Stacking faults imaged by scanning tunneling microscopy (Englisch)
- Neue Suche nach: Bo, Xiang-Zheng
- Neue Suche nach: Bo, Xiang-Zheng
- Neue Suche nach: Fang, Hong-Sheng
In:
Materials letters
;
37
, 1-2
; 98-101
;
1999
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Stacking faults imaged by scanning tunneling microscopy
-
Beteiligte:Bo, Xiang-Zheng ( Autor:in ) / Fang, Hong-Sheng
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Erschienen in:Materials letters ; 37, 1-2 ; 98-101
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Verlag:
- Neue Suche nach: Elsevier
-
Erscheinungsort:New York, NY [u.a.]
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Erscheinungsdatum:1999
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ISSN:
-
ZDBID:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
BKL: 51.00 Werkstoffkunde: Allgemeines -
Datenquelle:
Inhaltsverzeichnis – Band 37, Ausgabe 1-2
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