BRIEFS Threshold Voltage and Mobility Extraction by Ultrafast Switching Measurement on NBTI (Englisch)
- Neue Suche nach: Hu, Y Z
- Neue Suche nach: Hu, Y Z
- Neue Suche nach: Ang, D S
- Neue Suche nach: Teo, Z Q
In:
IEEE transactions on electron devices
;
57
, 8
; 2027-2032
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:BRIEFS Threshold Voltage and Mobility Extraction by Ultrafast Switching Measurement on NBTI
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Beteiligte:
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Erschienen in:IEEE transactions on electron devices ; 57, 8 ; 2027-2032
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:New York, NY
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Erscheinungsdatum:2010
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 53.50 / 53.00 / 52.50 / 54.20
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/5670
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Datenquelle:
Inhaltsverzeichnis – Band 57, Ausgabe 8
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