Accelerated measurement of electrical resistivity and Seebeck coefficient for thin-layer thermoelectric materials (Englisch)
- Neue Suche nach: Yao, Lei
- Neue Suche nach: Yang, Dongwang
- Neue Suche nach: Tao, Qirui
- Neue Suche nach: Zhang, Zhengkai
- Neue Suche nach: Luo, Jiangfan
- Neue Suche nach: Yan, Yonggao
- Neue Suche nach: Tang, Xinfeng
- Weitere Informationen zu Tang, Xinfeng:
- https://orcid.org/0000-0002-0715-5529
- Neue Suche nach: Yao, Lei
- Neue Suche nach: Yang, Dongwang
- Neue Suche nach: Tao, Qirui
- Neue Suche nach: Zhang, Zhengkai
- Neue Suche nach: Luo, Jiangfan
- Neue Suche nach: Yan, Yonggao
- Neue Suche nach: Tang, Xinfeng
- Weitere Informationen zu Tang, Xinfeng:
- https://orcid.org/0000-0002-0715-5529
In:
Measurement Science and Technology
;
34
, 9
;
2023
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Accelerated measurement of electrical resistivity and Seebeck coefficient for thin-layer thermoelectric materials
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Beteiligte:Yao, Lei ( Autor:in ) / Yang, Dongwang ( Autor:in ) / Tao, Qirui ( Autor:in ) / Zhang, Zhengkai ( Autor:in ) / Luo, Jiangfan ( Autor:in ) / Yan, Yonggao ( Autor:in ) / Tang, Xinfeng ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: IOP Publishing
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Erscheinungsdatum:01.09.2023
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Format / Umfang:9 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 34, Ausgabe 9
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