Statistically Planned and Individually Improved Predictive Maintenance Management for Continuously Monitored Degrading Systems (Englisch)
- Neue Suche nach: You, M-Y
- Neue Suche nach: You, M-Y
- Neue Suche nach: Liu, F
- Neue Suche nach: Wang, W
- Neue Suche nach: Meng, G
In:
IEEE transactions on reliability
;
59
, 4
; 744-754
;
2010
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Statistically Planned and Individually Improved Predictive Maintenance Management for Continuously Monitored Degrading Systems
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Beteiligte:
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Erschienen in:IEEE transactions on reliability ; 59, 4 ; 744-754
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Erscheinungsort:New York, NY
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Erscheinungsdatum:2010
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 85.35 / 50.16
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/4575/5670
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Schlagwörter:
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Klassifikation:
BKL: 85.35 Fertigung / 50.16 Technische Zuverlässigkeit, Instandhaltung Lokalklassifikation TIB: 770/4575/5670 -
Datenquelle:
Inhaltsverzeichnis – Band 59, Ausgabe 4
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