Verification of Electron Distributions in Silicon by Means of Hot Carrier Luminescence Measurements (Englisch)
- Neue Suche nach: Selmi, L.
- Neue Suche nach: Selmi, L.
- Neue Suche nach: Mastrapasqua, M.
- Neue Suche nach: Boulin, D.M.
- Neue Suche nach: Bude, J.D.
- Neue Suche nach: Pavesi, M.
- Neue Suche nach: Sangiorgi, E.
- Neue Suche nach: Pinto, M.R.
In:
IEEE transactions on electron devices
;
45
, 4
; 802-808
;
1998
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Verification of Electron Distributions in Silicon by Means of Hot Carrier Luminescence Measurements
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Beteiligte:Selmi, L. ( Autor:in ) / Mastrapasqua, M. / Boulin, D.M. / Bude, J.D. / Pavesi, M. / Sangiorgi, E. / Pinto, M.R.
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Erschienen in:IEEE transactions on electron devices ; 45, 4 ; 802-808
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:New York, NY
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Erscheinungsdatum:1998
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ISSN:
-
ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 53.50 / 53.00 / 52.50 / 54.20
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/5670
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Schlagwörter:
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Klassifikation:
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Datenquelle:
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