1-Grad total dose evaluation of 65 nm CMOS technology for the HL-LHC upgrades (Englisch)
Freier Zugriff
- Neue Suche nach: M. Menouni
- Neue Suche nach: M. Barbero
- Neue Suche nach: F. Bompard
- Neue Suche nach: S. Bonacini
- Neue Suche nach: D. Fougeron
- Neue Suche nach: R. Gaglione
- Neue Suche nach: A. Rozanov
- Neue Suche nach: P. Valerio
- Neue Suche nach: A. Wang
- Neue Suche nach: M. Menouni
- Neue Suche nach: M. Barbero
- Neue Suche nach: F. Bompard
- Neue Suche nach: S. Bonacini
- Neue Suche nach: D. Fougeron
- Neue Suche nach: R. Gaglione
- Neue Suche nach: A. Rozanov
- Neue Suche nach: P. Valerio
- Neue Suche nach: A. Wang
In:
Journal of Instrumentation
;
10
, 05
;
C05009
;
2015
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:1-Grad total dose evaluation of 65 nm CMOS technology for the HL-LHC upgrades
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Beteiligte:M. Menouni ( Autor:in ) / M. Barbero ( Autor:in ) / F. Bompard ( Autor:in ) / S. Bonacini ( Autor:in ) / D. Fougeron ( Autor:in ) / R. Gaglione ( Autor:in ) / A. Rozanov ( Autor:in ) / P. Valerio ( Autor:in ) / A. Wang ( Autor:in )
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Erschienen in:Journal of Instrumentation ; 10, 05 ; C05009
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Verlag:
- Neue Suche nach: Institute of Physics
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Erscheinungsdatum:01.05.2015
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 10, Ausgabe 05
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