The Radiation Hardness Assurance Facility at INFN-LNS Catania for the Irradiation of Electronic Components in Air (Englisch)
- Neue Suche nach: Menichelli, M
- Neue Suche nach: Menichelli, M
- Neue Suche nach: Alpat, B
- Neue Suche nach: Papi, A
- Neue Suche nach: Sorensen, R H
- Neue Suche nach: Cirrone, G A P
- Neue Suche nach: Ferrera, F
- Neue Suche nach: Figuera, P
- Neue Suche nach: Finocchiaro, P
- Neue Suche nach: Lattuada, M
- Neue Suche nach: Rifuggiato, D
- Neue Suche nach: Bizzarri, F
- Neue Suche nach: Caraffini, D
- Neue Suche nach: Petasecca, M
- Neue Suche nach: Renzi, F
- Neue Suche nach: Denizli, H
- Neue Suche nach: Amutkan, O
In:
IEEE transactions on nuclear science
;
57
, 4
; 2074-2079
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:The Radiation Hardness Assurance Facility at INFN-LNS Catania for the Irradiation of Electronic Components in Air
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Beteiligte:Menichelli, M ( Autor:in ) / Alpat, B / Papi, A / Sorensen, R H / Cirrone, G A P / Ferrera, F / Figuera, P / Finocchiaro, P / Lattuada, M / Rifuggiato, D
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Erschienen in:IEEE transactions on nuclear science ; 57, 4 ; 2074-2079
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsort:New York, NY
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Erscheinungsdatum:2010
-
ISSN:
-
ZDBID:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
-
Sprache:Englisch
- Neue Suche nach: 770/3450/5540
- Neue Suche nach: 33.40
- Weitere Informationen zu Basisklassifikation
-
Schlagwörter:
-
Klassifikation:
Lokalklassifikation TIB: 770/3450/5540 BKL: 33.40 Kernphysik -
Datenquelle:
Inhaltsverzeichnis – Band 57, Ausgabe 4
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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Table of contents| 2010
- 1721
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EDITORIAL RADECS 2009 Conference Overview| 2010
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RADECS 2009 Conference Overview| 2010
- 1723
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Comments by the EditorsSchwank, James / Marshall, Paul / Brown, Dennis / Poivey, Christian / Pease, Ron / Girard, Sylvain / Reed, Robert et al. | 2010
- 1724
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List of Reviewers| 2010
- 1726
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Monte Carlo Simulation of Single Event EffectsWeller, Robert A / Mendenhall, Marcus H / Reed, Robert A / Schrimpf, Ronald D / Warren, Kevin M / Sierawski, Brian D / Massengill, Lloyd W et al. | 2010
- 1726
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SHORT COURSE: SELECTED PAPERS Monte Carlo Simulation of Single Event EffectsWeller, R A et al. | 2010
- 1747
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Current and Future Challenges in Radiation Effects on CMOS ElectronicsDodd, P E / Shaneyfelt, M R / Schwank, J R / Felix, J A et al. | 2010
- 1764
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SESSION A: DEVICES, INTEGRATED CIRCUITS, AND MEMS Total-Dose Effects Caused by High-Energy Neutrons and λ-Rays in Multiple-Gate FETsKilchytska, V et al. | 2010
- 1764
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Total-Dose Effects Caused by High-Energy Neutrons and $\gamma $-Rays in Multiple-Gate FETsKilchytska, Valeriya / Alvarado, J / Collaert, N / Rooyakers, R / Militaru, O / Berger, G / Flandre, D et al. | 2010
- 1771
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Influence of Back-Gate Bias and Process Conditions on the Gamma Degradation of the Transconductance of MuGFETsPut, S / Simoen, E R / Collaert, N / De Keersgieter, A / Claeys, C / Van Uffelen, M / Leroux, P et al. | 2010
- 1777
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Effects of Moisture on Radiation-Induced Degradation in CMOS SOI TransistorsShaneyfelt, Marty R / Schwank, James R / Dodd, Paul E / Hill, Tom A / Dalton, Scott M / Swanson, Scot E et al. | 2010
- 1781
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Front-End Performance and Charge Collection Properties of Heavily Irradiated DNW MAPSRatti, L / Manghisoni, M / Re, V / Traversi, G / Zucca, S / Bettarini, S / Morsani, F / Rizzo, G et al. | 2010
- 1790
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TID and Displacement Damage Effects in Vertical and Lateral Power MOSFETs for Integrated DC-DC ConvertersFaccio, F / Allongue, B / Blanchot, G / Fuentes, C / Michelis, S / Orlandi, S / Sorge, R et al. | 2010
- 1798
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Simulated Effects of Proton and Ion Beam Irradiation on Titanium Dioxide MemristorsVujisic, M / Stankovic, K / Marjanovic, N / Osmokrovic, P et al. | 2010
- 1805
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Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter StringBuchner, Stephen / Sibley, Michael / Eaton, Paul / Mavis, David / McMorrow, Dale et al. | 2010
- 1805
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SESSION B: SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter StringBuchner, S et al. | 2010
- 1811
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Large SET Duration Broadening in a Fully-Depleted SOI Technology—Mitigation With Body ContactsFerlet-Cavrois, V / Kobayashi, D / McMorrow, D / Schwank, J R / Ikeda, H / Zadeh, A / Flament, O / Hirose, K et al. | 2010
- 1820
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Analysis of SET Propagation in Flash-Based FPGAs by Means of Electrical Pulse InjectionSterpone, L / Battezzati, N / Ferlet-Cavrois, V et al. | 2010
- 1827
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Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser MeasurementsSchwank, J R / Shaneyfelt, M R / McMorrow, D / Ferlet-Cavrois, V / Dodd, P E / Heidel, D F / Marshall, P W / Pellish, J A / LaBel, K A / Rodbell, K P et al. | 2010
- 1835
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Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size DependenceBagatin, Marta / Gerardin, Simone / Cellere, Giorgio / Paccagnella, Alessandro / Visconti, Angelo / Beltrami, Silvia / Bonanomi, Mauro / Harboe-Sorensen, Reno et al. | 2010
- 1842
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Single Event Gate Rupture in 130-nm CMOS Transistor Arrays Subjected to X-Ray IrradiationSilvestri, Marco / Gerardin, Simone / Faccio, Federico / Paccagnella, Alessandro et al. | 2010
- 1849
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Physical Evidence Supporting the Electrical Signature of SEGR on Thin Vertical OxidesLawrence, Reed K / Zimmerman, Jeffrey A / Ross, Jason F et al. | 2010
- 1856
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Gate Bias Dependence of Single Event Charge Collection in AlSb/InAs HEMTsDasGupta, S / McMorrow, D / Reed, R A / Schrimpf, R D / Boos, J B et al. | 2010
- 1856
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SESSION C: SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING Gate Bias Dependence of Single Event Charge Collection in AlSb/InAs HEMTsDasGupta, S et al. | 2010
- 1861
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Development of a New Methodology to Model the Synergistic Effects Between TID and ASETsRoche, N J-H / Dusseau, L / Boch, J / Velo, Y G / Vaille, J / Saigne, F / Auriel, G / Azais, B / Buchner, S P / Marec, R et al. | 2010
- 1869
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Collected Charge Analysis for a New Transient Model by TCAD Simulation in 90 nm TechnologyArtola, Laurent / Hubert, G / Duzellier, S / Bezerra, Francoise et al. | 2010
- 1876
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Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-FlopsUznanski, S / Gasiot, G / Roche, P / Tavernier, C / Autran, Jean-Luc et al. | 2010
- 1884
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Mixed-Mode Simulation of Bit-Flip With Pulsed LaserPalomo, F Rogelio / Mogollon, J M / Napoles, J / Aguirre, M A et al. | 2010
- 1892
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Effect of the Ion Mass and Energy on the Response of 70-nm SOI Transistors to the Ion Deposited Charge by Direct IonizationRaine, M / Gaillardin, M / Sauvestre, J / Flament, O / Bournel, A / Aubry-Fortuna, V et al. | 2010
- 1900
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Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOSLuu, A / Austin, P / Miller, F / Buard, N / Carrière, Thierry / Poirot, P / Gaillard, R / Bafleur, M / Sarrabayrouse, G et al. | 2010
- 1908
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TCAD Simulations on CMOS Propagation Induced Pulse Broadening Effect: Dependence Analysis on the Threshold VoltageMogollón, J M / Palomo, F R / Aguirre, M A / Nápoles, J / Guzmán-Miranda, H / García-Sánchez, E et al. | 2010
- 1915
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“Effective NIEL” in Silicon: Calculation Using Molecular Dynamics Simulation ResultsInguimbert, C / Arnolda, P / Nuns, T / Rolland, G et al. | 2010
- 1915
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SESSION D: BASIC MECHANISMS "Effective NIEL" in Silicon: Calculation Using Molecular Dynamics Simulation ResultsInguimbert, C et al. | 2010
- 1924
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Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETsGriffoni, Alessio / Gerardin, Simone / Meneghesso, Gaudenzio / Paccagnella, Alessandro / Simoen, Eddy / Claeys, Cor et al. | 2010
- 1933
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Effects of Halo Doping and Si Capping Layer Thickness on Total-Dose Effects in Ge p-MOSFETsArora, R / Simoen, E / En Xia Zhang, / Fleetwood, D M / Schrimpf, R D / Galloway, K F / Choi, B K / Mitard, J / Meuris, M / Claeys, C et al. | 2010
- 1940
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A Deep Level Transient Spectroscopy Study of Electron and Proton Irradiated p+ n GaAs DiodesWarner, J H et al. | 2010
- 1940
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A Deep Level Transient Spectroscopy Study of Electron and Proton Irradiated ${\hbox {p}} ^{+} {\hbox {n}}$ GaAs DiodesWarner, Jeffrey H / Cress, Cory D / Messenger, Scott R / Walters, Robert J / Ringel, Steve A / Jeongho Park, et al. | 2010
- 1946
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Semi-Empirical LET Descriptions of Heavy Ions Used in the European Component Irradiation FacilitiesJavanainen, Arto / Trzaska, W H / Harboe-Sørensen, R / Virtanen, A / Berger, G / Hajdas, W et al. | 2010
- 1950
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SESSION E: HARDNESS ASSURANCE Bias Effects on Total Dose-Induced Degradation of Bipolar Linear Microcircuits for Switched Dose-Rate IrradiationVelo, Y G et al. | 2010
- 1950
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Bias Effects on Total Dose-Induced Degradation of Bipolar Linear Microcircuits for Switched Dose-Rate IrradiationVelo, Y Gonzalez / Boch, Jérôme / Roche, Nicolas Jean-Henri / Perez, Stephanie / Vaille, Jean-Roch / Dusseau, Laurent / Saigne, Frédéric / Lorfevre, Eric / Schrimpf, Ronald D / Chatry, Christian et al. | 2010
- 1958
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Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device TestingBerg, M D / Buchner, S P / Hak Kim, / Friendlich, M / Perez, C / Phan, A M / Seidleck, C M / Label, K A / Kruckmeyer, K et al. | 2010
- 1966
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Failure Modes and Hardness Assurance for Linear Integrated Circuits in Space ApplicationsJohnston, Allan H / Rax, B G et al. | 2010
- 1973
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Laser SEL Sensitivity Mapping of SRAM CellsBurnell, Andrew J / Chugg, Andrew Michael / Harboe-Sørensen, Reno et al. | 2010
- 1978
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Fault Modeling and Worst-Case Test Vectors for Logic Failure Induced by Total-Dose in Combinational Circuits of Cell-Based ASICsAbou-Auf, Ahmed A / Abdel-Aziz, H A / Abdel-Aziz, M M et al. | 2010
- 1986
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Extensive SEU Impact Analysis of a PIC Microprocessor for Selective HardeningValderas, M G / García, Marta Portela / López, Celia / Entrena, L et al. | 2010
- 1992
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A New Critical Variable Analysis in Processor-Based SystemsBergaoui, Salma / Vanhauwaert, Pierre / Leveugle, Regis et al. | 2010
- 2000
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ICARE On-Board SAC-C: More Than 8 Years of SEU and MCU, Analysis and PredictionBoatella, C / Hubert, G / Ecoffet, R / Duzellier, S et al. | 2010
- 2000
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SESSION F: TERRESTRIAL AND RADIATION ENVIRONMENTS ICARE On-Board SAC-C: More Than 8 Years of SEU and MCU, Analysis and PredictionBoatella, C et al. | 2010
- 2010
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Background Estimation in MXGS Apparatus on International Space StationAlpat, B / Menichelli, M / Caraffini, D / Petasecca, M / Renzi, F et al. | 2010
- 2017
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Inner Belt Anisotropy Investigations Based on the Standard Radiation Environment Monitor (SREM)Siegl, M / Evans, H D R / Daly, E J / Santin, G / Nieminen, P J / Bühler, P et al. | 2010
- 2024
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Gamma-Radiation Effects on Bragg Gratings Written by Femtosecond UV Laser in Ge-Doped FibersGusarov, A / Brichard, B / Nikogosyan, D N et al. | 2010
- 2024
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SESSION G: PHOTONICS Gamma-Radiation Effects on Bragg Gratings Written by Femtosecond UV Laser in Ge-Doped FibersGusarov, A et al. | 2010
- 2029
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Influence of Manufacturing Parameters and Temperature on the Radiation Sensitivity of Fiber Bragg GratingsHenschel, Henning / Hoeffgen, Stefan K / Kuhnhenn, Jochen / Weinand, Udo et al. | 2010
- 2035
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Effects of Low Temperature Proton Irradiation on a Large Area CCD for Astrometric ApplicationsHopkinson, G R / Gare, P / Sarri, G et al. | 2010
- 2044
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Long-Term Exposure of Fiber Bragg Gratings in the BR1 Low-Flux Nuclear ReactorGusarov, A et al. | 2010
- 2049
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Transient and Steady State Radiation Responses of Solarization-Resistant Optical FibersGirard, S / Marcandella, C et al. | 2010
- 2056
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Cobalt-60, Proton and Electron Irradiation of a Radiation-Hardened Active Pixel SensorBeaumel, Matthieu / Hervé, Dominique / Van Aken, Dirk et al. | 2010
- 2066
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SESSION H: DOSIMETRY Prediction of the Response of the Commercial BPW34FS Silicon p-i-n Diode Used as Radiation Monitoring Sensors up to Very High FluencesMekki, J et al. | 2010
- 2066
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Prediction of the Response of the Commercial BPW34FS Silicon p-i-n Diode Used as Radiation Monitoring Sensors up to Very High FluencesMekki, J / Moll, M / Fahrer, M / Glaser, M / Dusseau, L et al. | 2010
- 2074
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The Radiation Hardness Assurance Facility at INFN-LNS Catania for the Irradiation of Electronic Components in AirMenichelli, Mauro / Alpat, Behcet / Papi, Andrea / Sorensen, Reno Harboe / Cirrone, G A P / Ferrera, Francesco / Figuera, Pierpaolo / Finocchiaro, Paolo / Lattuada, Marcello / Rifuggiato, Danilo et al. | 2010
- 2079
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SESSION I: TECHNOLOGY AND DESIGN HARDENING A Commercial 65 nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and ModelingRoche, P et al. | 2010
- 2079
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A Commercial 65 nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and ModelingRoche, Philippe / Gasiot, Gilles / Uznanski, Slawosz / Daveau, Jean-Marc / Torras-Flaquer, Josep / Clerc, Sylvain / Harboe-Sørensen, Reno et al. | 2010
- 2089
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A 90 nm Bulk CMOS Radiation Hardened by Design Cache MemoryXiaoyin Yao, / Clark, Lawrence T / Patterson, Dan W / Holbert, Keith E et al. | 2010
- 2098
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Evaluating the Impact of DfM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor CoreRech, Paolo / Paccagnella, Alessandro / Grosso, Michelangelo / Reorda, Matteo Sonza / Melchiori, Fabio / Loparco, Domenico / Appello, Davide et al. | 2010
- 2106
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Matrix-Based Codes for Adjacent Error CorrectionArgyrides, Costas A / Reviriego, Pedro / Pradhan, Dhiraj K / Maestro, Juan Antonio et al. | 2010
- 2112
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Enhanced Implementations of Hamming Codes to Protect FIR FiltersShih-Fu Liu, / Reviriego, Pedro / Maestro, Juan Antonio et al. | 2010
- 2119
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Non-TMR SEU-Hardening Techniques for SiGe HBT Shift Registers and Clock BuffersWilcox, Edward P / Phillips, Stanley D / Cressler, John D / Marshall, Paul W / Carts, Martin A / Pellish, Jonathan A / Richmond, Larry / Mathes, William / Randall, Barbara / Post, Devon et al. | 2010
- 2124
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Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving DistanceReviriego, P / Maestro, J A / Sanghyeon Baeg, / ShiJie Wen, / Wong, Richard et al. | 2010
- 2129
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Experimental Validation of Fault Injection Analyses by the FLIPPER ToolAlderighi, Monica / Casini, Fabio / D'Angelo, Sergio / Mancini, Marcello / Codinachs, David Merodio / Pastore, Sandro / Poivey, Christian / Sechi, Giacomo R / Sorrenti, Gabriele / Weigand, Roland et al. | 2010
- 2135
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Total Dose Effects on a FD-SOI Technology for Monolithic Pixel SensorsMattiazzo, Serena / Battaglia, Marco / Bisello, Dario / Contarato, Devis / Denes, Peter / Giubilato, Piero / Pantano, Devis / Pozzobon, Nicola / Tessaro, Mario / Wyss, Jeffery et al. | 2010
- 2142
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Conference Author Index| 2010
- 2144
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17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors| 2010
- 2147
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2009 16TH CONFERENCE ON REAL TIME (RT2009) BEIJING, CHINA, MAY 10-15, ATCA Advanced Control and Data Acquisition Systems for Fusion ExperimentsGonçalves, B et al. | 2010
- 2147
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ATCA Advanced Control and Data Acquisition Systems for Fusion ExperimentsGonçalves, B / Sousa, J / Batista, A / Pereira, R / Correia, M / Neto, A / Carvalho, B / Fernandes, H / Varandas, C A F et al. | 2010
- 2155
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X-Ray Filter Design and Its Evaluation in Dual-Energy X-Ray Absorptiometry (DXA)Kwang Hyun Kim, et al. | 2010
- 2155
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APPLICATIONS (SCINT 2009) JEJU ISLAND, KOREA, JUNE 8-12, 2009 10TH INTERNATIONAL CONFERENCE ON INORGANIC SCINTILLATORS AND THEIR X-Ray Filter Design and Its Evaluation in Dual-Energy X-Ray Absorptiometry (DXA)Kim, K H et al. | 2010
- 2159
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Design Studies for a High Resolution Cold Cavity Beam Position MonitorSeunghwan Shin, / Wendt, Manfred et al. | 2010
- 2159
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ACCELERATOR TECHNOLOGY Design Studies for a High Resolution Cold Cavity Beam Position MonitorShin, S et al. | 2010
- 2167
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Latchup Topology for Pixel Readout Using Commercial TransistorsGabrielli, Alessandro et al. | 2010
- 2167
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ANALOG AND DIGITAL CIRCUITS Latchup Topology for Pixel Readout Using Commercial TransistorsGabrielli, A et al. | 2010
- 2173
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High Performance Analog Front-End for Digital SpectroscopyAbba, A / Manenti, A / Caponio, F / Geraci, A et al. | 2010
- 2178
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Vertically Integrated Circuits at FermilabDeptuch, G W / Demarteau, M / Hoff, J R / Lipton, R / Shenai, A / Trimpl, M / Yarema, R / Zimmerman, T et al. | 2010
- 2187
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Geant4 Simulation of the New ALC μSR SpectrometerSedlak, K. / Shiroka, T. / Stoykov, A. / Scheuermann, R. et al. | 2010
- 2187
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COMPUTING, SIMULATION, ALGORITHMS, AND SOFTWARE Geant4 Simulation of the New ALC μSR SpectrometerSedlak, K et al. | 2010
- 2187
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Geant4 Simulation of the New ALC $ {\mu }{\rm SR}$ SpectrometerSedlak, K / Shiroka, T / Stoykov, A / Scheuermann, R et al. | 2010
- 2196
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Track-Induced Clustering in Position Sensitive Detector CharacterizationMaenpaa, Teppo / Kortelainen, Matti J / Lampen, Tapio et al. | 2010
- 2200
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CCD Base Line Subtraction AlgorithmsKotov, Ivan V / Kotov, Alexandra I / Frank, James / O'Connor, Paul / Perevoztchikov, Victor / Takacs, Peter et al. | 2010
- 2205
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GAS DETECTORS A New Technique for Gaseous Radiation Detectors: The Multigrid High-Pressure Xenon Gas Proportional Scintillation CounterBorges, F I G M et al. | 2010
- 2205
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A New Technique for Gaseous Radiation Detectors: The Multigrid High-Pressure Xenon Gas Proportional Scintillation CounterBorges, Filipa I G M / do Carmo, Sergio J C / Mariquito, João C R / Trindade, Alexandre M F / Conde, Carlos A N et al. | 2010
- 2210
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Measurements of Induced Charge Profile in RPC With Submilli-StripsNarita, S / Shoji, M / Hoshi, Y / Miura, D / Kikuchi, Y / Neichi, K / Yamaguchi, A et al. | 2010
- 2215
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HOMELAND SECURITY APPLICATIONS Neutron Detection With Gamma-Ray Spectrometers for Border Security ApplicationsMitchell, D J et al. | 2010
- 2215
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Neutron Detection With Gamma-Ray Spectrometers for Border Security ApplicationsMitchell, Dean J / Harding, Lee T / Smith, Kenneth R et al. | 2010
- 2220
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Distribution of Absorbed Dose in Cone-Beam Breast Computed Tomography: A Phantom Study With Radiochromic FilmsRusso, Paolo / Coppola, Teresa / Mettivier, Giovanni et al. | 2010
- 2220
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IMAGING AND INSTRUMENTATION FOR NUCLEAR MEDICINE Distribution of Absorbed Dose in Cone-Beam Breast Computed Tomography: A Phantom Study With Radiochromic FilmsRusso, P et al. | 2010
- 2230
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Time-Spectral Analysis Methods for Spent Fuel Assay Using Lead Slowing-Down SpectroscopySmith, L Eric / Anderson, Kevin K / Ressler, Jennifer J / Shaver, Mark W et al. | 2010
- 2230
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NEUTRON DETECTION Time-Spectral Analysis Methods for Spent Fuel Assay Using Lead Slowing-Down SpectroscopySmith, L E et al. | 2010
- 2239
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Measurement of Neutron Yields From UF4Bell, Z W et al. | 2010
- 2239
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Measurement of Neutron Yields From ${\rm UF}_{4}$Bell, Z W / Ziock, K.-P / Ohmes, M F / Yunlin Xu, / Downar, T / Pozzi, S A et al. | 2010
- 2247
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NUCLEAR MONITORING Signatures and Methods for the Automated Nondestructive Assay of UF6 Cylinders at Uranium Enrichment PlantsSmith, L E et al. | 2010
- 2247
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Signatures and Methods for the Automated Nondestructive Assay of UF~6 Cylinders at Uranium Enrichment PlantsSmith, L.E. / Mace, E.K. / Misner, A.C. / Shaver, M.W. et al. | 2010
- 2247
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Signatures and Methods for the Automated Nondestructive Assay of ${\rm UF}_{6}$ Cylinders at Uranium Enrichment PlantsSmith, L Eric / Mace, Emily K / Misner, Alex C / Shaver, Mark W et al. | 2010
- 2254
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A Comprehensive Model of the Response of Silicon Photomultipliersvan Dam, H T / Seifert, S / Vinke, R / Dendooven, D / Löhner, H / Beekman, F J / Schaart, D R et al. | 2010
- 2254
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PHOTODETECTORS A Comprehensive Model of the Response of Silicon Photomultipliersvan Dam, H T et al. | 2010
- 2267
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Crosstalk Study of the Single-Photon Response of a Flat-Panel PMT for the RICH Upgrade at LHCbArnaboldi, C / Artuso, M / Calvi, M / Fanchini, E / Gotti, C / Maino, M / Matteuzzi, C / Perego, D L / Pessina, G / Jianchun Wang, et al. | 2010
- 2273
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Timing Performances of Large Area Silicon Photomultipliers Fabricated at STMicroelectronicsMazzillo, Massimo / Condorelli, Giovanni / Sanfilippo, Delfo / Valvo, Giuseppina / Carbone, Beatrice / Piana, Angelo / Fallica, Giorgio / Ronzhin, Anatoly / Demarteau, Marcel / Los, Sergey et al. | 2010
- 2280
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Performance Measurements of CMOS Position Sensitive Solid-State PhotomultipliersMcClish, M / Dokhale, P / Christian, J / Stapels, C / Johnson, E / Robertson, R / Shah, K S et al. | 2010
- 2287
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A Radiation Hard Digital Monolithic Pixel Sensor for the EUDET-JRA1 ProjectOrsini, Fabienne / Baudot, Jerome / Bertolone, Gregory / Brogna, Andrea / Claus, Gilles / Colledani, Claude / De Masi, Rita / Degerli, Yavuz / Dorokhov, Andrei / Dulinski, Wojciech et al. | 2010
- 2287
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RADIATION DAMAGE EFFECTS A Radiation Hard Digital Monolithic Pixel Sensor for the EUDET-JRA1 ProjectOrsini, F et al. | 2010
- 2294
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Investigation of Irradiated Silicon Detectors by Edge-TCTKramberger, G / Cindro, V / Mandić, I / Mikuž, M / Milovanović, M / Zavrtanik, M / Žagar, K et al. | 2010
- 2294
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RADIATION EFFECTS Investigation of Irradiated Silicon Detectors by Edge-TCTKramberger, G et al. | 2010
- 2303
-
Trapping of Holes and Excitons in Scintillators: CsI and LaX3 (XVan Ginhoven, R M et al. | 2010
- 2303
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Trapping of Holes and Excitons in Scintillators: CsI and ${\rm LaX}_{3}$ ( ${\rm X}={\rm Cl}$, Br)Van Ginhoven, Renee M / Jaffe, John E / Kerisit, Sebastien / Rosso, Kevin M et al. | 2010
- 2303
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Trapping of Holes and Excitons in Scintillators: CsI and LaX~3 (X = Cl, Br)Van Ginhoven, R.M. / Jaffe, J.E. / Kerisit, S. / Rosso, K.M. et al. | 2010
- 2309
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Radiation Tolerance of NROM Embedded ProductsLisiansky, Michael / Cassuto, Gil / Roizin, Yakov / Corso, Domenico / Libertino, Sebania / Marino, Antonio / Lombardo, Salvatore A / Crupi, Isodiana / Pace, Calogero / Crupi, Felice et al. | 2010
- 2318
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Mobility Modeling Considerations for Radiation Effects Simulations in SiliconCummings, Daniel J / Witulski, Arthur F / Hyunwoo Park, / Schrimpf, Ronald D / Thompson, Scott E / Law, Mark E et al. | 2010
- 2327
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Photo-Annealing Effects on Gamma Radiation Induced Attenuation in Erbium Doped Fibers and the Sources Using 532-nm and 976-nm LasersTz-Shiuan Peng, / Yen-Wei Huang, / Wang, L A / Ren-Young Liu, / Fong-In Chou, et al. | 2010
- 2332
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Redundant Residue Number Systems Based Radiation Hardening for DatapathLi, L et al. | 2010
- 2344
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Single Event Transient Suppressor for Flip-FlopsXiaoxuan She, / Li, N / Carlson, R M / Erstad, D O et al. | 2010
- 2349
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Influence of Contacts on Electric Field in an Au/(CdZn)Te/Au Detector: A SimulationFranc, Jan / James, Ralph B / Grill, Roman / Dědič, Vaclav / Belas, Eduard / Praus, Petr / Prekas, Georgios / Sellin, Paul J et al. | 2010
- 2359
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Readout ASIC With SOI Technology for X-Ray CCDsKishishita, Tetsuichi / Idehara, Toshihiro / Ikeda, Hirokazu / Tsunemi, Hiroshi / Arai, Yasuo / Sato, Goro / Takahashi, Tadayuki et al. | 2010
- 2359
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READOUT ELECTRONICS Readout ASIC With SOI Technology for X-Ray CCDsKishishita, T et al. | 2010
- 2365
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Development of 500 MHz Multi-Channel Readout Electronics for Fast Radiation DetectorsHennig, W / Asztalos, S J / Breus, D / Sabourov, K / Warburton, W K et al. | 2010
- 2371
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Towards an Efficient Prototype of a RPC Detector Readout System for the Daya Bay Neutrino ExperimentHeng Yang, / Hao Liang, / Yuan Yuan, / Xiaoqi Yu, / Yongzhao Zhou, et al. | 2010
- 2376
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A Measurement of the Scintillation Light Yield in ${\rm CF}_{4}$ Using a Photosensitive GEM DetectorAzmoun, Babek / Caccavano, Adam / Rumore, Matthew / Sinsheimer, John / Smirnov, Nikolai / Stoll, Sean / Woody, Craig et al. | 2010
- 2376
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A Measurement of the Scintillation Light Yield in CF~4 Using a Photosensitive GEM DetectorAzmoun, B. / Caccavano, A. / Rumore, M. / Sinsheimer, J. / Smirnov, N. / Stoll, S. / Woody, C. et al. | 2010
- 2376
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SCINTILLATION DETECTORS A Measurement of the Scintillation Light Yield in CF4 Using a Photosensitive GEM DetectorAzmoun, B et al. | 2010
- 2382
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Design and Experimental Characterization of Multilinear Silicon Drift Detectors for 2D Position-Sensing Operating at High Drift FieldsCastoldi, A / Guazzoni, C / Garafalo, F Tassan / Hartmann, R / Strüder, L et al. | 2010
- 2382
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SOLID STATE DETECTORS Design and Experimental Characterization of Multilinear Silicon Drift Detectors for 2D Position-Sensing Operating at High Drift FieldsCastoldi, A et al. | 2010
- 2389
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DEPFET Macropixel Detectors for MIXS: First Electrical Qualification MeasurementsMajewski, P / Andricek, L / Christensen, U / Hilchenbach, M / Lauf, T / Lechner, P / Lutz, G / Reiffers, J / Richter, R / Schaller, G et al. | 2010
- 2397
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Fast High-Flux Response of CdZnTe X-Ray Detectors by Optical Manipulation of Deep Level Defect OccupationsProkesch, M / Bale, D S / Szeles, C et al. | 2010
- 2400
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Charge Collection and Propagation in Diamond X-Ray DetectorsKeister, Jeffrey W / Smedley, John / Dimitrov, Dimitre / Busby, Richard et al. | 2010
- 2405
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CORRECTIONS Correction to "Evidences of Rare-Earth Nanophases Embedded in Silica Using Vibrational Spectroscopy"Vedda, A et al. | 2010
- 2405
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Correction to “Evidences of Rare-Earth Nanophases Embedded in Silica Using Vibrational Spectroscopy” [Jun 10 1361-1369]Vedda, Anna / Chiodini, Norberto / Fasoli, Mauro / Lauria, Alessandro / Moretti, Federico / Di Martino, Daniela / Baraldi, Andrea / Buffagni, Elisa / Capelletti, Rosanna / Mazzera, Margherita et al. | 2010
- 2406
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Correction to “Scintillation Screen Investigations for High-Current Ion Beams” [Jun 10 1414-1419]Gütlich, Eiko / Forck, Peter / Ensinger, Wolfgang / Walasek-Höhne, Beata et al. | 2010
- 2406
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Correction to "Scintillation Screen Investigations for High-Current Ion Beams"Gütlich, E et al. | 2010
- 2408
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IEEE Foundation| 2010
- C1
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[Front cover]| 2010
- C2
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IEEE Transactions on Nuclear Science publication information| 2010
- C3
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IEEE Transactions on Nuclear Science information for authors| 2010
- C4
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2010
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SELECTED PAPERS FROM THE 2009 RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) CONFERENCE, Bruges, Belgium, September 14-18, 2009| 2010