Scanning force microscopy measurement of edge growth rate enhancement in selective area epitaxy (Englisch)
- Neue Suche nach: Cotta, M.A.
- Neue Suche nach: Cotta, M.A.
- Neue Suche nach: Hamm, R.A.
- Neue Suche nach: Staley, T.W.
- Neue Suche nach: Yadvish, R.D.
- Neue Suche nach: Harriott, L.R.
- Neue Suche nach: Temkin, H.
In:
Applied physics letters
;
62
, 5
; 496-498
;
1993
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Scanning force microscopy measurement of edge growth rate enhancement in selective area epitaxy
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Beteiligte:
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Erschienen in:Applied physics letters ; 62, 5 ; 496-498
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Verlag:
- Neue Suche nach: AIP
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Erscheinungsort:Melville, NY
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Erscheinungsdatum:1993
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/3400
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 62, Ausgabe 5
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CUMULATIVE AUTHOR INDEX| 1993