Multifrequency ESR analysis of the E'δ defect in a-SiO2 (16 pages) - 094118 (Englisch)
- Neue Suche nach: Jivanescu, M
- Neue Suche nach: Jivanescu, M
- Neue Suche nach: Stesmans, A
- Neue Suche nach: Afanas'ev, V V
In:
Physical review / B
;
83
, 9
;
2011
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Multifrequency ESR analysis of the E'δ defect in a-SiO2 (16 pages) - 094118
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Beteiligte:
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Erschienen in:Physical review / B ; 83, 9
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Verlag:
- Neue Suche nach: APS
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Erscheinungsort:Ridge, NY
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Erscheinungsdatum:2011
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00 / 33.60
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Datenquelle:
Inhaltsverzeichnis – Band 83, Ausgabe 9
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