Optoelectronics, Displays, and Imaging - Effect of Channel-Width Widening on a Poly-Si Thin-Film Transistor Structure in the Linear Region (Englisch)
- Neue Suche nach: Chang, K.-M.
- Neue Suche nach: Chang, K.-M.
- Neue Suche nach: Lin, G.-M.
In:
IEEE transactions on electron devices
;
54
, 9
; 2418-2425
;
2007
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Optoelectronics, Displays, and Imaging - Effect of Channel-Width Widening on a Poly-Si Thin-Film Transistor Structure in the Linear Region
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Beteiligte:Chang, K.-M. ( Autor:in ) / Lin, G.-M.
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Erschienen in:IEEE transactions on electron devices ; 54, 9 ; 2418-2425
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsort:New York, NY
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Erscheinungsdatum:2007
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ISSN:
-
ZDBID:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 53.50 / 53.00 / 52.50 / 54.20
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/5670
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 54, Ausgabe 9
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On the Physically Based Compact Gate $C$ –$V$ Model for Ultrathin Gate Dielectric MOS Devices Using the Modified Airy Function ApproximationShams, I.B. / Habib, K.M.M. / Khosru, Q.D.M. / Zainuddin, A.N.M. / Haque, A. et al. | 2007
- 2570
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BRIEFS - Performance Consideration of MOS and Junction Diodes for Varactor ApplicationChan, Y.-J. et al. | 2007
- 2570
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Performance Consideration of MOS and Junction Diodes for Varactor ApplicationYi-Jen Chan, / Chi-Feng Huang, / Chun-Chieh Wu, / Chun-Hon Chen, / Chih-Ping Chao, et al. | 2007
- 2574
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Special issue on silicon carbide devices and technology| 2007
- 2574
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ANNOUNCEMENTS - Call for Papers -- Special Issue of the IEEE TRANSACTIONS ON ELECTRON DEVICES on Silicon Carbide Devices and Technology| 2007
- 2576
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Special issue on “Reliability of GaN, GaAs and related Compounds”| 2007
- 2576
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ANNOUNCEMENTS - Call for Papers -- Special Issue of the IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY on Reliability of GaN, GaAs and Related Compounds| 2007
- 2577
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Special Issue on Packaging Reliability| 2007
- 2577
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ANNOUNCEMENTS - Call for Papers -- Special Issue of the IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY on Packaging Reliability| 2007
- 2578
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The 20th International Symposium on Power Semiconductors and ICs (ISPSD'08)| 2007
- 2579
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2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)| 2007
- 2580
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INEC 2008| 2007
- C1
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[Front cover]| 2007
- C2
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IEEE Transactions on Electron Devices publication information| 2007
- C3
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IEEE Transactions on Electron Devices information for authors| 2007