Compact flash X-ray sources and their applications (Englisch)
- Neue Suche nach: Pouvesle, J.M.
- Neue Suche nach: Pouvesle, J.M.
- Neue Suche nach: Cachoncinlle, C.
- Neue Suche nach: Viladrosa, R.
- Neue Suche nach: Robert, E.
- Neue Suche nach: Khacef, A.
In:
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
;
113
, 1-4
; 134-140
;
1996
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Compact flash X-ray sources and their applications
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Beteiligte:
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Erschienen in:
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Verlag:
- Neue Suche nach: Elsevier
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Erscheinungsort:Amsterdam [u.a.]
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Erscheinungsdatum:1996
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 535/3450
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 113, Ausgabe 1-4
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
The feasibility of high power cyclotronsStammbach, Th et al. | 1996
- 8
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Large area ion and plasma beam sourcesWaldorf, J. et al. | 1996
- 16
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A new injector for the ISL-cyclotron at HMIEngels, O. et al. | 1996
- 21
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Technique for fluence attenuation by acceleration of decay particlesItahashi, T. et al. | 1996
- 26
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The cooler synchrotron COSY in JuelichBechstedt, U. / Dietrich, J. / Maier, R. / Martin, S. / Prasuhn, D. / Schnase, A. / Schneider, H. / Stockhorst, H. / Toelle, R. et al. | 1996
- 26
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The cooler synchrotron COSY in JülichBechstedt, U. et al. | 1996
- 30
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Ar+-beam experiments with the high-current heavy-ion Spiral-RFQ at GSIBessler, U. et al. | 1996
- 34
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The Frankfurt ECRIS-RFQ facility for materials research with highly charged ionsStiebing, K. et al. | 1996
- 38
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Design of low frequency RFQ accelerators for ion implantationVormann, H. et al. | 1996
- 42
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Study on a tuning-free network for the rf accelerating cavitySato, K. et al. | 1996
- 46
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Development of heavy ion IHQ linac for material irradiationIto, T. et al. | 1996
- 50
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Energy widths of ion beams from a tandem acceleratorHartmann, B. et al. | 1996
- 54
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The Proton Irradiation Facility at the Paul Scherrer InstituteHajdas, W. et al. | 1996
- 59
-
Ion irradiation facility for materials research at the 1.4 MeV-u high-charge state injector of GSITinschert, K. et al. | 1996
- 63
-
Concept and status of the new sample preparation and analyzing facility at BochumKubsky, S. et al. | 1996
- 67
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Fine-focusing system of intense beams for application of ion-induced plasmaSasa, K. et al. | 1996
- 71
-
Computer simulation for electrostatic lenses by using piecewise polynomialsKiss, L. et al. | 1996
- 75
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Low-energy ion source characteristics for producing an ultra-fine microbeamIshii, Y. et al. | 1996
- 78
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Beam-current measurement based on residual gas ionizationBohne, W. et al. | 1996
- 81
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Review of industrial applications of electron acceleratorsMehnert, R. et al. | 1996
- 88
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Focused high-voltage electron beams in material scienceSigle, W. et al. | 1996
- 93
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Custom-tailored dose with the IMPELA electron irradiatorDrewell, N.H. et al. | 1996
- 96
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The measurement, control, and validation of critical parameters in an electron beam sterilization facilityBurns, P. et al. | 1996
- 99
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Preliminary research concerning the use of electron accelerators to improve the conservability and to extend the shelf-life of fruits and vegetablesMinea, R. et al. | 1996
- 103
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Electron beam technology for improvement of the recovery characteristics of power thyristorsIliescu, E. et al. | 1996
- 106
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IAP linacs in applied researchMartin, D. et al. | 1996
- 110
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Excimer lasers induced electron beams on metal cathodes under a plasma effectBeloglazov, A. et al. | 1996
- 114
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Computer aided simulations of high current small energy electron beam channelsMarghitu, S. et al. | 1996
- 119
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Improving beam profiles in the Super-ALIS super conducting storage ringYamada, K. et al. | 1996
- 122
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X-ray microprobesChevallier, P. et al. | 1996
- 128
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Accelerator based X-ray facilities applied to freight controlGaillard, G. et al. | 1996
- 134
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Compact flash X-ray sources and their applicationsPouvesle, J.M. et al. | 1996
- 141
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X-ray detectors with digitized preamplifiersStein, J. et al. | 1996
- 146
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Improvement of heavy element tomography results using tunable gamma-ray beamsBertschy, M. et al. | 1996
- 150
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Direct measurement and Monte Carlo simulation of a bremsstrahlung source created by 10 MeV electronsStritt, N. et al. | 1996
- 154
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Ion beam modification for submicron technologyKalbitzer, S. et al. | 1996
- 161
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Application of ion implantation in tooling industryStraede, C.A. et al. | 1996
- 167
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Depth resolving phase analysis of ion implanted stainless steelWalter, G. et al. | 1996
- 171
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Application of nuclear analytical and electron microscopic techniques to the investigation of the oxidation behavior of Mg-implanted steel samplesNoli, F. et al. | 1996
- 176
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Aluminum ion implantation under backfilling oxygenHausner, R.M. et al. | 1996
- 182
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Diffusion phenomena of implanted nitrogen in chromiumSymietz, I. et al. | 1996
- 186
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Ion beam mixing at copper-alumina interfaces using marker geometryNeubeck, K. et al. | 1996
- 191
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Effect of Cr implantation on the morphology of Al:Si filmsZaborowski, M. et al. | 1996
- 196
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Crystallographic structure of -TiN films prepared by photon and ion beam assisted depositionWengenmair, H. / Gerlach, J. W. / Preckwinkel, U. / Stritzker, B. / Rauschenbach, B. et al. | 1996
- 196
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Crystallographic structure of d-TiN films prepared by photon and ion beam assisted depositionWengenmair, H. et al. | 1996
- 201
-
A study on the metallisation and stabilisation of porous siliconGiaddui, T. et al. | 1996
- 205
-
Low energy ion beam irradiation of siliconNebiker, P.W. et al. | 1996
- 209
-
Defect development and dopant location due to elevated temperature implantation of InP with MeV zinc ionsKrause, H. et al. | 1996
- 214
-
Epitaxial crystallization and nucleation during MeV-ion beam processing of amorphous GaAs surface layersBachmann, T. et al. | 1996
- 218
-
Light ion induced damage in CdTe and Hg(1 - x)Cd(x)Te epitaxial thin filmsRusso, S.P. et al. | 1996
- 223
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Depth profile analysis and study of the electronic properties of silicon nitride layers produced by ion implantationMarkwitz, A. et al. | 1996
- 227
-
Microstructural characterization of stoichiometric buried Si 3)N4 filmsPaloura, E.C. et al. | 1996
- 231
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The effect of ion implantation in the microstructure of Si 3)N4 films: An X-ray absorption studyPaloura, E.C. et al. | 1996
- 235
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Low-energy 15N implantation in carbon for the synthesis of carbon nitride layersLink, F. et al. | 1996
- 239
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Damage production and annealing of ion implanted silicon carbideHeft, A. et al. | 1996
- 244
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Damage and sputtering of fullerene by low energy medium and heavy ionsFink, D. et al. | 1996
- 248
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Influence of pulsed laser annealing on rare earth implanted luminescenceCan, N. et al. | 1996
- 253
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An IBA and Raman study of irradiated thin films of YBa2Cu 3)O7 superconductorVlastou, R. et al. | 1996
- 257
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Electrical conduction in ion implanted Nylon-6 filmsBalasubramanian, V. et al. | 1996
- 261
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Radiation damage in spinel single crystalsTuros, A. et al. | 1996
- 266
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Influence of plasma density and plasma sheath dynamics on the ion implantation by plasma immersion techniqueBender, H. et al. | 1996
- 270
-
RBS with monolayer resolutionKimura, K. et al. | 1996
- 275
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Elemental concentration profile in ancient gold artifacts by ion beam scatteringRuvalcaba-Sil, J.L. et al. | 1996
- 279
-
RBS characterization of iridium silicides formed by RTA in vacuumRodriguez, T. et al. | 1996
- 284
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Alpha backscattering used in stoichiometry determination of thin SiC coatings on Si(100) wafersSomatri, R. et al. | 1996
- 288
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Density of thin TiO2 filmsLaube, M. et al. | 1996
- 293
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Study of structural differences between stoichiometric and congruent lithium niobateKling, A. et al. | 1996
- 296
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Investigation of chemical processes at mineral surfaces using accelerator-based and surface analytical techniques: Heavy metal sorption on zeolite crystalsMisaelides, P. et al. | 1996
- 300
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BSCAT: Code for simulation and for analysis of the RBS-NRA spectraRajchel, B. et al. | 1996
- 303
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ERDA of solar selective absorbersAssmann, W. et al. | 1996
- 308
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Elastic recoil detection (ERD) with extremely heavy ionsForster, J.S. et al. | 1996
- 312
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Damage in semiconductor materials during heavy-ion elastic recoil detection analysisWalker, S.R. et al. | 1996
- 317
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From micro- to nanoprobes: Auspices and horizonsButz, T. et al. | 1996
- 323
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Nuclear microprobe designMutsaers, P.H.A. et al. | 1996
- 330
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Applications of nuclear microprobes in the semiconductor industryTakai, M. et al. | 1996
- 336
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Applications of nuclear microprobes in environmental researchMalmqvist, K.G. et al. | 1996
- 347
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Ion beam studies of archaeological gold jewellery itemsDemortier, G. et al. | 1996
- 354
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Further results from PIXE analysis of inks in Galileo's notes on motionCarmine, P.Del et al. | 1996
- 359
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Aerosol study in the town of Genova with a PIXE analysisFormenti, P. et al. | 1996
- 363
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X-ray emission spectroscopy applied for bulk and individual analysis of airborne particulatesValkovic, V. et al. | 1996
- 368
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PIGE-PIXE analysis of chewing sticks of pharmacological importanceOlabanji, S.O. et al. | 1996
- 373
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Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysisKan, J.A.van et al. | 1996
- 378
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Testing of radiation detectors by IBIC imagingJaksic, M. et al. | 1996
- 382
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Scanning transmission ion microscopy (STIM) with a 3 MeV proton cyclotron beamMaanen, I.F.van et al. | 1996
- 387
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Investigation of the resolution affecting parameters of a nuclear microprobe using a solenoid lensStephan, A. et al. | 1996
- 391
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Determination of the microbeam profile using deconvolution proceduresMaj, B. et al. | 1996
- 396
-
Cross section of the ^1^4N(,P~o)^1^7O nuclear reaction for analytical applicationsGiorginis, G. / Misaelides, P. / Crametz, A. / Conti, M. et al. | 1996
- 396
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Cross section of the 14N(a,P0)17O nuclear reaction for analytical applicationsGiorginis, G. et al. | 1996
- 399
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Cross section of the 32S(a, p)35Cl nuclear reaction for sulphur determinationSoltani-Farshi, M. et al. | 1996
- 399
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Cross section of the ^3^2S(, p)^3^5Cl nuclear reaction for sulphur determinationSoltani-Farshi, M. / Meyer, J. D. / Misaelides, P. / Bethge, K. et al. | 1996
- 403
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Boron localisation in silicon, an application of nuclear reaction channelling for materials analysisVollmer, M. et al. | 1996
- 407
-
A computer controlled PIGE setup for the analysis of thin samplesStrivay, D. et al. | 1996
- 411
-
Quantification of fluorine in SiF~x etch residues on silicon with proton induced gamma-emissionVan IJzendoom, L. J. / Hayerlag, M. / Verbeek, A. / Politiek, J. / De Voigt, M. J. A. et al. | 1996
- 411
-
Quantification of fluorine in SiFx etch residues on silicon with proton induced g-emissionIJzendoorn, L.J.van et al. | 1996
- 415
-
Thin layer activation of non-metallic materials by using nuclear implantationDitroi, F. et al. | 1996
- 420
-
Ion beam-based studies for tribological phenomenaRacolta, P.M. et al. | 1996
- 424
-
Excitation function of alpha-particle induced nuclear reactions on natural nickelTakács, S. et al. | 1996
- 429
-
Production of residual nuclei from irradiation of thin Pb-targets with protons up to 1.6 GeVGloris, M. et al. | 1996
- 434
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Production of cosmogenic nuclides in meteoroids: Accelerator experiments and model calculations to decipher the cosmic ray record in extraterrestrial matterMichel, R. et al. | 1996
- 445
-
Detection of 236U: A possible 100-million year neutron flux integratorPurser, K.H. et al. | 1996
- 453
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41Ca measurements at the Zurich AMS facilityDittrich-Hannen, B. et al. | 1996
- 457
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High-precision radiocarbon measurements at the ANTARES AMS CentreHotchkis, M.A.C. et al. | 1996
- 461
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A high capacity ion source for AMSKieser, W.E. et al. | 1996
- 465
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The Groningen AMS facilityWijma, S. et al. | 1996
- 470
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Cross section measurements of proton induced reactions using a gas targetParrat, Y. et al. | 1996
- 474
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Environmental levels of carbon-14 around a Swedish nuclear power plant measured with accelerator mass spectrometryStenström, K. et al. | 1996
- 477
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AMS 14C dating of ancient human bones in missing layersSixun, Y. et al. | 1996
- 479
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Medical application of 26AlSteinhausen, C. et al. | 1996
- 484
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On the production of 36Cl by high energy protons in thin and thick targetsSchiekel, Th et al. | 1996
- 490
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Increase of 129I in the environmentWagner, M.J.M. et al. | 1996
- 495
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Nuclear waste transmutationLeray, S. et al. | 1996
- 501
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Radioactive ion beams for solid state researchCorreia, J.G. et al. | 1996
- 507
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Perturbed angular correlations in metal oxides with radioactive tracer beamsLupascu, D. et al. | 1996
- 513
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Biomedical applications of hadron acceleratorsAmaldi, U. et al. | 1996
- 522
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The proton therapy system for the NPTC: Equipment description and progress reportJongen, Y. et al. | 1996
- 526
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High-current positron beams in gamma-defectoscopyGorev, V. V. / Kachalov, K. O. / Kleonsky, V. I. / Serebrennikov, K. S. et al. | 1996
- 526
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High-current positron beams in g-defectoscopyGorev, V.V. et al. | 1996
- 530
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SIMS characterization of thin layers of IR and its silicidesBlanco, J.M. et al. | 1996
- 534
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The behaviour of Si and CoSi2 during low energy nitrogen bombardment, with and without O2-floodingDeleu, J. et al. | 1996
- 539
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Author index| 1996
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Committees and Sponsors| 1996
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Editorial| 1996
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Photographs| 1996