Evaluation of single-crystal X-ray diffraction data from a position-sensitive detector (Englisch)
Nationallizenz
- Neue Suche nach: Kabsch, W.
- Neue Suche nach: Kabsch, W.
In:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
;
21
, Pt 6
;
916-924
;
1988
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Evaluation of single-crystal X-ray diffraction data from a position-sensitive detector
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Beteiligte:Kabsch, W. ( Autor:in )
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Erschienen in:JOURNAL OF APPLIED CRYSTALLOGRAPHY ; 21, Pt 6 ; 916-924
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Verlag:
- Neue Suche nach: International Union of Crystallography
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Erscheinungsdatum:01.12.1988
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Format / Umfang:9 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 21, Ausgabe Pt 6
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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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