ESCA Investigation of SnOx Films Used as Gas Sensors (Englisch)
- Neue Suche nach: Sanjinés, R.
- Neue Suche nach: Sanjinés, R.
- Neue Suche nach: Rosenfeld, D.
- Neue Suche nach: Gozzo, F.
- Neue Suche nach: Alméras, Ph
- Neue Suche nach: Perez, L.
- Neue Suche nach: Lévy, F.
- Neue Suche nach: Margaritondo, G.
- Neue Suche nach: Schreiner, W.H.
In:
Surface and interface analysis
;
22
; 372-375
;
1994
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:ESCA Investigation of SnOx Films Used as Gas Sensors
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Beteiligte:Sanjinés, R. ( Autor:in ) / Rosenfeld, D. / Gozzo, F. / Alméras, Ph / Perez, L. / Lévy, F. / Margaritondo, G. / Schreiner, W.H.
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Erschienen in:Surface and interface analysis ; 22 ; 372-375
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Verlag:
- Neue Suche nach: Wiley
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Erscheinungsort:Chichester [u.a.]
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Erscheinungsdatum:1994
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00 / 33.68 / 33.68 / 51.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 020/3485
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 22
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- 1
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Plenary LectureMargaritondo, G. et al. | 1994
- 9
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Combined Depth Profile Analysis with SNMS, SIMS and XPS: Preferential Sputtering and Oxygen Transport in Binary Metal Oxide Multilayer SystemsAlbers, Th et al. | 1994
- 14
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Oxidation Study of 3d Transition Metals (Cr, Fe, Co and Ni) and Rare Earth (Tb): Application to Auger Depth Profiling of Magneto-optical DiskAbe, Y. et al. | 1994
- 18
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Auger Electron Spectroscopy Studies of Interdiffusion in Electrodeposited Amorphous Ni-P AlloysBukaluk, A. et al. | 1994
- 22
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Crystalline Effects on Depth Resolution in AES Depth ProfilingKajiwara, K. et al. | 1994
- 27
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Laser Etching of Silicon: Dopant Desorption, Diffusion and Segregation During Laser Induced Surface MeltingDesmur, A. et al. | 1994
- 31
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Small-area XPS Investigation on Ion-induced Chemical Modifications During Depth-profiling of An AlxGa1-xas-GaAs StructurePadeletti, G. et al. | 1994
- 36
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X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy of -FeSi~2 Films Grown by Ion Beam Assisted DepositionArmelao, L. / Terrasi, A. / Boaro, M. / Ravesi, S. et al. | 1994
- 36
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X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy of b-FeSi2 Films Grown by Ion Beam Assisted DepositionArmelao, L. et al. | 1994
- 41
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Application of Electron Spectroscopies Aided by the Pattern Recognition Method for Quantitative Analysis of Solid SurfacesJablonski, A. et al. | 1994
- 45
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Local Electronic Structures in Phosphorus OxyanionsKövér, L. et al. | 1994
- 51
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Experimental Determination of Attenuation Lengths of Photo- and Augerelectrons in Silicon Dioxide and in Silicon Nitride in the Energy Range 500 eV < 3100 eVEbel, M.F. et al. | 1994
- 51
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Experimental Determination of Attenuation Lengths of Photo- and Augerelectrons in Silicon Dioxide and in Silicon Nitride in the Energy Range 500 eV < E~k~i~n < 3100 eVEbel, M. F. / Ebel, H. / Hofmann, A. / Svagera, R. et al. | 1994
- 54
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Quantitative Depth Profile Analysis by EPMA Combined with Monte-Carlo SimulationAmmann, N. et al. | 1994
- 55
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Surface Concentration Modification of PtPd Alloys by Noble Gas Ion SputteringPlessis, J.Du et al. | 1994
- 60
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Chemical Information from Auger Data using Factor Analysis: Some ExamplesChemelli, C. et al. | 1994
- 65
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Weight Function for Linear Least Squares Fit of Binary CuNi and PtPd Alloy Auger SpectraRoos, W.D. et al. | 1994
- 69
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Computer Programs for Surface Analysis by SIMS and SNMSFitzgerald, A.G. et al. | 1994
- 75
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True Auger Spectral Shapes: A Step to Standard SpectraGoto, K. et al. | 1994
- 79
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Influence of the Elastic Scattering Cross-section on Angle-resolved Reflection Electron Energy Loss Spectra of Polycrystalline Al, Ni, Pt and AuWerner, W.S.M. et al. | 1994
- 84
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Correction of Drift and Slope Distortions in STM Image and Scanner CalibrationYurov, V.Y. et al. | 1994
- 89
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SiOx Surface Stoichiometry by XPS: a Comparison of Various MethodsAlfonsetti, R. et al. | 1994
- 93
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Factor Analysis, a Useful Tool for Solving Analytical Problems in AES and XPS: a Study of the Performances and Limitations of the Indicator FunctionArranz, A. et al. | 1994
- 98
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Internal Analyser Inelastic Scattering Effects in XPS Quantitative AnalysisBaitistoni, C. et al. | 1994
- 103
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Simultaneous Appearance of Sharp and Diffuse Spots in LEED: Experiments and Simulation for SiSakakibara, N. et al. | 1994
- 106
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Ambient Oxygen Effect in Ga+ FIB-SIMSSakamoto, T. et al. | 1994
- 111
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Charging and Mixing Effects During the XPS Analysis of Mixtures of OxidesFernández, A. et al. | 1994
- 115
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Simulation of Insulator Charging by a Narrow Electron BeamVicario, E. et al. | 1994
- 120
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Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and Al Determined by Elastic Peak Electron SpectroscopyBeilschmidt, H. et al. | 1994
- 124
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Quantitative Analysis of REELS Spectra of ZrO2: Determination of the Dielectric Loss Function and Inelastic Mean Free PathsYubero, F. et al. | 1994
- 129
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Database of Relativistic Elastic Scattering Cross-sections for Calculations of Photoelectron and Auger Electron TransportJablonski, A. et al. | 1994
- 134
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Quantitative GDOS Analysis of Oxide Films on SteelsSuzuki, S. et al. | 1994
- 139
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Preparation and Characterization of Cubic Boron Nitride and Metal Boron Nitride FilmsGissler, W. et al. | 1994
- 149
-
Recent Progress of Thin Film Technology in Automobile IndustryTaga, Y. et al. | 1994
- 156
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In-depth Homogeneity of Vapour Deposited Multicomponent Thin FilmsJehn, H.A. et al. | 1994
- 162
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Ex situ and In situ Characterization of Surfactant Monolayers Adsorbed on Nonmetallic Substrate by Infrared Reflection SpectroscopyMielczarski, J.A. et al. | 1994
- 167
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Auger Electron Spectroscopy Studies on TiNxHaupt, J. et al. | 1994
- 171
-
In situ Quantitative Soft x-ray Spectrometry of Thin Films Synthesized by DC SputteringLegrand, P.B. et al. | 1994
- 175
-
Determination of the Depth Resolution of Auger Electron Spectroscopy Depth Profiles of Anodic Barrier Oxide Films on Differently Pretreated Aluminium SubstratesLaet, J.De et al. | 1994
- 181
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Pulsed Laser Induced Ablation Applied to Epitaxial Growth of Semiconductor Materials: Selenides and Tellurides Plume AnalysisTeghil, R. et al. | 1994
- 186
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Deposition of CeO2 on Si(111) Studied by LEED, AES, XPS and RBSGuillaume, C.E. et al. | 1994
- 190
-
Surface Stoichiometry Determination of SiOxNy Thin Films by Means of XPSLozzi, L. et al. | 1994
- 193
-
Initial Growth of AIN on Clean and Oxidised Iron Studied by AES and EELSMalengreau, F. et al. | 1994
- 193
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Initial Growth of AlN on Clean and Oxidised Iron Studied by AES and EELSMalengreau, F. / Vermeeersch, M. / Sporken, R. / Philippe, L. et al. | 1994
- 197
-
Investigation of CdS Passivation Layers on Hg1-xCdxTeKaciulis, S. et al. | 1994
- 202
-
XPS Study of Amorphous As2S3 Films Deposited onto Chromium LayersPetkov, K. et al. | 1994
- 206
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XPS Analysis of Lithium Intercalation in Thin Films of Molybdenum OxysulphidesBenoist, L. et al. | 1994
- 211
-
The Growth Mode of Copper and Iron for the Cu-Fe and Fe-Cu InterfacesPolzonetti, G. et al. | 1994
- 214
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Growth of Cobalt Overlayers onto Si(100)Benitez, G. et al. | 1994
- 218
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An XPS Study of Diamond Films Grown on Differently Pretreated Silicon SubstratesArezzo, F. et al. | 1994
- 224
-
Surface Modification of PET Films with RF Plasma and Adhesion of in situ Evaporated Al on PETLe, Q.T. et al. | 1994
- 230
-
The Chemical Environment of Nitrogen in the Surface of Carbon FibresAlexander, M.R. et al. | 1994
- 236
-
XPS and AES Study of Al~2O~3/Ti6Al4V Interface: Influence of Oxidation and Nitruration of the Metal SurfaceDelogu, P. / Dikonimos-Makris, T. / Giorgi, R. / Lascovich, J. et al. | 1994
- 236
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XPS and AES Study of Al2O3-Ti6a14v Interface: Influence of Oxidation and Nitruration of the Metal SurfaceDelogu, P. et al. | 1994
- 242
-
An XPS and SEMS Study of Silica Sol-gel-Metal Substrate InteractionStoch, A. et al. | 1994
- 248
-
Characterization of Nanophase Powders Prepared by Laser SynthesisGiorgi, R. et al. | 1994
- 254
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Insulator Surface AnalysisGressus, C.Le et al. | 1994
- 258
-
Interface Analysis of Ceramic Matrix Composites by XPS, AES, SEM and XRDContarini, S. et al. | 1994
- 263
-
The Microchemistry of Interfaces in Fibre-reinforced Ceramics and GlassesSchneider, R. et al. | 1994
- 267
-
Surface versus Bulk Composition of a Phosphate GlassMeisel, W. et al. | 1994
- 271
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Electron Spectroscopy of Porous Silicon Layers. Indirect Detection of Hydrogen by Elastic Peak Electron SpectroscopyGergely, G. et al. | 1994
- 275
-
XPS and SEM Studies of Ca- and Ni-substituted LaCrO3 after Quenching from Reducing and Oxidizing Atmospheres at 800(degree)CGlenne, R. et al. | 1994
- 275
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XPS and SEM Studies of Ca- and Ni-substituted LaCrO~3 after Quenching from Reducing and Oxidizing Atmospheres at 800CGlenne, R. / Horst, J. A. / Joergensen, S. / Norby, T. et al. | 1994
- 280
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High-Resolution Electron-Energy-Loss Spectroscopy of Hydroxyl Groups at the Surface of Bulk Insulating OxidesCoustet, V. et al. | 1994
- 284
-
Investigation of the Thermal Degradation of Polyacrylonitrile on Various GlassesKeller, B.A. et al. | 1994
- 290
-
Surface Structure of the PAN-based Carbon Fibres Studied by the Scanning Probe Microscopy (SPM)Zhdan, P.A. et al. | 1994
- 296
-
STM Characterization of InP Gratings for DFB Laser FabricationMeneghini, G. et al. | 1994
- 300
-
The Investigation of Instrumental and Sample Parameters as Potential Sources for Affecting the Reproducibility of Isotopic Ratio Measurements in Secondary Ion Mass SpectrometryAdriaens, A. et al. | 1994
- 304
-
Automatic Matching of Dissimilar SAM-ImagesBöhmig, S.D. et al. | 1994
- 308
-
An Interfacial Study of a Sigma Fibre-Ti-6al-4V Composite Using Scanning Auger-EDX MicroscopyBaker, M.A. et al. | 1994
- 314
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Surface Structure of Al-Sn Layered Systems Codeposited in the Presence of OxygenKöver, L. et al. | 1994
- 318
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Impurity Segregation in an Fe-3.5at.%Si BicrystalReichl, B.M. et al. | 1994
- 323
-
Surface Composition of Machined Leaded BrassWu, J.X. et al. | 1994
- 327
-
Evaluation of Temperature-dependent Surface Chemistry in Zr2Fe and ZrVFe via X-ray Photoemission SpectroscopyKovac, J. et al. | 1994
- 331
-
Advances in Auger Microanalysis for Semiconductor TechnologyPamler, W. et al. | 1994
- 338
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Low Energy Field Emission Auger Electron SpectroscopyForsyth, N.M. et al. | 1994
- 342
-
Secondary Ion Mass Spectrometry of Si-Ge Structures Grown by Surfactant-mediated Epitaxy and by Low Pressure Chemical Vapour DepositionHerion, J. et al. | 1994
- 346
-
Ellipsometric Investigation of Single Crystalline Cz-Si Subjected to Hydrostatic PressureKaminska, A.M. et al. | 1994
- 350
-
Silicon-Insulator Interface Probing by Reflected Optical Second Harmonic GenerationKravetsky, I.V. et al. | 1994
- 353
-
Characterization and Reliability of Ti-Ni-Au, Ti-Ni-Ag and Ti-Ni Back-Side Metallizations in the Die-bonding of Power Electronic DevicesScandurra, A. et al. | 1994
- 358
-
In-depth Inhomogeneous Photoluminescent Properties of Porous Silicon LayersParkhutik, V.P. et al. | 1994
- 363
-
XPS Investigations of Electrochemically Modified Porous Silicon LayersJeske, M. et al. | 1994
- 367
-
SIMS and X-ray Diffraction Characterization of Carbon-Doped GaAs, AlxGa1-xAs Films Grown by MBEGerardi, C. et al. | 1994
- 372
-
ESCA Investigation of SnOx Films Used as Gas SensorsSanjinés, R. et al. | 1994
- 376
-
XPS Analysis of Sol-gel Processed Doped and Undoped TiO2 Films for SensorsZanoni, R. et al. | 1994
- 380
-
Interfacial Depth Profiling of Superconducting High-Tc Mono- and Multilayer Structures by Auger Electron SpectroscopySeibt, E.W. et al. | 1994
- 387
-
Interfacial Phenomena in PbBiSrCaCuO-Ag and Ag-In: Wettability, AES and XPS StudiesPolak, M. et al. | 1994
- 393
-
Tribological Behaviour of Heat-Treated Thin Films of Electropolymerized PolyacrylonitrileNoel, S. et al. | 1994
- 398
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Characterisation of MoOx-ZrO2 System by XPS and IR SpectroscopiesGazzoli, D. et al. | 1994
- 403
-
XPS-investigation of Titanium Modified MFI-type ZeolitesGrohmann, I. et al. | 1994
- 407
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Study of the Bulk and Surface Acidity of Protonated Y Zeolites by TPD and XPSGuimon, C. et al. | 1994
- 412
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Surface Reactions at the Controlled Structure of SrTiO3 (001)Kudo, M. et al. | 1994
- 417
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Identification of the Fixed Nitrogen Containing Species During the Photo-oxidative Fixation of Molecular Nitrogen on UV-illuminated TiO2 SurfacesNavio, J.A. et al. | 1994
- 421
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High Temperature Corrosion Characterisation by the Combined Use of Surface Microsurgery and Surface AnalysisBennett, M.J. et al. | 1994
- 431
-
Surface Analytical Investigations of Al and (Ti, Al) Nitrides Formed by Ion Implantation and their Corrosion PropertiesSimson, S. et al. | 1994
- 436
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Use of Ion Implantation to Study the Corrosion of an Austenitic Steel in an Oxidizing-Sulphidizing AtmosphereStroosnijder, M.F. et al. | 1994
- 441
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AES and SAM Studies of Oxide Formation on Inconel 600 at High TemperaturesAlstrup, N.C. et al. | 1994
- 445
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Non-destructive Characterization of Chromium Phosphate Coated Aluminium with SE and FTIRS Correlated to Surface Analytical Analysis by AES and TEMGoeminne, G. et al. | 1994
- 451
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Application of Reflectance Spectrophotometry to the Study of Copper (I) Oxides (Cu2O and Cu3O2) on Metallic SubstrateLefez, B. et al. | 1994
- 456
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Theoretical and Experimental Study of the Infrared Reflectance of Multilayer Oxide Films on MetalsLefez, B. et al. | 1994
- 462
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Analytical and Electrochemical Study of Passive Films Formed on Nickel-Chromium Alloys: Influence of the Chromium Bulk ConcentrationBoudin, S. et al. | 1994
- 467
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AES Investigations of Local Inhomogeneities in Aluminium Oxide Films on Fe-based AlloysOswald, S. et al. | 1994
- 472
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Ion Beam Analyses of Ceramics and Glasses in Nuclear EnergyMatzke, H.J. et al. | 1994
- 477
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A Spectroscopic Analysis of Plasma Polymers Prepared from a Series of Vinyl SulphonesWard, A.J. et al. | 1994
- 483
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The Formation of the Copper-Polyphenylquinoxaline Interface: An HREELS StudyGrégoire, C. et al. | 1994
- 485
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The Use of XPS Valence Band Spectra in the Study of Plasma-deposited Films of Tetramethyldisiloxane or HydroxyethylmethacrylateGarbassi, F. et al. | 1994
- 491
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Interfacial Effects of a Multifunctional Additive on Carbon Black Filled RubberSheng, E. et al. | 1994
- 497
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XPS of Oxidised Wool Fibre SurfacesBradley, R.H. et al. | 1994
- 502
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XPS Analysis of Polypropylene Grafted with Acrylic MonomersLange, P.J.De et al. | 1994
- 507
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An XPS Valence Band Study of Alkane Chains Secondary StructureRiga, J. et al. | 1994
- 511
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Optical and Electronic Properties of Ag- and Cu-TCNQ in Polymeric MatrixArena, A. et al. | 1994
- 515
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ARXPS and LEISS Characterizations for Chemically Etched and Ion-bombarded GaAs(100) SurfacesSullivan, J.L. et al. | 1994
- 520
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Comparison Between Pulsed Laser and Ion Irradiation of Hydrogenated Amorphous Carbon FilmsCompagnini, G. et al. | 1994
- 524
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Irradiation Effects Induced by Reactive and Non-reactive Low Energy Ion Irradiation of Graphite: an Electron Spectroscopy StudyGouzman, I. et al. | 1994
- 528
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Radiation Effects in Static SIMS of PolymersLicciardello, A. et al. | 1994
- 532
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Degradation of Polymers by Hyperthermal Atomic OxygenVered, R. et al. | 1994
- 538
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Argon Bombardment-induced Topography Development on InPMalherbe, J.B. et al. | 1994
- 543
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Surface Compositional Changes of InP due to Krypton Ion BombardmentMalherbe, J.B. et al. | 1994
- 547
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Mössbauer and Auger Spectroscopic Investigations of Fe-Si Alloys Produced by Ion ImplantationReuther, H. et al. | 1994
- 547
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Moessbauer and Auger Spectroscopic Investigations of Fe-Si Alloys Produced by Ion ImplantationReuther, H. et al. | 1994
- 551
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Ion Bombardment Induced Modification of Polyvinyltrimethylsilane Studied by XPSToth, A. et al. | 1994
- 561
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Recent Aspects of Surface Infrared SpectroscopyDumas, P. et al. | 1994
- 568
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Hydrogen Content of C60 Fullerenes, Measured by Elastic Recoil DetectionBrandstötter, A. et al. | 1994
- 572
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Glancing Incidence X-ray Analysis: Forgotten or to be Discovered?Hoogenhof, W.W.v.d. et al. | 1994
- 576
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The Design and Development of a Time of Flight Fast Atom-Ion Scattering SpectrometerGiles, R. et al. | 1994
- 581
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Auger Imaging from Rough, Chemically Inhomogeneous, MaterialsCrone, M. et al. | 1994
- 585
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Surface Acoustic Wave Resonance Spectroscopy (SAWRS) as A Novel Technique to Study Surface PhenomenaBoronin, A.I. et al. | 1994
- 590
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Extended Fine Structure in the Secondary Electron Emission Spectra of Graphite and Glassy CarbonHoffman, A. et al. | 1994
- 594
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The Influence of Al Oxidation on the Cu-Al2O3 Interface Formation: an XPS StudyCiampi, S. et al. | 1994
- 598
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Bulk-to-Surface Diffusion Measurements in a (111)Cu(0.1at.%)Sn Single Crystal Using a Linear Programmed Heating MethodViljoen, E.C. et al. | 1994
- 602
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Investigation of Thin Films by Soft X-ray Fluorescence and by Total Electron Yield MeasurementsEbel, H. et al. | 1994
- 605
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Optical Second Harmonic Generation as a Crystalline Surface Symmetry Probe for III-V SemiconductorsKravetsky, I.V. et al. | 1994
- 609
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The Use of the Anaerobic Transfer Electrochemical Cell in the XPS Investigation of PolyanilineMorea, G. et al. | 1994
- 614
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Small-area XPS and XAES Study of the Iron Ore Smelting ProcessIngo, G.M. et al. | 1994
- 621
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Author Index| 1994
- 625
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List of Presentations| 1994
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Committee Members| 1994
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Opening Speech| 1994
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ECASIA 93 Preface| 1994