Influence of Fiber Composition and Grating Fabrication on the Radiation Sensitivity of Fiber Bragg Gratings (Englisch)
- Neue Suche nach: Henschel, H.
- Neue Suche nach: Henschel, H.
- Neue Suche nach: Hoeffgen, S.K.
- Neue Suche nach: Krebber, K.
- Neue Suche nach: Kuhnhenn, J.
- Neue Suche nach: Weinand, U.
In:
IEEE transactions on nuclear science
;
55
, 4
; 2235-2242
;
2008
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Influence of Fiber Composition and Grating Fabrication on the Radiation Sensitivity of Fiber Bragg Gratings
-
Beteiligte:
-
Erschienen in:IEEE transactions on nuclear science ; 55, 4 ; 2235-2242
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsort:New York, NY
-
Erscheinungsdatum:2008
-
ISSN:
-
ZDBID:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 770/3450/5540
- Neue Suche nach: 33.40
- Weitere Informationen zu Basisklassifikation
-
Schlagwörter:
-
Klassifikation:
Lokalklassifikation TIB: 770/3450/5540 BKL: 33.40 Kernphysik -
Datenquelle:
Inhaltsverzeichnis – Band 55, Ausgabe 4
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1801
-
Table of contents| 2008
- 1805
-
EDITORIAL - RADECS 2007 Conference OverviewFlament, O. et al. | 2008
- 1805
-
RADECS 2007 Conference OverviewFlament, Olivier / Baggio, Jacques / Ferlet-Cavrois, Vronique / Leray, Jean-Luc et al. | 2008
- 1807
-
Comments by the EditorsSchwank, James R. / Felix, James A. / Buchner, Stephen / Marshall, Paul / Duzellier, Sophie / Brown, Dennis / Poivey, Christian / Pease, Ronald L. et al. | 2008
- 1808
-
List of Reviewers| 2008
- 1810
-
The Near-Earth Space Radiation EnvironmentBourdarie, S. / Xapsos, M. et al. | 2008
- 1810
-
SHORT COURSE: SELECTED PAPERS - The Near-Earth Space Radiation EnvironmentBourdarie, S. et al. | 2008
- 1833
-
Radiation Effects in MOS OxidesSchwank, J.R. / Shaneyfelt, M.R. / Fleetwood, D.M. / Felix, J.A. / Dodd, P.E. / Paillet, P. / Ferlet-Cavrois, V. et al. | 2008
- 1854
-
Modeling and Simulation of Single-Event Effects in Digital Devices and ICsMunteanu, D. / Autran, J.-L. et al. | 2008
- 1879
-
Modeling Single Event Transients in Bipolar Linear CircuitsPease, R.L. et al. | 2008
- 1891
-
Multi-Scale Simulation of Radiation Effects in Electronic DevicesSchrimpf, R.D. / Warren, K.M. / Ball, D.R. / Weller, R.A. / Reed, R.A. / Fleetwood, D.M. / Massengill, L.W. / Mendenhall, M.H. / Rashkeev, S.N. / Pantelides, S.T. et al. | 2008
- 1903
-
Improving Integrated Circuit Performance Through the Application of Hardness-by-Design MethodologyLacoe, R.C. et al. | 2008
- 1926
-
Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for MicroelectronicsShaneyfelt, M.R. / Schwank, J.R. / Dodd, P.E. / Felix, J.A. et al. | 2008
- 1947
-
SESSION A: DEVICES AND INTEGRATED CIRCUITS - Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI SystemsYanagawa, Y. et al. | 2008
- 1947
-
Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI SystemsYanagawa, Y. / Kobayashi, D. / Ikeda, H. / Saito, H. / Hirose, K. et al. | 2008
- 1953
-
Total Dose Effects in Op-Amps With Compensated Input StagesJohnston, A.H. / Rax, B.G. / Thorbourn, D. et al. | 2008
- 1960
-
Channel Hot Carrier Stress on Irradiated 130-nm NMOSFETsSilvestri, M. / Gerardin, S. / Paccagnella, A. / Faccio, F. / Gonella, L. et al. | 2008
- 1968
-
Effectiveness of TMR-Based Techniques to Mitigate Alpha-Induced SEU Accumulation in Commercial SRAM-Based FPGAsManuzzato, A. / Gerardin, S. / Paccagnella, A. / Sterpone, L. / Violante, M. et al. | 2008
- 1974
-
Study of Single-Event Transients in High-Speed Operational AmplifiersJaulent, P. / Pouget, V. / Lewis, D. / Fouillat, P. et al. | 2008
- 1982
-
Evaluation of Recent Technologies of Nonvolatile RAMNuns, T. / Duzellier, S. / Bertrand, J. / Hubert, G. / Pouget, V. / Darracq, F. / David, J.-P. / Soonckindt, S. et al. | 2008
- 1992
-
Investigating Degradation Mechanisms in 130 nm and 90 nm Commercial CMOS Technologies Under Extreme Radiation ConditionsRatti, L. / Gaioni, L. / Manghisoni, M. / Traversi, G. / Pantano, D. et al. | 2008
- 2001
-
Temperature Effect on Heavy-Ion-Induced Single-Event Transient Propagation in CMOS Bulk 0.18 $\mu$m Inverter ChainTruyen, D. / Boch, J. / Sagnes, B. / Vaille, J.-R. / Renaud, N. / Leduc, E. / Briet, M. / Heng, C. / Mouton, S. / Saigne, F. et al. | 2008
- 2001
-
Temperature Effect on Heavy-Ion-Induced Single-Event Transient Propagation in CMOS Bulk 0.18 μm Inverter ChainTruyen, D. / Boch, J. / Sagnes, B. / Vaille, J.-R. / Renaud, N. / Leduc, E. / Briet, M. / Heng, C. / Mouton, S. / Saigne, F. et al. | 2008
- 2001
-
SESSION B: SINGLE EVENT EFFECTS, TRANSIENT MECHANISMS - Temperature Effect on Heavy-Ion-Induced Single-Event Transient Propagation in CMOS Bulk 0.18 µm Inverter ChainTruyen, D. et al. | 2008
- 2007
-
Probing SET Sensitive Volumes in Linear Devices Using Focused Laser Beam at Different WavelengthsWeulersse, C. / Bezerra, F. / Miller, F. / Carriere, T. / Buard, N. / Falo, W. et al. | 2008
- 2013
-
Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital ConverterKruckmeyer, K. / Rennie, R.L. / Ramachandran, V. et al. | 2008
- 2019
-
A New Algorithm for the Analysis of the MCUs Sensitiveness of TMR Architectures in SRAM-Based FPGAsSterpone, L. / Violante, M. et al. | 2008
- 2028
-
New Analytical Solutions of the Diffusion Equation Available to Radiation Induced Substrate Currents ModelingRolland, G. et al. | 2008
- 2036
-
Simulation Tool for the Prediction of Heavy Ion Cross Section of Innovative 130-nm SRAMsCorreas, V. / Saigne, F. / Sagnes, B. / Boch, J. / Gasiot, G. / Giot, D. / Roche, P. et al. | 2008
- 2042
-
SESSION C: SINGLE EVENT EFFECTS, MECHANISMS AND MODELING - Effect of Ion Energy on Charge Loss From Floating Gate MemoriesCellere, G. et al. | 2008
- 2042
-
Effect of Ion Energy on Charge Loss From Floating Gate MemoriesCellere, G. / Paccagnella, A. / Visconti, A. / Bonanomi, M. / Beltrami, S. / Harboe-Sorensen, R. / Virtanen, A. et al. | 2008
- 2048
-
Heavy Ion Testing and 3-D Simulations of Multiple Cell Upset in 65 nm Standard SRAMsGiot, D. / Roche, P. / Gasiot, G. / Autran, J.-L. / Harboe-Sorensen, R. et al. | 2008
- 2055
-
Total Dose Effects on Error Rates in Linear Bipolar SystemsBuchner, S. / McMorrow, D. / Bernard, M. / Roche, N. / Dusseau, L. et al. | 2008
- 2063
-
A New Mitigation Approach for Soft Errors in Embedded ProcessorsAbate, F. / Sterpone, L. / Violante, M. et al. | 2008
- 2070
-
STARDUST: A Code for the Simulation of Particle Tracks on Arrays of Sensitive Volumes With Substrate Diffusion CurrentsRolland, G. / Pinheiro da Silva, L. / Inguimbert, C. / David, J.-P. / Ecoffet, R. / Auvergne, M. et al. | 2008
- 2079
-
Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS TechnologyBalasubramanian, A. / Amusan, O.A. / Bhuva, B.L. / Reed, R.A. / Sternberg, A.L. / Massengill, L.W. / McMorrow, D. / Nation, S.A. / Melinger, J.S. et al. | 2008
- 2085
-
SESSION E: BASIC MECHANISMS - The Role of Water in the Radiation Response of Wet and Dry OxidesBatyrev, I.G. et al. | 2008
- 2085
-
The Role of Water in the Radiation Response of Wet and Dry OxidesBatyrev, I.G. / Fleetwood, D.M. / Schrimpf, R.D. / Pantelides, S.T. et al. | 2008
- 2090
-
Total Ionizing Dose Effects on 4 Mbit Phase Change Memory ArraysGasperin, A. / Wrachien, N. / Paccagnella, A. / Ottogalli, F. / Corda, U. / Fuochi, P. / Lavalle, M. et al. | 2008
- 2098
-
Charge Yield and Track Structure Effects on Total Ionizing Dose MeasurementsHaran, A. / Murat, M. / Barak, J. et al. | 2008
- 2106
-
Electrostatic Mechanisms Responsible for Device Degradation in Proton Irradiated AlGaN/AlN/GaN HEMTsKalavagunta, A. / Touboul, A. / Shen, L. / Schrimpf, R.D. / Reed, R.A. / Fleetwood, D.M. / Jain, R.K. / Mishra, U.K. et al. | 2008
- 2113
-
Ion Track Structure and Dynamics in SiO $_{2}$Murat, M. / Akkerman, A. / Barak, J. et al. | 2008
- 2121
-
Comparison Between Point Defect Generation by g-rays in Bulk and Fibre Samples of High Purity Amorphous SiO2Brichard, B. et al. | 2008
- 2121
-
Comparison Between Point Defect Generation by gamma -rays in Bulk and Fibre Samples of High Purity Amorphous SiO~2Brichard, B. / Agnello, S. / Nuccio, L. / Dusseau, L. et al. | 2008
- 2121
-
Comparison Between Point Defect Generation by $\gamma$-rays in Bulk and Fibre Samples of High Purity Amorphous ${\hbox {SiO}}_{2}$Brichard, B. / Agnello, S. / Nuccio, L. / Dusseau, L. et al. | 2008
- 2126
-
Charge-Collection and Single-Event Upset Measurements at the ISIS Neutron SourcePlatt, S. / Torok, Z. / Frost, C.D. / Ansell, S. et al. | 2008
- 2126
-
SESSION F: DOSIMETRY AND FACILITIES - Charge-Collection and Single-Event Upset Measurements at the ISIS Neutron SourcePlatt, S. et al. | 2008
- 2133
-
BPW34 Commercial p-i-n Diodes for High-Level 1-MeV Neutron Equivalent Fluence MonitoringRavotti, F. / Glaser, M. / Moll, M. / Saigne, F. et al. | 2008
- 2141
-
Extension of the Measurement Range of MOS Dosimeters Using Radiation Induced Charge NeutralizationFaigon, A. / Lipovetzky, J. / Redin, E. / Krusczenski, G. et al. | 2008
- 2148
-
Qualification Methodology for Sub-Micron ICs at the Low Noise Underground Laboratory of RustrelLesea, A. / Castellani-Coulie, K. / Waysand, G. / Le Mauff, J. / Sudre, C. et al. | 2008
- 2154
-
Real-Time Fibered Optically Stimulated Luminescence Dosimeter Based on SrS:Ce,Sm PhosphorBenoit, D. / Garcia, P. / Matias-Vaille, S. / Ravotti, F. / Vaille, J.-R. / Glaser, M. / Brichard, B. / Fernandez, A.F. / Chatry, C. / Dusseau, L. et al. | 2008
- 2161
-
Test Procedures for Proton-Induced Single Event Latchup in Space EnvironmentsFelix, J.A. / Schwank, J.R. / Shaneyfelt, M.R. / Baggio, J. / Paillet, P. / Ferlet-Cavrois, V. / Dodd, P.E. / Girard, S. / Blackmore, E.W. et al. | 2008
- 2161
-
SESSION H: HARDNESS ASSURANCE - Test Procedures for Proton-Induced Single Event Latchup in Space EnvironmentsFelix, J.A. et al. | 2008
- 2166
-
SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different RangesLuu, A. / Miller, F. / Poirot, P. / Gaillard, R. / Buard, N. / Carriere, T. / Austin, P. / Bafleur, M. / Sarrabayrouse, G. et al. | 2008
- 2174
-
Radiation Test Challenges for Scaled Commercial MemoriesLaBel, K.A. / Ladbury, R.L. / Cohn, L.M. / Oldham, T.R. et al. | 2008
- 2181
-
SEGR Study on Power MOSFETs: Multiple Impacts AssumptionPeyre, D. / Poivey, C. / Binois, C. / Mangeret, R. / Salvaterra, G. / Beaumel, M. / Pontoni, F. / Bouchet, T. / Pater, L. / Bezerra, F. et al. | 2008
- 2188
-
SESSION I: SPACE RADIATION ENVIRONMENTS - Direct Data Assimilation Over Solar Cycle Time-Scales to Improve Proton Radiation Belt ModelsMaget, V. et al. | 2008
- 2188
-
Direct Data Assimilation Over Solar Cycle Time-Scales to Improve Proton Radiation Belt ModelsMaget, V. / Bourdarie, S. / Boscher, D. et al. | 2008
- 2197
-
Random Telegraph Signals in Proton Irradiated CCDs and APSHopkinson, G.R. / Goiffon, V. / Mohammadzadeh, A. et al. | 2008
- 2197
-
SESSION J: PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Random Telegraph Signals in Proton Irradiated CCDs and APSHopkinson, G.R. et al. | 2008
- 2205
-
Stabilization of Fiber Bragg Gratings Against Gamma RadiationGusarov, A. / Vasiliev, S. / Medvedkov, O. / Mckenzie, I. / Berghmans, F. et al. | 2008
- 2213
-
Radiation-Resistant Erbium-Doped Fiber for Spacecraft ApplicationsZotov, K.V. / Likhachev, M.E. / Tomashuk, A.L. / Bubnov, M.M. / Yashkov, M.V. / Guryanov, A.N. / Klyamkin, S.N. et al. | 2008
- 2216
-
Optical Absorption in Commercial Single Mode Optical Fibers in a High Energy Physics Radiation FieldWijnands, T. / De Jonge, L.K. / Kuhnhenn, J. / Hoeffgen, S.K. / Weinand, U. et al. | 2008
- 2223
-
Core Versus Cladding Effects of Proton Irradiation on Erbium-Doped Optical Fiber: Micro-Luminescence StudyTortech, B. / Girard, S. / Regnier, E. / Ouerdane, Y. / Boukenter, A. / Meunier, J.-P. / Van Uffelen, M. / Gusarov, A. / Berghmans, F. / Thienpont, H. et al. | 2008
- 2229
-
Low Temperature Alpha Particle Irradiation of a STAR1000 CMOS APSHopkinson, G.R. / Mohammadzadeh, A. et al. | 2008
- 2235
-
Influence of Fiber Composition and Grating Fabrication on the Radiation Sensitivity of Fiber Bragg GratingsHenschel, H. / Hoeffgen, S.K. / Krebber, K. / Kuhnhenn, J. / Weinand, U. et al. | 2008
- 2243
-
First Evaluation of Proton Irradiation Effects on InAs/InP Quantum Dash Laser Diodes Emitting at 1.55 μmBoutillier, M. / Gauthier-Lafaye, O. / Bonnefont, S. / Lelarge, F. / Dagens, B. / Make, D. / Le Gouezigou, O. / Rousseau, B. / Accard, A. / Poingt, F. et al. | 2008
- 2243
-
First Evaluation of Proton Irradiation Effects on InAs-InP Quantum Dash Laser Diodes Emitting at 1.55 mmBoutillier, M. et al. | 2008
- 2243
-
First Evaluation of Proton Irradiation Effects on InAs/InP Quantum Dash Laser Diodes Emitting at 1.55 $\mu\hbox {m}$Boutillier, M. / Gauthier-Lafaye, O. / Bonnefont, S. / Lelarge, F. / Dagens, B. / Make, D. / Le Gouezigou, O. / Rousseau, B. / Accard, A. / Poingt, F. et al. | 2008
- 2248
-
Effect of Ionizing Radiation on the Performance of Volume Holographic ElementsGusarov, A. / Berghmans, F. / Van Uffelen, M. / Glebova, L. / Rotar, V. / Glebov, L. et al. | 2008
- 2252
-
High Level Gamma and Neutron Irradiation of Silica Optical Fibers in CEA OSIRIS Nuclear ReactorCheymol, G. / Long, H. / Villard, J.F. / Brichard, B. et al. | 2008
- 2259
-
SESSION K: TECHNOLOGY AND DESIGN HARDENING - Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and AnalysisBerg, M. et al. | 2008
- 2259
-
Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and AnalysisBerg, M. / Poivey, C. / Petrick, D. / Espinosa, D. / Lesea, A. / LaBel, K.A. / Friendlich, M. / Kim, H. / Phan, A. et al. | 2008
- 2267
-
Soft Errors in SRAM-FPGAs: A Comparison of Two Complementary ApproachesAlderighi, M. / Casini, F. / D'Angelo, S. / Mancini, M. / Pastore, S. / Sterpone, L. / Violante, M. et al. | 2008
- 2274
-
Fine-Grain SEU Mitigation for FPGAs Using Partial TMRPratt, B. / Caffrey, M. / Carroll, J.F. / Graham, P. / Morgan, K. / Wirthlin, M. et al. | 2008
- 2281
-
Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error DetectionNeto, E.H. / Kastensmidt, F.L. / Wirth, G. et al. | 2008
- 2289
-
Conference Author Index| 2008
- 2291
-
Have you visited lately? www.ieee.org| 2008
- 2292
-
Scitopia.org| 2008
- 2294
-
A Distributed Synchronization and Timing System on the EAST TokamakJiarong Luo, / Yichun Wu, / Yantai Shu, et al. | 2008
- 2294
-
15TH CONFERENCE ON REAL TIME (RT2007) Batavia, IL, April 29—May 4, 2007 - A Distributed Synchronization and Timing System on the EAST TokamakLuo, J. et al. | 2008
- 2298
-
Role of Gun Emittance to Build a Compact X-ray Free-Electron Laser MachineTae-Yeon Lee, / Jinhyuk Choi, et al. | 2008
- 2298
-
ACCELERATOR TECHNOLOGY - Role of Gun Emittance to Build a Compact X-ray Free-Electron Laser MachineLee, T.-Y. et al. | 2008
- 2303
-
Taguchi Based Performance and Reliability Improvement of an Ion Chamber Amplifier for Enhanced Nuclear Reactor SafetyKulkarni, R.D. / Agarwal, V. et al. | 2008
- 2303
-
ANALOG AND DIGITAL CIRCUITS - Taguchi Based Performance and Reliability Improvement of an Ion Chamber Amplifier for Enhanced Nuclear Reactor SafetyKulkarni, R.D. et al. | 2008
- 2315
-
Low-Frequency Noise of Resistively Coupled Charge AmplifiersBonisch, S.P. / Namaschk, B. / Wulf, F. et al. | 2008
- 2323
-
Front-End ASIC for a Silicon Compton TelescopeDe Geronimo, G. / Fried, J. / Frost, E. / Phlips, B.F. / Vernon, E. / Wulf, E.A. et al. | 2008
- 2329
-
A Generic Surface Sampler for Monte Carlo SimulationsDetwiler, J.A. / Henning, R. / Johnson, R.A. / Marino, M.G. et al. | 2008
- 2329
-
COMPUTING, SIMULATION, AND SOFTWARE - A Generic Surface Sampler for Monte Carlo SimulationsDetwiler, J.A. et al. | 2008
- 2334
-
Single-Electron Response Using a GEM-MIGAS Electron MultiplierMir, J.A. / Maia, J.M. / Conceicao, A.S. / Stephenson, R. / Lipp, J.D. / Rhodes, N.J. / Schooneveld, E.M. / da Luz, H.N. / Veloso, J. / dos Santos, J. et al. | 2008
- 2334
-
GAS DETECTORS - Single-Electron Response Using a GEM-MIGAS Electron MultiplierMir, J.A. et al. | 2008
- 2341
-
Single Photon Counting X-Ray Imaging System Using a Micro Hole and Strip PlateNatal da Luz, H. / Oliveira, C. / Azevedo, C. / Mir, J.A. / de Oliveira, R. / dos Santos, J. / Veloso, J.F.C. et al. | 2008
- 2346
-
HIGH ENERGY PHYSICS DETECTORS - Physics and Detectors for the International Linear ColliderBrau, J.E. et al. | 2008
- 2346
-
Physics and Detectors for the International Linear ColliderBrau, J.E. et al. | 2008
- 2352
-
NEUTRON DETECTION - Detection of Fast Neutron by Storage Phosphors With Low Gamma-Ray SensitivitySakasai, K. et al. | 2008
- 2352
-
Detection of Fast Neutron by Storage Phosphors With Low Gamma-Ray SensitivitySakasai, K. / Iwamoto, Y. / Soyama, K. et al. | 2008
- 2357
-
NUCLEAR POWER INSTRUMENTATION AND CONTROL - Operation and Control Simulation of a Modular High Temperature Gas Cooled Reactor Nuclear Power PlantLi, H. et al. | 2008
- 2357
-
Operation and Control Simulation of a Modular High Temperature Gas Cooled Reactor Nuclear Power PlantHaipeng Li, / Xiaojin Huang, / Liangju Zhang, et al. | 2008
- 2366
-
Current Leakage Evolution in Partially Gate Ruptured Power MOSFETsScheick, L. / Edmonds, L. / Selva, L. / Yuan Chen, et al. | 2008
- 2366
-
RADIATION EFFECTS - Current Leakage Evolution in Partially Gate Ruptured Power MOSFETsScheick, L. et al. | 2008
- 2376
-
Study on Composite Material for Shielding Mixed Neutron and -g-RaysHu, H. et al. | 2008
- 2376
-
Study on Composite Material for Shielding Mixed Neutron and $\gamma$ -RaysHuasi Hu, / Qunshu Wang, / Juan Qin, / Yuelei Wu, / Tiankui Zhang, / Zhongsheng Xie, / Xinbiao Jiang, / Guoguang Zhang, / Hu Xu, / Xiangyang Zheng, et al. | 2008
- 2385
-
An Ultra-Compact, Low-Power Reference Circuit/Dosimeter for Space EnvironmentsGeorgiou, J. et al. | 2008
- 2389
-
Specification and Verification of Soft Error Performance in Reliable Internet Core RoutersSilburt, A.L. / Evans, A. / Burghelea, A. / Shi-Jie Wen, / Ward, D. / Norrish, R. / Hogle, D. et al. | 2008
- 2399
-
Gate Current Noise in Ultrathin Oxide MOSFETs and Its Impact on the Performance of Analog Front-End CircuitsManghisoni, M. et al. | 2008
- 2399
-
READOUT ELECTRONICS - Gate Current Noise in Ultrathin Oxide MOSFETs and Its Impact on the Performance of Analog Front-End CircuitsManghisoni, M. et al. | 2008
- 2408
-
Noise Behavior of a 180 nm CMOS SOI Technology for Detector Front-End ElectronicsRe, V. / Gaioni, L. / Manghisoni, M. / Ratti, L. / Speziali, V. / Traversi, G. / Yarema, R. et al. | 2008
- 2414
-
AMBRA: A Multi-Event Buffering and Readout ASIC for the Silicon Drift Detectors of the ALICE ExperimentMazza, G. / De Remigis, P. / Kloukinas, K. et al. | 2008
- 2420
-
SCINTILLATION DETECTORS - Scintillation Properties of Praseodymium Activated Lu3Al5O12 Single CrystalsDrozdowski, W. et al. | 2008
- 2420
-
Scintillation Properties of Praseodymium Activated ${\rm Lu}_{3}{\rm Al}_{5}{\rm O} _{12}$ Single CrystalsDrozdowski, W. / Dorenbos, P. / de Haas, J.T.M. / Drozdowska, R. / Owens, A. / Kamada, K. / Tsutsumi, K. / Usuki, Y. / Yanagida, T. / Yoshikawa, A. et al. | 2008
- 2420
-
Scintillation Properties of Praseodymium Activated Lu~3Al~5O~1~2 Single CrystalsDrozdowski, W. / Dorenbos, P. / de Haas, J.T.M. / Drozdowska, R. / Owens, A. / Kamada, K. / Tsutsumi, K. / Usuki, Y. / Yanagida, T. / Yoshikawa, A. et al. | 2008
- 2425
-
Optical and Scintillation Properties of Inorganic Scintillators in High Energy PhysicsMao, R. / Liyuan Zhang, / Ren-Yuan Zhu, et al. | 2008
- 2432
-
Optical Reflectance Measurements for Commonly Used ReflectorsJanecek, M. / Moses, W.W. et al. | 2008
- 2438
-
Leading the field since 1884| 2008
- 2439
-
IEEE copyright form| 2008
- C1
-
[Front cover]| 2008
- C2
-
IEEE Transactions on Nuclear Science publication information| 2008
- C3
-
IEEE Transactions on Nuclear Science information for authors| 2008
- C4
-
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2008
-
SELECTED PAPERS FROM THE 2007 RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) CONFERENCE, Deauville, France, September 10-14, 2007| 2008