST for embedded memories
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Beteiligte:
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Erschienen in:IET Computers & Digital Techniques ; 1, 5 ; 481-490
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Verlag:
- Neue Suche nach: The Institution of Engineering and Technology
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Erscheinungsdatum:01.12.2007
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Format / Umfang:10 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 1, Ausgabe 5
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