LETTERS - Silicon Devices - The Dependence of Channel Length on Channel Width in Narrow-Channel CMOS Devices for 0.35-0.13 mm Technologies (Englisch)
- Neue Suche nach: Hook, T.B.
- Neue Suche nach: Hook, T.B.
- Neue Suche nach: Biesemans, S.
- Neue Suche nach: Slinkman, J.
In:
IEEE electron device letters
;
21
, 2
; 85-87
;
2000
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:LETTERS - Silicon Devices - The Dependence of Channel Length on Channel Width in Narrow-Channel CMOS Devices for 0.35-0.13 mm Technologies
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Beteiligte:
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Erschienen in:IEEE electron device letters ; 21, 2 ; 85-87
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:New York, NY
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Erscheinungsdatum:2000
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/5670
- Neue Suche nach: 53.51
- Weitere Informationen zu Basisklassifikation
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Datenquelle:
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