Critical analysis of short-term negative bias temperature instability measurements: Explaining the effect of time-zero delay for on-the-fly measurements (Englisch)
- Neue Suche nach: Islam, Ahmad Ehteshamul
- Neue Suche nach: Islam, Ahmad Ehteshamul
- Neue Suche nach: Kufluoglu, Haldun
- Neue Suche nach: Varghese, Dhanoop
- Neue Suche nach: Alam, Muhammad Ashraful
In:
Applied physics letters
;
90
, 8
; 83505
;
2007
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Critical analysis of short-term negative bias temperature instability measurements: Explaining the effect of time-zero delay for on-the-fly measurements
-
Beteiligte:Islam, Ahmad Ehteshamul ( Autor:in ) / Kufluoglu, Haldun / Varghese, Dhanoop / Alam, Muhammad Ashraful
-
Erschienen in:Applied physics letters ; 90, 8 ; 83505
-
Verlag:
- Neue Suche nach: AIP
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Erscheinungsort:Melville, NY
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Erscheinungsdatum:2007
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ISSN:
-
ZDBID:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/3400
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 90, Ausgabe 8
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