RADIATION IMAGING - Design and Performance of a Thermal Neutron Imaging Facility at the North Carolina State University PULSTAR Reactor (Englisch)
- Neue Suche nach: Mishra, K.K.
- Neue Suche nach: Mishra, K.K.
- Neue Suche nach: Hawari, A.I.
- Neue Suche nach: Gillette, V.H.
In:
IEEE transactions on nuclear science
;
53
, 6
; 3904-3911
;
2006
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:RADIATION IMAGING - Design and Performance of a Thermal Neutron Imaging Facility at the North Carolina State University PULSTAR Reactor
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Beteiligte:
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Erschienen in:IEEE transactions on nuclear science ; 53, 6 ; 3904-3911
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:New York, NY
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Erscheinungsdatum:2006
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/3450/5540
- Neue Suche nach: 33.40
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
Lokalklassifikation TIB: 770/3450/5540 BKL: 33.40 Kernphysik -
Datenquelle:
Inhaltsverzeichnis – Band 53, Ausgabe 6
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Table of contents| 2006
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Editorial Conference Comments by the General Chairwoman| 2006
- 3066
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EDITORIAL - Editorial Conference Comments by the General ChairwomanBarth, J.L. et al. | 2006
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2006 Special NSREC Issue of the IEEE Transactions on Nuclear Science Comments by the Guest Editor| 2006
- 3069
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EDITORIAL - 2006 Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE Comments by the Guest EditorPaillet, P. et al. | 2006
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LIST OF REVIEWERS - 2006 December Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE List of Reviewers| 2006
- 3070
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2006 December Special NSREC Issue of the IEEE Transactions on Nuclear Science List of Reviewers| 2006
- 3072
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AWARDS - 2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Awards Comments by the ChairmanDodd, P.E. et al. | 2006
- 3072
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2006 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman| 2006
- 3074
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AWARDS - Outstanding Conference Paper Award 2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC)| 2006
- 3074
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Outstanding Conference Paper Award 2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC)| 2006
- 3077
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Obituary: Scott Kniffin| 2006
- 3077
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IN MEMORIAM - Scott KniffinLadbury, R. et al. | 2006
- 3078
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IN MEMORIAM - Mike Maher| 2006
- 3078
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Mike Maher, In Memoriam| 2006
- 3079
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Single-Event Transients in Bipolar Linear Integrated CircuitsBuchner, S. / McMorrow, D. et al. | 2006
- 3079
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REVIEW PAPERS - Single-Event Transients in Bipolar Linear Integrated CircuitsBuchner, S. et al. | 2006
- 3103
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REVIEW PAPERS - Total-Ionizing-Dose Effects in Modern CMOS TechnologiesBarnaby, H.J. et al. | 2006
- 3103
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Total-Ionizing-Dose Effects in Modern CMOS TechnologiesBarnaby, H.J. et al. | 2006
- 3122
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Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event LatchupSchwank, J.R. / Shaneyfelt, M.R. / Baggio, J. / Dodd, P.E. / Felix, J.A. / Ferlet-Cavrois, V. / Paillet, P. / Lum, G.K. / Girard, S. / Blackmore, E. et al. | 2006
- 3122
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SESSION A - HARDNESS ASSURANCE - Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event LatchupSchwank, J.R. et al. | 2006
- 3132
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SESSION A - HARDNESS ASSURANCE - Implications of Characterization Temperature on Hardness Assurance QualificationShaneyfelt, M.R. et al. | 2006
- 3132
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Implications of Characterization Temperature on Hardness Assurance QualificationShaneyfelt, M.R. / Schwank, J.R. / Dodd, P.E. / Hash, G.L. / Paillet, P. / Felix, J.A. / Baggio, J. / Ferlet-Cavrois, V. et al. | 2006
- 3139
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A Statistical Technique to Measure the Proportion of MBU's in SEE TestingChugg, A.M. / Moutrie, M.J. / Burnell, A.J. / Jones, R. et al. | 2006
- 3139
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SESSION A - HARDNESS ASSURANCE - A Statistical Technique to Measure the Proportion of MBU's in SEE TestingChugg, A.M. et al. | 2006
- 3145
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SESSION A - HARDNESS ASSURANCE - Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser TestingMiller, F. et al. | 2006
- 3145
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Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser TestingMiller, F. / Luu, A. / Prud'homme, F. / Poirot, P. / Gaillard, R. / Buard, N. / Carriere, T. et al. | 2006
- 3153
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SESSION A - HARDNESS ASSURANCE - SEL Induced Latent Damage, Testing, and EvaluationLayton, P. et al. | 2006
- 3153
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SEL Induced Latent Damage, Testing, and EvaluationLayton, P. / Kniffin, S. / Guertin, S. / Swift, G. / Buchner, S. et al. | 2006
- 3158
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Total Ionizing Dose Effects on Triple-Gate FETsGaillardin, M. et al. | 2006
- 3158
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Total Ionizing Dose Effects on Triple-Gate FETsGaillardin, M. / Paillet, P. / Ferlet-Cavrois, V. / Faynot, O. / Jahan, C. / Cristoloveanu, S. et al. | 2006
- 3166
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An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTsSutton, A.K. / Prakash, A.P.G. / Bongim Jun, / Enhai Zhao, / Bellini, M. / Pellish, J. / Diestelhorst, R.M. / Carts, M.A. / Phan, A. / Ladbury, R. et al. | 2006
- 3166
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTsSutton, A.K. et al. | 2006
- 3175
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The Effects of Irradiation Temperature on the Proton Response of SiGe HBTsPrakash, A.P.G. / Sutton, A.K. / Diestelhorst, R.M. / Espinel, G. / Andrews, J. / Bongim Jun, / Cressler, J.D. / Marshall, P.W. / Marshall, C.J. et al. | 2006
- 3175
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - The Effects of Irradiation Temperature on the Proton Response of SiGe HBTsPrakash, A.P.G. et al. | 2006
- 3182
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X-Ray Irradiation and Bias Effects in Fully-Depleted and Partially-Depleted SiGe HBTs Fabricated on CMOS-Compatible SOIBellini, M. / Bongim Jun, / Tianbing Chen, / Cressler, J.D. / Marshall, P.W. / Dakai Chen, / Schrimpf, R.D. / Fleetwood, D.M. / Jin Cai, et al. | 2006
- 3182
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - X-Ray Irradiation and Bias Effects in Fully-Depleted and Partially-Depleted SiGe HBTs Fabricated on CMOS-Compatible SOIBellini, M. et al. | 2006
- 3187
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Radiation Response and Variability of Advanced Commercial Foundry TechnologiesFelix, J.A. et al. | 2006
- 3187
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Radiation Response and Variability of Advanced Commercial Foundry TechnologiesFelix, J.A. / Dodd, P.E. / Shaneyfelt, M.R. / Schwank, J.R. / Hash, G.L. et al. | 2006
- 3195
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Impact of Heavy-Ion Strikes on Nanocrystal Non Volatile Memory Cell ArraysCester, A. et al. | 2006
- 3195
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Impact of Heavy-Ion Strikes on Nanocrystal Non Volatile Memory Cell ArraysCester, A. / Gasperin, A. / Wrachien, N. / Paccagnella, A. / Ancarani, V. / Gerardi, C. et al. | 2006
- 3203
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Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS DevicesBongim Jun, / Diestelhorst, R.M. / Bellini, M. / Espinel, G. / Appaswamy, A. / Prakash, A.P.G. / Cressler, J.D. / Dakai Chen, / Schrimpf, R.D. / Fleetwood, D.M. et al. | 2006
- 3203
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS DevicesJun, B. et al. | 2006
- 3210
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Proton Tolerance of SiGe Precision Voltage References for Extreme Temperature Range ElectronicsNajafizadeh, L. / Bellini, M. / Prakash, A.P.G. / Espinel, G.A. / Cressler, J.D. / Marshall, P.W. / Marshall, C.J. et al. | 2006
- 3210
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Tolerance of SiGe Precision Voltage References for Extreme Temperature Range ElectronicsNajafizadeh, L. et al. | 2006
- 3217
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile MemoryOldham, T.R. et al. | 2006
- 3217
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SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile MemoryOldham, T.R. / Ladbury, R.L. / Friendlich, M. / Kim, H.S. / Berg, M.D. / Irwin, T.L. / Seidleck, C. / LaBel, K.A. et al. | 2006
- 3223
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Modeling Total-Dose Effects for a Low-Dropout Voltage RegulatorRamachandran, V. et al. | 2006
- 3223
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Modeling Total-Dose Effects for a Low-Dropout Voltage RegulatorRamachandran, V. / Narasimham, B. / Fleetwood, D.M. / Schrimpf, R.D. / Holman, W.T. / Witulski, A.F. / Pease, R.L. / Dunham, G.W. / Seiler, J.E. / Platteter, D.G. et al. | 2006
- 3232
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Analysis of Bias Effects on the Total-Dose Response of a Bipolar Voltage ComparatorBernard, M.F. / Dusseau, L. / Boch, J. / Vaille, J.-R. / Saigne, F. / Schrimpf, R.D. / Lorfevre, E. / David, J.P. et al. | 2006
- 3232
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Analysis of Bias Effects on the Total-Dose Response of a Bipolar Voltage ComparatorBernard, M.F. et al. | 2006
- 3237
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SESSION B - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Radiation Dose Effects in Trigate SOI MOS TransistorsColinge, J.P. et al. | 2006
- 3237
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Radiation Dose Effects in Trigate SOI MOS TransistorsColinge, J.P. / Orozco, A. / Rudee, J. / Weize Xiong, / Cleavelin, C.R. / Schulz, T. / Schrufer, K. / Knoblinger, G. / Patruno, P. et al. | 2006
- 3242
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy Ion and Proton Irradiation -- Implications for Digital SETsFerlet-Cavrois, V. et al. | 2006
- 3242
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Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETsFerlet-Cavrois, V. / Paillet, P. / Gaillardin, M. / Lambert, D. / Baggio, J. / Schwank, J.R. / Vizkelethy, G. / Shaneyfelt, M.R. / Hirose, K. / Blackmore, E.W. et al. | 2006
- 3253
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Charge Collection and Charge Sharing in a 130 nm CMOS TechnologyAmusan, O.A. / Witulski, A.F. / Massengill, L.W. / Bhuva, B.L. / Fleming, P.R. / Alles, M.L. / Sternberg, A.L. / Black, J.D. / Schrimpf, R.D. et al. | 2006
- 3253
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Charge Collection and Charge Sharing in a 130 nm CMOS TechnologyAmusan, O.A. et al. | 2006
- 3259
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Multiple-Bit Upset in 130 nm CMOS TechnologyTipton, A.D. / Pellish, J.A. / Reed, R.A. / Schrimpf, R.D. / Weller, R.A. / Mendenhall, M.H. / Sierawski, B. / Sutton, A.K. / Diestelhorst, R.M. / Espinel, G. et al. | 2006
- 3259
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Multiple-Bit Upset in 130 nm CMOS TechnologyTipton, A.D. et al. | 2006
- 3265
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Analysis of 45-nm Multi-Gate Transistors Behavior Under Heavy Ion Irradiation by 3-D Device SimulationCastellani-Coulié, K. et al. | 2006
- 3265
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Analysis of 45-nm Multi-Gate Transistors Behavior Under Heavy Ion Irradiation by 3-D Device SimulationCastellani-Coulie, K. / Munteanu, D. / Autran, J.L. / Ferlet-Cavrois, V. / Paillet, P. / Baggio, J. et al. | 2006
- 3271
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - A Semi-empirical Approach for Heavy Ion SEU Cross Section CalculationsWrobel, F. et al. | 2006
- 3271
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A Semi-empirical Approach for Heavy Ion SEU Cross Section CalculationsWrobel, F. / Hubert, G. / Iacconi, P. et al. | 2006
- 3277
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - SEU Error Signature Analysis of Gbit-s SiGe Logic Circuits Using a Pulsed Laser MicroprobeSutton, A.K. et al. | 2006
- 3277
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SEU Error Signature Analysis of Gbit/s SiGe Logic Circuits Using a Pulsed Laser MicroprobeSutton, A.K. / Krithivasan, R. / Marshall, P.W. / Carts, M.A. / Seidleck, C. / Ladbury, R. / Cressler, J.D. / Marshall, C.J. / Currie, S. / Reed, R.A. et al. | 2006
- 3285
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - The Effect of Negative Feedback on Single Event Transient Propagation in Digital CircuitsNarasimham, B. et al. | 2006
- 3285
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The Effect of Negative Feedback on Single Event Transient Propagation in Digital CircuitsNarasimham, B. / Bhuva, B.L. / Holman, W.T. / Schrimpf, R.D. / Massengill, L.W. / Witulski, A.F. / Robinson, W.H. et al. | 2006
- 3291
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Secondary Effects of Single Ions on Floating Gate Memory CellsCellere, G. / Paccagnella, A. / Visconti, A. / Bonanomi, M. et al. | 2006
- 3291
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Secondary Effects of Single Ions on Floating Gate Memory CellsCellere, G. et al. | 2006
- 3298
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation TechnologiesPellish, J.A. et al. | 2006
- 3298
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Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation TechnologiesPellish, J.A. / Reed, R.A. / Schrimpf, R.D. / Alles, M.L. / Varadharajaperumal, M. / Guofu Niu, / Sutton, A.K. / Diestelhorst, R.M. / Espinel, G. / Krithivasan, R. et al. | 2006
- 3306
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Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS TechnologiesBalasubramanian, A. / Sternberg, A.L. / Bhuva, B.L. / Massengill, L.W. et al. | 2006
- 3306
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS TechnologiesBalasubramanian, A. et al. | 2006
- 3312
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Comparison of Above Bandgap Laser and MeV Ion Induced Single Event Transients in High-Speed Si Photonic DevicesLaird, J.S. / Hirao, T. / Onoda, S. / Itoh, H. / Johnston, A. et al. | 2006
- 3312
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Comparison of Above Bandgap Laser and MeV Ion Induced Single Event Transients in High-Speed Si Photonic DevicesLaird, J.S. et al. | 2006
- 3321
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Modeling Single-Event Upsets in 65-nm Silicon-on-Insulator Semiconductor DevicesKleinOsowski, A. / Oldiges, P. / Williams, R.Q. / Solomon, P.M. et al. | 2006
- 3321
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Modeling Single-Event Upsets in 65-nm Silicon-on-Insulator Semiconductor DevicesKleinOsowski, A. et al. | 2006
- 3329
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Boxes: An Engineering Methodology for Calculating Soft Error Rates in SOI Integrated CircuitsFulkerson, D.E. / Nelson, D.K. / Carlson, R.M. et al. | 2006
- 3329
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Boxes: An Engineering Methodology for Calculating Soft Error Rates in SOI Integrated CircuitsFulkerson, D.E. et al. | 2006
- 3336
-
Simple Calculations of Proton SEU Cross Sections from Heavy Ion Cross SectionsBarak, J. et al. | 2006
- 3336
-
SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Simple Calculations of Proton SEU Cross Sections from Heavy Ion Cross SectionsBarak, J. et al. | 2006
- 3343
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Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event BurnoutKuboyama, S. / Kamezawa, C. / Ikeda, N. / Hirao, T. / Ohyama, H. et al. | 2006
- 3343
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event BurnoutKuboyama, S. et al. | 2006
- 3349
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Variability in FG Memories Performance After IrradiationCellere, G. et al. | 2006
- 3349
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Variability in FG Memories Performance After IrradiationCellere, G. / Paccagnella, A. / Visconti, A. / Bonanomi, M. et al. | 2006
- 3356
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Implications of Nuclear Reactions for Single Event Effects Test Methods and AnalysisReed, R.A. et al. | 2006
- 3356
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Implications of Nuclear Reactions for Single Event Effects Test Methods and AnalysisReed, R.A. / Weller, R.A. / Schrimpf, R.D. / Mendenhall, M.H. / Warren, K.M. / Massengill, L.W. et al. | 2006
- 3363
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Investigation of Quantum Effects in Ultra-Thin Body Single- and Double-Gate Devices Submitted to Heavy Ion IrradiationMunteanu, D. / Ferlet-Cavrois, V. / Autran, J.L. / Paillet, P. / Baggio, J. / Faynot, O. / Jahan, C. / Tosti, L. et al. | 2006
- 3363
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Investigation of Quantum Effects in Ultra-Thin Body Single- and Double-Gate Devices Submitted to Heavy Ion IrradiationMunteanu, D. et al. | 2006
- 3372
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Time-Domain Component Analysis of Heavy-Ion-Induced Transient Currents in Fully-Depleted SOI MOSFETsKobayashi, D. / Aimi, M. / Saito, H. / Hirose, K. et al. | 2006
- 3372
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Time-Domain Component Analysis of Heavy-Ion-Induced Transient Currents in Fully-Depleted SOI MOSFETsKobayashi, D. et al. | 2006
- 3379
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Single-Event Burnout and Avalanche Characteristics of Power DMOSFETsLiu, S. / Boden, M. / Girdhar, D.A. / Titus, J.L. et al. | 2006
- 3379
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SESSION C - SINGLE EVENT EFFECTS: MECHANISMS AND MODELING - Single-Event Burnout and Avalanche Characteristics of Power DMOSFETsLiu, S. et al. | 2006
- 3386
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Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic GatesCasey, M.C. / Bhuva, B.L. / Black, J.D. / Massengill, L.W. / Amusan, O.A. / Witulski, A.F. et al. | 2006
- 3386
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SESSION D - HARDNESS BY DESIGN - Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic GatesCasey, M.C. et al. | 2006
- 3392
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An Area and Power Efficient Radiation Hardened by Design Flip-FlopKnudsen, J.E. / Clark, L.T. et al. | 2006
- 3392
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SESSION D - HARDNESS BY DESIGN - An Area and Power Efficient Radiation Hardened by Design Flip-FlopKnudsen, J.E. et al. | 2006
- 3400
-
SESSION D - HARDNESS BY DESIGN - Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic CircuitsKrithivasan, R. et al. | 2006
- 3400
-
Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic CircuitsKrithivasan, R. / Marshall, P.W. / Nayeem, M. / Sutton, A.K. / Wei-Min Kuo, / Haugerud, B.M. / Najafizadeh, L. / Cressler, J.D. / Carts, M.A. / Marshall, C.J. et al. | 2006
- 3408
-
An SEU-Robust Configurable Logic Block for the Implementation of a Radiation-Tolerant FPGABonacini, S. / Faccio, F. / Kloukinas, K. / Marchioro, A. et al. | 2006
- 3408
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An SEU-Robust Configurable Logic Block for the Implementation of a Radiation-Tolerant EPGABonacini, S. / Faccio, F. / Kloukinas, K. / Marchioro, A. et al. | 2006
- 3408
-
SESSION D - HARDNESS BY DESIGN - An SEU-Robust Configurable Logic Block for the Implementation of a Radiation-Tolerant FPGABonacini, S. et al. | 2006
- 3417
-
SESSION D - HARDNESS BY DESIGN - Reducing Soft Error Rate in Logic Circuits Through Approximate Logic FunctionsSierawski, B.D. et al. | 2006
- 3417
-
Reducing Soft Error Rate in Logic Circuits Through Approximate Logic FunctionsSierawski, B.D. / Bhuva, B.L. / Massengill, L.W. et al. | 2006
- 3422
-
SESSION D - HARDNESS BY DESIGN - Optimization for SEU-SET Immunity on 0.15 mm Fully Depleted CMOS-SOI Digital Logic DevicesMakihara, A. et al. | 2006
- 3422
-
Optimization for SEU/SET Immunity on 0.15 $\mu$m Fully Depleted CMOS/SOI Digital Logic DevicesMakihara, A. / Yamaguchi, T. / Asai, H. / Tsuchiya, Y. / Amano, Y. / Midorikawa, M. / Shindou, H. / Onoda, S. / Hirao, T. / Nakajima, Y. et al. | 2006
- 3428
-
SESSION D - HARDNESS BY DESIGN - The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 mmShuler, R.L. et al. | 2006
- 3428
-
The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 $\mu$ mShuler, R.L. / Balasubramanian, A. / Narasimham, B. / Bhuva, B.L. / Neill, P.M.O. / Kouba, C. et al. | 2006
- 3432
-
A Hardened-by-Design Technique for RF Digital Phase-Locked LoopsLoveless, T.D. / Massengill, L.W. / Bhuva, B.L. / Holman, W.T. / Witulski, A.F. / Boulghassoul, Y. et al. | 2006
- 3432
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SESSION D - HARDNESS BY DESIGN - A Hardened-by-Design Technique for RF Digital Phase-Locked LoopsLoveless, T.D. et al. | 2006
- 3439
-
SESSION D - HARDNESS BY DESIGN - A TID and SEE Radiation-Hardened, Wideband, Low-Noise AmplifierMossawir, B. et al. | 2006
- 3439
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A TID and SEE Radiation-Hardened, Wideband, Low-Noise AmplifierMossawir, B. / Linscott, I.R. / Inan, U.S. / Roeder, J.L. / Osborn, J.V. / Witczak, S.C. / King, E.E. / LaLumondiere, S.D. et al. | 2006
- 3449
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SESSION D - HARDNESS BY DESIGN - Radiation Hardened by Design RF Circuits Implemented in 0.13 mm CMOS TechnologyChen, W. et al. | 2006
- 3449
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Radiation Hardened by Design RF Circuits Implemented in 0.13 $\mu$m CMOS TechnologyChen, W. / Pouget, V. / Gentry, G.K. / Barnaby, H.J. / Vermeire, B. / Bakkaloglu, B. / Kiaei, S. / Holbert, K.E. / Fouillat, P. et al. | 2006
- 3455
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single-Event Transients in Voltage RegulatorsJohnston, A.H. et al. | 2006
- 3455
-
Single-Event Transients in Voltage RegulatorsJohnston, A.H. / Miyahira, T.F. / Irom, F. / Laird, J.S. et al. | 2006
- 3462
-
Digital Single Event Transient Trends With Technology Node ScalingBenedetto, J.M. / Eaton, P.H. / Mavis, D.G. / Gadlage, M. / Turflinger, T. et al. | 2006
- 3462
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Digital Single Event Transient Trends With Technology Node ScalingBenedetto, J.M. et al. | 2006
- 3466
-
Digital Device Error Rate Trends in Advanced CMOS TechnologiesGadlage, M.J. / Eaton, P.H. / Benedetto, J.M. / Carts, M. / Vivian Zhu, / Turflinger, T.L. et al. | 2006
- 3466
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Digital Device Error Rate Trends in Advanced CMOS TechnologiesGadlage, M.J. et al. | 2006
- 3472
-
Propagating SET Characterization Technique for Digital CMOS LibrariesBaze, M.P. / Wert, J. / Clement, J.W. / Hubert, M.G. / Witulski, A. / Amusan, O.A. / Massengill, L. / McMorrow, D. et al. | 2006
- 3472
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Propagating SET Characterization Technique for Digital CMOS LibrariesBaze, M.P. et al. | 2006
- 3479
-
Alpha-Induced Multiple Cell Upsets in Standard and Radiation Hardened SRAMs Manufactured in a 65 nm CMOS TechnologyGasiot, G. / Giot, D. / Roche, P. et al. | 2006
- 3479
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Alpha-Induced Multiple Cell Upsets in Standard and Radiation Hardened SRAMs Manufactured in a 65 nm CMOS TechnologyGasiot, G. et al. | 2006
- 3487
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Limiting Upset Cross Sections of SEU Hardened SOI SRAMsLiu, M.S. et al. | 2006
- 3487
-
Limiting Upset Cross Sections of SEU Hardened SOI SRAMsLiu, M.S. / Liu, H.Y. / Brewster, N. / Nelson, D. / Golke, K.W. / Kirchner, G. / Hughes, H.L. / Campbell, A. / Ziegler, J.F. et al. | 2006
- 3494
-
Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent ${\rm Q}_{\rm crit}$ With PROPSETFoster, C.C. / O'Neill, P.M. / Kouba, C.K. et al. | 2006
- 3494
-
Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent Q~c~r~i~t With PROPSETFoster, C. C. / O Neill, P. M. / Kouba, C. K. et al. | 2006
- 3494
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent Qerit With PROPSETFoster, C.C. et al. | 2006
- 3502
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Proton Induced Single Event Upset in 6 T SOI SRAMsLiu, H.Y. et al. | 2006
- 3502
-
Proton Induced Single Event Upset in 6 T SOI SRAMsLiu, H.Y. / Liu, M.S. / Hughes, H.L. et al. | 2006
- 3506
-
Single Event-Induced Instability in Linear Voltage RegulatorsAdell, P.C. / Witulski, A.F. / Schrimpf, R.D. / Marec, R. / Pouget, V. / Calvel, P. / Bezerra, F. et al. | 2006
- 3506
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single Event-Induced Instability in Linear Voltage RegulatorsAdell, P.C. et al. | 2006
- 3512
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory CellsHeidel, D.F. et al. | 2006
- 3512
-
Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory CellsHeidel, D.F. / Rodbell, K.P. / Oldiges, P. / Gordon, M.S. / Tang, H.H.K. / Cannon, E.H. / Plettner, C. et al. | 2006
- 3518
-
Microdose Induced Data Loss on Floating Gate MemoriesGuertin, S.M. / Nguyen, D.N. / Patterson, J.D. et al. | 2006
- 3518
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Microdose Induced Data Loss on Floating Gate MemoriesGuertin, S.M. et al. | 2006
- 3525
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Radiation Characterization of a Hardened 0.22 mm Anti-Fuse Field Programmable Gate ArrayNejad, R.J. et al. | 2006
- 3525
-
Radiation Characterization of a Hardened 0.22 $\mu$m Anti-Fuse Field Programmable Gate ArrayNejad, R.J. / Rickey, P.A. / Konadu, K. / Stapor, W.J. / McDonald, P.T. / Heidergott, W. et al. | 2006
- 3532
-
Single-Event Sensitivity and Hardening of a Pipelined Analog-to-Digital ConverterSternberg, A.L. / Massengill, L.W. / Hale, M. / Blalock, B. et al. | 2006
- 3532
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single-Event Sensitivity and Hardening of a Pipelined Analog-to-Digital ConverterSternberg, A.L. et al. | 2006
- 3539
-
Analysis of Single Events Effects on Monolithic PLL Frequency SynthesizersHoon Hee Chung, / Wenjian Chen, / Bakkaloglu, B. / Barnaby, H.J. / Vermeire, B. / Kiaei, S. et al. | 2006
- 3539
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Analysis of Single Events Effects on Monolithic PLL Frequency SynthesizersChung, H.H. et al. | 2006
- 3544
-
Light Particle-Induced Single Event Degradation in SDRAMsDavid, J.-P. / Bezerra, F. / Lorfevre, E. / Nuns, T. / Inguimbert, C. et al. | 2006
- 3544
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Light Particle-Induced Single Event Degradation in SDRAMsDavid, J.-P. et al. | 2006
- 3550
-
Hybrid Fault Detection Technique: A Case Study on Virtex-II Pro's PowerPC 405Bernardi, P. / Sterpone, L. / Violante, M. / Portela-Garcia, M. et al. | 2006
- 3550
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Hybrid Fault Detection Technique: A Case Study on Virtex-II Pro's PowerPC 405Bernardi, P. et al. | 2006
- 3558
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single Event-Induced Error Propagation Through Nominally-off Transmission GatesHutson, J.M. et al. | 2006
- 3558
-
Single Event-Induced Error Propagation Through Nominally-off Transmission GatesHutson, J.M. / Ramachandran, V. / Bhuva, B.L. / Zhu, X. / Schrimpf, R.D. / Amusan, O.A. / Massengill, L.M. et al. | 2006
- 3563
-
Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC MicroprocessorsIrom, F. / Farmanesh, F. / Kouba, C.K. et al. | 2006
- 3563
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC MicroprocessorsIrom, F. et al. | 2006
- 3569
-
An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate ArraysBerg, M. / Jih-Jong Wang, / Ladbury, R. / Buchner, S. / Hak Kim, / Howard, J. / LaBel, K. / Phan, A. / Irwin, T. / Friendlich, M. et al. | 2006
- 3569
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate AffaysBerg, M. et al. | 2006
- 3575
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Direct Measurement of SET Pulse Widths in 0.2 mm SOI Logic Cells Irradiated by Heavy IonsYanagawa, Y. et al. | 2006
- 3575
-
Direct Measurement of SET Pulse Widths in 0.2- $\mu$m SOI Logic Cells Irradiated by Heavy IonsYanagawa, Y. / Hirose, K. / Saito, H. / Kobayashi, D. / Fukuda, S. / Ishii, S. / Takahashi, D. / Yamamoto, K. / Kuroda, Y. et al. | 2006
- 3579
-
SEU Cross Sections of Hardened and Unhardened SiGe CircuitsHansen, D.L. / Chu, P. / Jobe, K. / McKay, A.L. / Warren, H.P. et al. | 2006
- 3579
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - SEU Cross Sections of Hardened and Unhardened SiGe CircuitsHansen, D.L. et al. | 2006
- 3587
-
SESSION F - SPACE AND TERRESTRIAL ENVIRONMENTS - Quantifying the Double-Sided Neutron SEU Threat, From Low Energy (Thermal) and High Energy (>10 MeV) NeutronsNormand, E. et al. | 2006
- 3587
-
Quantifying the Double-Sided Neutron SEU Threat, From Low Energy (Thermal) and High Energy ( ${>}10$ MeV) NeutronsNormand, E. / Vranish, K. / Sheets, A. / Stitt, M. / Kim, R. et al. | 2006
- 3596
-
Neutron-Induced Single Event Effects Testing Across a Wide Range of Energies and Facilities and Implications for StandardsDyer, C. / Hands, A. / Ford, K. / Frydland, A. / Truscott, P. et al. | 2006
- 3596
-
SESSION F - SPACE AND TERRESTRIAL ENVIRONMENTS - Neutron-Induced Single Event Effects Testing Across a Wide Range of Energies and Facilities and Implications for StandardsDyer, C. et al. | 2006
- 3602
-
SESSION F - SPACE AND TERRESTRIAL ENVIRONMENTS - Interaction of Charged Spacecraft with Electric Propulsion Plume: On Orbit Data and Ground Test ResultsLikar, J.J. et al. | 2006
- 3602
-
Interaction of Charged Spacecraft with Electric Propulsion Plume: On Orbit Data and Ground Test ResultsLikar, J.J. / Bogorad, A.L. / Malko, T.R. / Goodzeit, N.E. / Galofaro, J.T. / Mandell, M.J. et al. | 2006
- 3607
-
Electrostatic Discharge Induced Momentum Impulse From Charged Spacecraft SurfacesBogorad, A.L. / Likar, J.J. / Voorhees, C.R. / Herschitz, R. et al. | 2006
- 3607
-
SESSION F - SPACE AND TERRESTRIAL ENVIRONMENTS - Electrostatic Discharge Induced Momentum Impulse From Charged Spacecraft SurfacesBogorad, A.L. et al. | 2006
- 3610
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - A Framework for Understanding Displacement Damage Mechanisms in Irradiated Silicon DevicesSrour, J.R. et al. | 2006
- 3610
-
A Framework for Understanding Displacement Damage Mechanisms in Irradiated Silicon DevicesSrour, J.R. / Palko, J.W. et al. | 2006
- 3621
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Atomic-Scale Mechanisms for Low-NIEL Dopant-Type Dependent Damage in SiBeck, M.J. et al. | 2006
- 3621
-
Atomic-Scale Mechanisms for Low-NIEL Dopant-Type Dependent Damage in SiBeck, M.J. / Tsetseris, L. / Caussanel, M. / Schrimpf, R.D. / Fleetwood, D.M. / Pantelides, S.T. et al. | 2006
- 3629
-
Effects of Water on the Aging and Radiation Response of MOS DevicesBatyrev, I.G. / Rodgers, M.P. / Fleetwood, D.M. / Schrimpf, R.D. / Pantelides, S.T. et al. | 2006
- 3629
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Effects of Water on the Aging and Radiation Response of MOS DevicesBatyrev, I.G. et al. | 2006
- 3636
-
Effects of Switched-bias Annealing on Charge Trapping in HfO$_{2}$ Gate DielectricsZhou, X.J. / Fleetwood, D.M. / Tsetseris, L. / Schrimpf, R.D. / Pantelides, S.T. et al. | 2006
- 3636
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Effects of Switched-bias Annealing on Charge Trapping in HfO2 Gate DielectricsZhou, X.J. et al. | 2006
- 3644
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Differences Between Charge Trapping States in Irradiated Nano-Crystalline HfO2 and Non-Crystalline Hf SilicatesLucovsky, G. et al. | 2006
- 3644
-
Differences Between Charge Trapping States in Irradiated Nano-Crystalline HfO$_{2}$ and Non-Crystalline Hf SilicatesLucovsky, G. / Fleetwood, D.M. / Lee, S. / Seo, H. / Schrimpf, R.D. / Felix, J.A. / Luning, J. / Fleming, L.B. / Ulrich, M. / Aspnes, D.E. et al. | 2006
- 3649
-
Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate IrradiationChen, X.J. / Barnaby, H.J. / Schrimpf, R.D. / Fleetwood, D.M. / Pease, R.L. / Platteter, D.G. / Dunham, G.W. et al. | 2006
- 3649
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate IrradiationChen, X.J. et al. | 2006
- 3655
-
Physical Model for the Low-Dose-Rate Effect in Bipolar DevicesBoch, J. / Saigne, F. / Schrimpf, R.D. / Vaille, J.-R. / Dusseau, L. / Lorfevre, E. et al. | 2006
- 3655
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Physical Model for the Low-Dose-Rate Effect in Bipolar DevicesBoch, J. et al. | 2006
- 3661
-
Proton and Heavy Ion Irradiation Effects on AlGaN/GaN HFET DevicesSonia, G. / Brunner, F. / Denker, A. / Lossy, R. / Mai, M. / Opitz-Coutureau, J. / Pensl, G. / Richter, E. / Schmidt, J. / Zeimer, U. et al. | 2006
- 3661
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Proton and Heavy Ion Irradiation Effects on AlGaN-GaN HFET DevicesSonia, G. et al. | 2006
- 3667
-
New Partition Factor Calculations for Evaluating the Damage of Low Energy Ions in SiliconAkkerman, A. / Barak, J. et al. | 2006
- 3667
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - New Partition Factor Calculations for Evaluating the Damage of Low Energy Ions in SiliconAkkerman, A. et al. | 2006
- 3675
-
Impact of Heavy-Ion Strikes on Minimum-Size MOSFETs With Ultra-Thin Gate OxideGerardin, S. / Bagatin, M. / Cester, A. / Paccagnella, A. / Kaczer, B. et al. | 2006
- 3675
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Impact of Heavy-Ion Strikes on Minimum-Size MOSFETs With Ultra-Thin Gate OxideGerardin, S. et al. | 2006
- 3681
-
Damage Equivalence of Heavy Ions in Silicon Bipolar Junction TransistorsBielejec, E. / Vizkelethy, G. / Kolb, N.R. / King, D.B. / Doyle, B.L. et al. | 2006
- 3681
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Damage Equivalence of Heavy Ions in Silicon Bipolar Junction TransistorsBielejec, E. et al. | 2006
- 3687
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Total Dose Radiation Response of Nitrided and Non-nitrided SiO 2)-4H-SiC MOS CapacitorsDixit, S.K. et al. | 2006
- 3687
-
Total Dose Radiation Response of Nitrided and Non-nitrided SiO$_{2}$/4H-SiC MOS CapacitorsDixit, S.K. / Dhar, S. / Rozen, J. / Sanwu Wang, / Schrimpf, R.D. / Fleetwood, D.M. / Pantelides, S.T. / Williams, John.R. / Feldman, L.C. et al. | 2006
- 3693
-
Radiation-Induced Modifications of the Electrical Characteristics of Nanocrystal Memory Cells and ArraysGasperin, A. / Cester, A. / Wrachien, N. / Paccagnella, A. / Ancarani, V. / Gerardi, C. et al. | 2006
- 3693
-
SESSION G - BASIC MECHANISM OF RADIATION EFFECTS - Radiation-Induced Modifications of the Electrical Characteristics of Nanocrystal Memory Cells and ArraysGasperin, A. et al. | 2006
- 3701
-
SESSION H - DOSIMETRY AND FACILITIES - Microdosimetric GEANT4 and FLUKA Monte Carlo Simulations and Measurements of Heavy Ion Irradiation of Silicon and TissueBeck, P. et al. | 2006
- 3701
-
Microdosimetric GEANT4 and FLUKA Monte Carlo Simulations and Measurements of Heavy Ion Irradiation of Silicon and TissueBeck, P. / Wind, M. / Rollet, S. / Latocha, M. / Bock, F. / Bock, H. / Uchihori, Y. et al. | 2006
- 3707
-
SESSION H - DOSIMETRY AND FACILITIES - Measurement of the Energy Depositions in a Silicon Volume by 14 MeV NeutronsChabane, H. et al. | 2006
- 3707
-
Measurement of the Energy Depositions in a Silicon Volume by 14 MeV NeutronsChabane, H. / Vaille, J.R. / Barelaud, B. / Wrobel, F. / Calzavara, Y. / McNulty, P.J. / Decossas, J.L. / Garcia, P. / Dusseau, L. / Boch, J. et al. | 2006
- 3713
-
SESSION H - DOSIMETRY AND FACILITIES - Simultaneous Evaluation of TID and Displacement Damage Dose Using a Single OSL SensorGarcia, P. et al. | 2006
- 3713
-
Simultaneous Evaluation of TID and Displacement Damage Dose Using a Single OSL SensorGarcia, P. / Vaille, J.-R. / Benoit, D. / Chabane, H. / Berger, G. / Idri, K. / Boch, J. / Sagnes, B. / Saigne, F. / Lorfevre, E. et al. | 2006
- 3718
-
SESSION H - DOSIMETRY AND FACILITIES - Application of Imaging Systems to Characterization of Single-Event Effects in High-Energy Neutron EnvironmentsTörök, Z. et al. | 2006
- 3718
-
Application of Imaging Systems to Characterization of Single-Event Effects in High-Energy Neutron EnvironmentsTorok, Z. / Platt, S.P. et al. | 2006
- 3726
-
SESSION H - DOSIMETRY AND FACILITIES - High-Vacuum Gamma Irradiation Facilities for Synergistic Effects Testing on Optoelectronic Components and MaterialsFernandez, A.F. et al. | 2006
- 3726
-
High-Vacuum Gamma Irradiation Facilities for Synergistic Effects Testing on Optoelectronic Components and MaterialsFernandez, A.F. / Brichard, B. / Ooms, H. / Berghmans, F. et al. | 2006
- 3731
-
Transient Currents Generated by Heavy Ions With Hundreds of MeVOnoda, S. / Hirao, T. / Laird, J.S. / Mishima, K. / Kawano, K. / Itoh, H. et al. | 2006
- 3731
-
SESSION H - DOSIMETRY AND FACILITIES - Transient Currents Generated by Heavy Ions With Hundreds of MeVOnoda, S. et al. | 2006
- 3738
-
Silicon Microdosimetry in Heterogeneous Materials: Simulation and ExperimentWroe, A. / Rosenfeld, A. / Cornelius, I. / Prokopovich, D. / Reinhard, M. / Schulte, R. / Bashkirov, V. et al. | 2006
- 3738
-
SESSION H - DOSIMETRY AND FACILITIES - Silicon Microdosimetry in Heterogeneous Materials: Simulation and ExperimentWroe, A. et al. | 2006
- 3745
-
SESSION H - DOSIMETRY AND FACILITIES - Detailed Comparison of Monte Carlo and Sector-Shielding Analyses for Space ApplicationsLindberg, R. et al. | 2006
- 3745
-
Detailed Comparison of Monte Carlo and Sector-Shielding Analyses for Space ApplicationsLindberg, R. / Santin, G. / Evans, H. / Daly, E. / Nieminen, P. et al. | 2006
- 3750
-
14-MeV Neutron, $\gamma$-Ray, and Pulsed X-Ray Radiation-Induced Effects on Multimode Silica-Based Optical FibersGirard, S. / Baggio, J. / Bisutti, J. et al. | 2006
- 3750
-
SESSION I - PHOTONIC DEVICES AND INTEGRATED CIRCUITS - 14-MeV Neutron, g-Ray, and Pulsed X-Ray Radiation-Induced Effects on Multimode Silica-Based Optical FibersGirard, S. et al. | 2006
- 3758
-
SESSION I - PHOTONIC DEVICES AND INTEGRATED CIRCUITS - CCD Radiation Testing at Low Temperatures Using a Laboratory Alpha Particle SourceHopkinson, G.R. et al. | 2006
- 3758
-
CCD Radiation Testing at Low Temperatures Using a Laboratory Alpha Particle SourceHopkinson, G.R. / Mohammadzadeh, A. et al. | 2006
- 3764
-
SESSION I - PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Electron-Induced Displacement Damage Effects in CCDsBecker, H.N. et al. | 2006
- 3764
-
Electron-Induced Displacement Damage Effects in CCDsBecker, H.N. / Elliott, T. / Alexander, J.W. et al. | 2006
- 3771
-
SESSION I - PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Effect of Omnidirectional Proton Irradiation On Shielded Solar CellsMessenger, S.R. et al. | 2006
- 3771
-
Effect of Omnidirectional Proton Irradiation On Shielded Solar CellsMessenger, S.R. / Burke, E.A. / Walters, R.J. / Warner, J.H. / Summers, G.P. / Morton, T.L. et al. | 2006
- 3779
-
SESSION I - PHOTONIC DEVICES AND INTEGRATED CIRCUITS - The Influence of High-Energy Lithium Ion Irradiation on Electrical Characteristics of Silicon and GaAs Solar CellsJayashree, B. et al. | 2006
- 3779
-
The Influence of High-Energy Lithium Ion Irradiation on Electrical Characteristics of Silicon and GaAs Solar CellsJayashree, B. / Ramani, / Radhakrishna, M.C. / Agrawal, A. / Khan, S.A. / Meulenberg, A. et al. | 2006
- 3786
-
SESSION I - PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Effects of Gamma and Heavy Ion Damage on the Impulse Response and Pulsed Gain of a Low Breakdown Voltage Si Avalanche PhotodiodeLaird, J.S. et al. | 2006
- 3786
-
Effects of Gamma and Heavy Ion Damage on the Impulse Response and Pulsed Gain of a Low Breakdown Voltage Si Avalanche PhotodiodeLaird, J.S. / Onoda, S. / Hirao, T. / Becker, H. / Johnston, A. / Itoh, H. et al. | 2006
- 3794
-
Conference Author Index| 2006
- 3798
-
SEUs Induced by Thermal to High-Energy Neutrons in SRAMsGranlund, T. / Olsson, N. et al. | 2006
- 3798
-
2005 RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) CONFERENCE . Palais des Congrès, Cap d'Agde, France, September 19-23, 2005 - SEUs Induced by Thermal to High-Energy Neutrons in SRAMsGranlund, T. et al. | 2006
- 3803
-
COMPUTING AND SOFTWARE - Distributed Analysis Jobs With the Atlas Production SystemGonzález, S. et al. | 2006
- 3803
-
Distributed Analysis Jobs With the Atlas Production SystemGonzalez, S. / Liko, D. / Nairz, A. / Mair, G. / Orellana, F. / Goossens, L. / Resconi, S. / de Salvo, A. et al. | 2006
- 3808
-
Cobalt Therapy Dosimetric Calculations Over a Voxelized Heterogeneous Phantom: Validation of Different Monte Carlo Models and Methodologies Against Experimental DataMiro, R. / Juste, B. / Gallardo, S. / Santos, A. / Verdu, G. et al. | 2006
- 3808
-
COMPUTING AND SOFTWARE - Cobalt Therapy Dosimetric Calculations Over a Voxelized Heterogeneous Phantom: Validation of Different Monte Carlo Models and Methodologies Against Experimental DataMiró, R. et al. | 2006
- 3818
-
Bulk Scheduling With the DIANA SchedulerAnjum, A. / McClatchey, R. / Ali, A. / Willers, I. et al. | 2006
- 3818
-
COMPUTING AND SOFTWARE - Bulk Scheduling With the DIANA SchedulerAnjum, A. et al. | 2006
- 3830
-
Track-Based Alignment of Composite Detector StructuresKarimaki, V. / Lampen, T. / Schilling, F.-P. et al. | 2006
- 3830
-
COMPUTING AND SOFTWARE - Track-Based Alignment of Composite Detector StructuresKarimäki, V. et al. | 2006
- 3834
-
COMPUTING AND SOFTWARE - New Developments of the Goodness-of-Fit Statistical ToolkitMascialino, B. et al. | 2006
- 3834
-
New Developments of the Goodness-of-Fit Statistical ToolkitMascialino, B. / Pfeiffer, A. / Pia, M.G. / Ribon, A. / Viarengo, P. et al. | 2006
- 3842
-
Discrimination Between Different Types of Material in Track Reconstruction With a Gaussian-Sum FilterStrandlie, A. / Fruhwirth, R. et al. | 2006
- 3842
-
COMPUTING AND SOFTWARE - Discrimination Between Different Types of Material in Track Reconstruction With a Gaussian-Sum FilterStrandlie, A. et al. | 2006
- 3850
-
Application of a Digital Technique for Timing of Events From Scintillation DetectorsAbbiati, R. / Geraci, A. / Gatti, E. / Ripamonti, G. et al. | 2006
- 3850
-
DIGITAL SIGNAL PROCESSING - Application of a Digital Technique for Timing of Events From Scintillation DetectorsAbbiati, R. et al. | 2006
- 3855
-
Digital Control of a Bank of IIR Filters in Optimal Processing of Signals From Pulse Radiation DetectorsSaponjic, D. / Arandjelovic, V. / Stojic, M. et al. | 2006
- 3855
-
DIGITAL SIGNAL PROCESSING - Digital Control of a Bank of IIR Filters in Optimal Processing of Signals From Pulse Radiation DetectorsSaponjic, D. et al. | 2006
- 3865
-
Optimum Digital Filters for Baseline RestorationWen Xiangyang, / Wei Yixiang, et al. | 2006
- 3865
-
DIGITAL SIGNAL PROCESSING - Optimum Digital Filters for Baseline RestorationXiangyang, W. et al. | 2006
- 3870
-
Measurements and Simulations of Spatial Distribution Change of Ions Surrounding an Alpha Source With Temperature, Humidity and Airflow Using a Position-Sensitive Micro-Ionization ChamberQiu-Wei Wang, et al. | 2006
- 3870
-
GAS DETECTORS - Measurements and Simulations of Spatial Distribution Change of Ions Surrounding an Alpha Source With Temperature, Humidity and Airflow Using a Position-Sensitive Micro-Ionization ChamberWang, Q.-W. et al. | 2006
- 3877
-
Reduced Charge Diffusion in Thick, Fully Depleted CCDs With Enhanced Red SensitivityFairfield, J.A. / Groom, D.E. / Bailey, S.J. / Bebek, C.J. / Holland, S.E. / Karcher, A. / Koble, W.F. / Lorenzon, W. / Roe, N.A. et al. | 2006
- 3877
-
PHOTODETECTORS - Reduced Charge Diffusion in Thick, Fully Depleted CCDs With Enhanced Red SensitivityFairfield, J.A. et al. | 2006
- 3882
-
RADIATION DAMAGE EFFECTS - Ionizing Radiation Effects in Single-Crystal and Polycrystalline YAGVaddigiri, A. et al. | 2006
- 3882
-
Ionizing Radiation Effects in Single-Crystal and Polycrystalline YAGVaddigiri, A. / Potter, K.S. / Thomes, W.J. / Meister, D.C. et al. | 2006
- 3889
-
RADIATION DAMAGE EFFECTS - Evaluation of the Radiation Tolerance of SiGe Heterojunction Bipolar Transistors Under 24-GeV Proton ExposureMetcalfe, J. et al. | 2006
- 3889
-
Evaluation of the Radiation Tolerance of SiGe Heterojunction Bipolar Transistors Under 24-GeV Proton ExposureMetcalfe, J. / Dorfan, D.E. / Grillo, A.A. / Jones, A. / Lucia, D. / Martinez-McKinney, F. / Mendoza, M. / Rogers, M. / Sadrozinski, H.F.-W. / Seiden, A. et al. | 2006
- 3894
-
Design and Testing of a Position-Sensitive Plastic Scintillator Detector for Fast Neutron ImagingBravar, U. / Bruillard, P.J. / Fluckiger, E.O. / Macri, J.R. / McConnell, M.L. / Moser, M.R. / Ryan, J.M. / Woolf, R.S. et al. | 2006
- 3894
-
RADIATION IMAGING - Design and Testing of a Position-Sensitive Plastic Scintillator Detector for Fast Neutron ImagingBravar, U. et al. | 2006
- 3904
-
Design and Performance of a Thermal Neutron Imaging Facility at the North Carolina State University PULSTAR ReactorMishra, K.K. / Hawari, A.I. / Gillette, V.H. et al. | 2006
- 3904
-
RADIATION IMAGING - Design and Performance of a Thermal Neutron Imaging Facility at the North Carolina State University PULSTAR ReactorMishra, K.K. et al. | 2006
- 3912
-
A Novel Scatter Detector for High-Resolution SPECT Imaging With Compton TelescopesCastoldi, A. / Galimberti, A. / Guazzoni, C. / Struder, L. / Walenta, A.H. et al. | 2006
- 3912
-
RADIATION IMAGING - A Novel Scatter Detector for High-Resolution SPECT Imaging With Compton TelescopesCastoldi, A. et al. | 2006
- 3918
-
Continuous Time-Charge Amplification and Shaping in CMOS Monolithic Sensors for Particle TrackingRatti, L. et al. | 2006
- 3918
-
READOUT ELECTRONICS - Continuous Time-Charge Amplification and Shaping in CMOS Monolithic Sensors for Particle TrackingRatti, L. et al. | 2006
- 3929
-
READOUT ELECTRONICS - Cryogenic Behavior of Optoelectronic Devices for the Transmission of Analog Signals Via Fiber OpticsCamin, D.V. et al. | 2006
- 3929
-
Cryogenic Behavior of Optoelectronic Devices for the Transmission of Analog Signals Via Fiber OpticsCamin, D.V. / Grassi, V. et al. | 2006
- 3934
-
Study of the Broad Emission Wavelength of Lu $_{0.4}$Gd$_{1.6}$ SiO$_5$:Ce for APD DetectionShimizu, S. / Murakami, H. / Koizumi, T. / Usui, T. / Shimura, N. / Kurashige, K. / Kurata, Y. / Senguttuvan, N. / Sumiya, K. / Ishibashi, H. et al. | 2006
- 3934
-
SCINTILLATION DETECTORS - Study of the Broad Emission Wavelength of Lu0.4Gd1.6SiO5:Ce for APD DetectionShimizu, S. et al. | 2006
- 3938
-
Comparison of a LaBr$_{3}$ (Ce) Scintillation Detector With a Large Volume CdZnTe DetectorSyntfeld, A. / Arlt, R. / Gostilo, V. / Loupilov, A. / Moszynski, M. / Nassalski, A. / Swoboda, M. / Wolski, D. et al. | 2006
- 3938
-
SCINTILLATION DETECTORS - Comparison of a LaBr3(Ce) Scintillation Detector With a Large Volume CdZnTe DetectorSyntfeld, A. et al. | 2006
- 3944
-
SCINTILLATION DETECTORS - Quality Control Studies of Wavelength Shifting Fibers for a Scintillator-Based Tail Catcher Muon Tracker for Linear Collider Prototype DetectorDyshkant, A. et al. | 2006
- 3944
-
Quality Control Studies of Wavelength Shifting Fibers for a Scintillator-Based Tail Catcher Muon Tracker for Linear Collider Prototype DetectorDyshkant, A. / Beznosko, D. / Blazey, G. / Fisk, E. / Hahn, E. / Rykalin, V. / Wayne, M. / Zutshi, V. et al. | 2006
- 3949
-
Performance of a Fast Binary Readout CMOS Active Pixel Sensor Chip Designed for Charged Particle DetectionDegerli, Y. / Besancon, M. / Besson, A. / Claus, G. / Deptuch, G. / Dulinski, W. / Fourches, N. / Goffe, M. / Himmi, A. / Yan Li, et al. | 2006
- 3949
-
SOLID STATE DETECTORS - Performance of a Fast Binary Readout CMOS Active Pixel Sensor Chip Designed for Charged Particle DetectionDegerli, Y. et al. | 2006
- 3956
-
Evaluation of Semiinsulating Annealed InP:Ta for Radiation DetectorsZdansky, K. / Gorodynskyy, V. / Pekarek, L. / Kozak, H. et al. | 2006
- 3956
-
SOLID STATE DETECTORS - Evaluation of Semiinsulating Annealed InP:Ta for Radiation DetectorsZdansky, K. et al. | 2006
- 3963
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2006 Index| 2006
- 3962
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Have you visited lately? www.ieee.org| 2006
- 3963
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2006 Index [Revised]| 2006
- C1
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[Front cover]| 2006
- C2
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IEEE Transactions on Nuclear Science publication information| 2006
- C3
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IEEE Transactions on Nuclear Science Information for authors| 2006
- C4
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2006
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SELECTED PAPERS FROM THE 2006 IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC'06) Ponte Vedra Beach, FL, July 17-21, 2006| 2006