Analysis of restrain erosion behavior in layered armatures (Englisch)
- Neue Suche nach: Gong, Fei
- Neue Suche nach: Li, Xin
- Neue Suche nach: Weng, Chun-Sheng
- Neue Suche nach: Gong, Fei
- Neue Suche nach: Li, Xin
- Neue Suche nach: Weng, Chun-Sheng
In:
International Journal of Applied Electromagnetics and Mechanics
;
53
, 4
;
579-589
;
2016
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Analysis of restrain erosion behavior in layered armatures
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Beteiligte:
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Erschienen in:International Journal of Applied Electromagnetics and Mechanics ; 53, 4 ; 579-589
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Verlag:
- Neue Suche nach: IOS Press
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Erscheinungsort:Amsterdam, The Netherlands
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Erscheinungsdatum:30.12.2016
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Format / Umfang:11 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 53, Ausgabe 4
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