Yield enhancement techniques for 3-dimensional random access memories (Englisch)
- Neue Suche nach: Lu, Shyue-Kung
- Neue Suche nach: Lu, Shyue-Kung
- Neue Suche nach: Chang, Tin-Wei
- Neue Suche nach: Hsu, Han-Yu
In:
Microelectronics reliability
;
52
, 6
; 1065-1071
;
2012
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Yield enhancement techniques for 3-dimensional random access memories
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Beteiligte:
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Erschienen in:Microelectronics reliability ; 52, 6 ; 1065-1071
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Verlag:
- Neue Suche nach: Elsevier
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Erscheinungsort:Amsterdam [u.a.]
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Erscheinungsdatum:2012
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ISSN:
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ZDBID:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 275/5670
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 52, Ausgabe 6
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