An advanced SEU tolerant latch based on error detection Project supported by the National Natural Science Foundation of China (Nos. 61404001, 61306046), the Anhui Province University Natural Science Research Major Project (No. KJ2014ZD12), the Huainan Science and Technology Program (No. 2013A4011), and the National Natural Science Foundation of China (No. 61371025). (Englisch)
Paper
- Neue Suche nach: Hui Xu
- Neue Suche nach: Jianwei Zhu
- Neue Suche nach: Xiaoping Lu
- Neue Suche nach: Jingzhao Li
- Neue Suche nach: Hui Xu
- Neue Suche nach: Jianwei Zhu
- Neue Suche nach: Xiaoping Lu
- Neue Suche nach: Jingzhao Li
In:
Journal of Semiconductors
;
39
, 5
;
055003
;
2018
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:An advanced SEU tolerant latch based on error detection Project supported by the National Natural Science Foundation of China (Nos. 61404001, 61306046), the Anhui Province University Natural Science Research Major Project (No. KJ2014ZD12), the Huainan Science and Technology Program (No. 2013A4011), and the National Natural Science Foundation of China (No. 61371025).
-
Untertitel:Paper
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Weitere Titelangaben:An advanced SEU tolerant latch based on error detection
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Beteiligte:Hui Xu ( Autor:in ) / Jianwei Zhu ( Autor:in ) / Xiaoping Lu ( Autor:in ) / Jingzhao Li ( Autor:in )
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Erschienen in:Journal of Semiconductors ; 39, 5 ; 055003
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Verlag:
- Neue Suche nach: Institute of Physics
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Erscheinungsdatum:01.05.2018
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Format / Umfang:4 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 39, Ausgabe 5
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