Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction (Englisch)
- Neue Suche nach: Stangl, J.
- Neue Suche nach: Stangl, J.
- Neue Suche nach: Hesse, A.
- Neue Suche nach: Holy, V.
- Neue Suche nach: Zhong, Z.
- Neue Suche nach: Bauer, G.
- Neue Suche nach: Denker, U.
- Neue Suche nach: Schmidt, O.G.
In:
Applied physics letters
;
82
, 14
; 2251-2253
;
2003
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction
-
Beteiligte:
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Erschienen in:Applied physics letters ; 82, 14 ; 2251-2253
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Verlag:
- Neue Suche nach: AIP
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Erscheinungsort:Melville, NY
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Erscheinungsdatum:2003
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/3400
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
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