The effect of humidity on reverse breakdown in 3D silicon sensors (Englisch)
- Neue Suche nach: McDuff, H
- Neue Suche nach: McDuff, H
- Neue Suche nach: Hoeferkamp, M.R
- Neue Suche nach: Seidel, S
- Neue Suche nach: Wang, R
- Neue Suche nach: Kenney, C.J
- Neue Suche nach: Hasi, J
- Neue Suche nach: Parker, S.I
In:
Nuclear instruments & methods in physics research / A
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785
; 1-4
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2015
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:The effect of humidity on reverse breakdown in 3D silicon sensors
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Beteiligte:McDuff, H ( Autor:in ) / Hoeferkamp, M.R / Seidel, S / Wang, R / Kenney, C.J / Hasi, J / Parker, S.I
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Erschienen in:
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Verlag:
- Neue Suche nach: North-Holland Publ. Co.
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Erscheinungsort:Amsterdam
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Erscheinungsdatum:2015
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 535/3450
- Neue Suche nach: 33.07 / 33.05 / 33.40
- Weitere Informationen zu Basisklassifikation
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Datenquelle:
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