X-ray diffraction study of stress relaxation in cubic boron nitride films grown with simultaneous medium-energy ion bombardment (Englisch)
- Neue Suche nach: Abendroth, B.
- Neue Suche nach: Abendroth, B.
- Neue Suche nach: Gago, R.
- Neue Suche nach: Eichhorn, F.
- Neue Suche nach: Möller, W.
In:
Applied physics letters
;
85
, 24
; 5905-5907
;
2004
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:X-ray diffraction study of stress relaxation in cubic boron nitride films grown with simultaneous medium-energy ion bombardment
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Beteiligte:
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Erschienen in:Applied physics letters ; 85, 24 ; 5905-5907
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Verlag:
- Neue Suche nach: AIP
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Erscheinungsort:Melville, NY
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Erscheinungsdatum:2004
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/3400
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 85, Ausgabe 24
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