Fast Wafer-Level Stress-and-Sense Methodology for Characterization of Ring-Oscillator Degradation in Advanced CMOS Technologies (Englisch)
- Neue Suche nach: Kerber, Andreas
- Neue Suche nach: Kerber, Andreas
- Neue Suche nach: Xinggong Wan
- Neue Suche nach: Yang Liu
- Neue Suche nach: Nigam, Tanya
In:
IEEE transactions on electron devices
;
62
, 5
; 1427-1432
;
2015
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Fast Wafer-Level Stress-and-Sense Methodology for Characterization of Ring-Oscillator Degradation in Advanced CMOS Technologies
-
Beteiligte:
-
Erschienen in:IEEE transactions on electron devices ; 62, 5 ; 1427-1432
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsort:New York, NY
-
Erscheinungsdatum:2015
-
ISSN:
-
ZDBID:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 53.50 / 53.00 / 52.50 / 54.20
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/5670
-
Schlagwörter:
-
Klassifikation:
-
Datenquelle:
Inhaltsverzeichnis – Band 62, Ausgabe 5
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1363
-
Methods for Determining the Emitter Resistance in SiGe HBTs: A Review and an Evaluation Across Technology GenerationsKrause, Julia / Schroter, Michael et al. | 2015
- 1375
-
Analytical Model for the Inversion Gate Capacitance of DG and UTBB MOSFETs at the Quantum Capacitance LimitHiblot, Gaspard / Rafhay, Quentin / Boeuf, Frederic / Ghibaudo, Gerard et al. | 2015
- 1383
-
Large-Signal Reliability Analysis of SiGe HBT Cascode Driver AmplifiersOakley, Michael A. / Raghunathan, Uppili S. / Wier, Brian R. / Chakraborty, Partha Sarathi / Cressler, John D. et al. | 2015
- 1390
-
Accelerated Spatially Resolved Electrical Simulation of Photovoltaic Devices Using Photovoltaic-Oriented Nodal AnalysisWu, Xiaofeng / Bliss, Martin / Sinha, Archana / Betts, Thomas R. / Gupta, Rajesh / Gottschalg, Ralph et al. | 2015
- 1399
-
An Analytic Model for Heterojunction Tunnel FETs With Exponential BarrierTaur, Yuan / Wu, Jianzhi / Min, Jie et al. | 2015
- 1405
-
Detection of Stress-Induced Interface Trap Generation on High- $k$ Gated nMOSFETs in Real Time by Stress-and-Sense Charge Pumping TechniqueLu, Chun-Chang / Chang-Liao, Kuei-Shu / Tsai, Fu-Huan / Li, Chen-Chien / Wang, Tien-Ko et al. | 2015
- 1411
-
Planar Bulk MOSFETs With Self-Aligned Pocket Well to Improve Short-Channel Effects and Enhance Device PerformanceZhang, Yanbo / Zhu, Huilong / Wu, Hao / Zhang, Yongkui / Zhao, Zhiguo / Zhong, Jian / Yang, Hong / Liang, Qingqing / Wang, Dahai / Li, Junfeng et al. | 2015
- 1419
-
Germanium nMOSFETs With Recessed Channel and S/D: Contact, Scalability, Interface, and Drain Current Exceeding 1 A/mmWu, Heng / Si, Mengwei / Dong, Lin / Gu, Jiangjiang / Zhang, Jingyun / Ye, Peide D. et al. | 2015
- 1427
-
Fast Wafer-Level Stress-and-Sense Methodology for Characterization of Ring-Oscillator Degradation in Advanced CMOS TechnologiesKerber, Andreas / Wan, Xinggong / Liu, Yang / Nigam, Tanya et al. | 2015
- 1433
-
Vertical GAAFETs for the Ultimate CMOS ScalingYakimets, Dmitry / Eneman, Geert / Schuddinck, Pieter / Bao, Trong Huynh / Bardon, Marie Garcia / Raghavan, Praveen / Veloso, Anabela / Collaert, Nadine / Mercha, Abdelkarim / Verkest, Diederik et al. | 2015
- 1440
-
Correlation Between Epitaxial Layer Quality and Drain Current Stability of GaN/AlGaN/GaN Heterostructure Field-Effect TransistorsAndo, Yuji / Takenaka, Isao / Takahashi, Hidemasa / Sasaoka, Chiaki et al. | 2015
- 1448
-
Physics and Mitigation of Excess OFF-State Current in InGaAs Quantum-Well MOSFETsLin, Jianqiang / Antoniadis, Dimitri A. / del Alamo, Jesus A. et al. | 2015
- 1456
-
High-Mobility In0.23Ga0.77As Channel MOSFETs Grown on Ge/Si Virtual Substrate by MOCVDKong, Xiangting / Zhou, Xuliang / Li, Shiyan / Chang, Hudong / Liu, Honggang / Wang, Jing / Liang, Renrong / Wang, Wei / Pan, Jiaoqing et al. | 2015
- 1456
-
High-mobility As channel MOSFETs grown on Ge/Si virtual substrate by MOCVDXiangting Kong et al. | 2015
- 1460
-
Investigations of TiO2–AlGaN/GaN/Si-Passivated HFETs and MOS-HFETs Using Ultrasonic Spray Pyrolysis DepositionLee, Ching-Sung / Hsu, Wei-Chou / Chou, Bo-Yi / Liu, Han-Yin / Yang, Cheng-Long / Sun, Wen-Ching / Wei, Sung-Yen / Yu, Sheng-Min / Wu, Chang-Luen et al. | 2015
- 1460
-
Investigations of Ti-AlGaN/GaN/Si-passivated HFETs and MOS-HFETs using ultrasonic spray pyrolysis depositionChing-Sung Lee et al. | 2015
- 1467
-
Self-Heating Profile in an AlGaN/GaN Heterojunction Field-Effect Transistor Studied by Ultraviolet and Visible Micro-Raman SpectroscopyNazari, Mohammad / Hancock, Bobby Logan / Piner, Edwin L. / Holtz, Mark W. et al. | 2015
- 1473
-
Conversion Efficiency Improvement of InGaN/GaN Multiple-Quantum-Well Solar Cells With Ex Situ AlN Nucleation LayerYu, Chun-Ta / Lai, Wei-Chih / Yen, Cheng-Hsiung / Chang, Ching-Wen / Tu, Li-Wei / Chang, Shoou-Jinn et al. | 2015
- 1478
-
Thickness-Optimized Multilevel Resistive Switching of Silver Programmable Metallization Cells With Stacked SiOx/SiO2 Solid ElectrolytesWang, Jer-Chyi / Chiu, Chun-Hsiang / Chen, Wei-Fan et al. | 2015
- 1484
-
Intergate Dielectric Engineering Toward Large P/E Window Planar NAND FlashBreuil, Laurent / Lisoni, Judit G. / Blomme, Pieter / Tan, Chi Lim / Van den Bosch, Geert / Van Houdt, Jan et al. | 2015
- 1491
-
Fitting Cells Into a Narrow V Interval: Physical Constraints Along the Lifetime of an Extremely Scaled NAND Flash Memory ArrayPaolucci, Giovanni Maria et al. | 2015
- 1491
-
Fitting Cells Into a Narrow $V_{T}$ Interval: Physical Constraints Along the Lifetime of an Extremely Scaled NAND Flash Memory ArrayPaolucci, Giovanni Maria / Compagnoni, Christian Monzio / Spinelli, Alessandro S. / Lacaita, Andrea L. / Goda, Akira et al. | 2015
- 1491
-
Fitting Cells Into a Narrow [Formula Omitted] Interval: Physical Constraints Along the Lifetime of an Extremely Scaled NAND Flash Memory ArrayGiovanni Maria Paolucci et al. | 2015
- 1498
-
Temperature Effects in Complementary Inverters Made With Polysilicon Source-Gated TransistorsSporea, Radu A. / Trainor, Michael / Young, Nigel / Shannon, John M. / Silva, S. Ravi P. et al. | 2015
- 1504
-
Extraction of Propagation Delay-Correlated Mobility and Its Verification for Amorphous InGaZnO Thin-Film Transistor-Based InvertersLee, Kyung Min / Jang, Jaeman / Choi, Sung-Jin / Kim, Dong Myong / Kim, Kyung Rok / Kim, Dae Hwan et al. | 2015
- 1511
-
Performance Characterization and Theoretical Modeling of Emitted Optical Power for High-Power White-LED DevicesTao, Xuehui et al. | 2015
- 1516
-
A Novel Photosensitive Tunneling Transistor for Near-Infrared Sensing Applications: Design, Modeling, and SimulationGupta, Partha Sarathi / Chattopadhyay, Sanatan / Dasgupta, Parthasarathi / Rahaman, Hafizur et al. | 2015
- 1524
-
A 600 V High-Voltage IC Technique With a New Self-Shielding Structure for High Noise Tolerance and Die ShrinkYamaji, Masaharu / Jonishi, Akihiro / Tanaka, Takahide / Sumida, Hitoshi / Hashimoto, Yoshio et al. | 2015
- 1530
-
Technology/Circuit/System Co-Optimization and Benchmarking for Multilayer Graphene Interconnects at Sub-10-nm Technology NodePan, Chenyun / Raghavan, Praveen / Ceyhan, Ahmet / Catthoor, Francky / Tokei, Zsolt / Naeemi, Azad et al. | 2015
- 1537
-
Cu Nanolines for RF Interconnects: Electrical CharacterizationSarafis, Panagiotis / Hsu, Chuan-Lu / Benech, Philippe / Nassiopoulou, Androula G. et al. | 2015
- 1544
-
Electrical Modeling and Characterization of Shield Differential Through-Silicon ViasLu, Qijun / Zhu, Zhangming / Yang, Yintang / Ding, Ruixue et al. | 2015
- 1553
-
Carrier Recombination Lifetime Measurement in Silicon Epitaxial Layers Using Optically Excited MOS Capacitor TechniqueElhami Khorasani, Arash / Schroder, Dieter K. / Alford, T. L. et al. | 2015
- 1561
-
Effect of RESET Voltage on Distribution of SET Switching Time of Bipolar Resistive Switching in a Tantalum Oxide Thin FilmNishi, Yoshifumi / Fleck, Karsten / Bottger, Ulrich / Waser, Rainer / Menzel, Stephan et al. | 2015
- 1568
-
High-Performance MIM Capacitors With Nanomodulated Electrode SurfaceHourdakis, Emmanouel / Travlos, Anastassios / Nassiopoulou, Androula G. et al. | 2015
- 1574
-
Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI TechnologyIoannidis, Eleftherios G. / Theodorou, Christoforos G. / Karatsori, Theano A. / Haendler, Sebastien / Dimitriadis, Charalabos A. / Ghibaudo, Gerard et al. | 2015
- 1580
-
Full Analytical Evaluation of the Einstein Relation for Disordered SemiconductorsCopuroglu, Ebru / Mehmetolu, Tural et al. | 2015
- 1584
-
A Comprehensive Study of Transistors Based on Conductive Polymer Matrix CompositesAzar, Nima Sefidmooye / Pourfath, Mahdi et al. | 2015
- 1590
-
Perovskite-Based Solar Cells With Nickel-Oxidized Nickel Oxide Hole Transfer LayerLai, Wei-Chih / Lin, Kun-Wei / Guo, Tzung-Fang / Lee, Jung et al. | 2015
- 1596
-
Piezoresistive Transduction in a Double-Ended Tuning Fork SOI MEMS Resonator for Enhanced Linear Electrical PerformanceZhang, Weiguan / Zhu, Haoshen / Lee, Joshua E.-Y. et al. | 2015
- 1603
-
Frequency Stability of RF-MEMS Disk ResonatorsYuan, Quan / Luo, Wei / Zhao, Hui / Peng, Bohua / Yang, Jinling / Yang, Fuhua et al. | 2015
- 1609
-
An Overmoded W-Band Coupled-Cavity TWTKowalski, Elizabeth J. / Shapiro, Michael A. / Temkin, Richard J. et al. | 2015
- 1617
-
Automodulation Processes in Clinotrons With Low-Focusing Magnetic FieldSattorov, Matlabjon / Khutoryan, Eduard / Lukin, Konstantin / Kwon, Ohjoon / Min, Sun-Hong / Bhattacharya, Ranajoy / Baek, In-Keun / Kim, Seontae / Yi, Minwoo / So, Joonho et al. | 2015
- 1622
-
Investigation of Microstrip Meander-Line Traveling-Wave Tube Using EBG Ground PlaneBai, Ningfeng / Shen, Meng / Sun, Xiaohan et al. | 2015
- 1628
-
Theory of Multimode Resonant Backward-Wave Oscillator With an Inclined Electron BeamKhutoryan, Eduard / Sattorov, Matlabjon / Lukin, Konstantin Alexandrovich / Kwon, Oh-Joon / Min, Sun-Hong / Bhattacharya, Ranajoy / Baek, In-Keun / Kim, Seontae / Yi, Minwoo / So, Joonho et al. | 2015
- 1635
-
A Study of Scandia-Doped-Impregnated Cathode Fabricated by Spray Drying MethodWang, Jinshu / Cui, Yuntao / Liu, Wei / Wang, Yiman / Yang, Fan / Zhou, Fan / Zhou, Meiling et al. | 2015
- 1641
-
Nonlinear Investigation and 3-D Particle Simulation of Second-Harmonic Gyro-TWT With a Mode Selective CircuitThottappan, Muthiah / Jain, Pradip Kumar et al. | 2015
- 1648
-
Thermal Design of High Efficiency, High Reliability Pulsed Space TWT’s Grid-Controlled Electron GunLi, Xin-Wei / Shang, Xin-Wen / Su, Xiao-Bao / Liu, Wei / Xiao, Liu / Yu, Shi-Ji et al. | 2015
- 1655
-
Performance of CMOS With Si pMOS and Asymmetric InP/InGaAs nMOS for Analog Circuit ApplicationsTewari, Suchismita / Biswas, Abhijit / Mallik, Abhijit et al. | 2015
- 1659
-
High-Performance Amorphous InGaZnO Thin-Film Transistors With HfO2/Lu2O3/HfO2 Sandwich Gate DielectricsHer, Jim-Long / Chen, Fa-Hsyang / Li, Wei-Chen / Pan, Tung-Ming et al. | 2015
- 1663
-
Determination of Source-and-Drain Series Resistance in 16-nm-Gate FinFET DevicesSu, Ping-Hsun / Li, Yiming et al. | 2015
- 1668
-
Vacuum-Insulated Self-Aligned Nanowire Phase-Change Memory DevicesMuneer, Sadid / Gokirmak, Ali / Silva, Helena et al. | 2015
- 1672
-
Enhanced Critical Electrical Characteristics in a Nanoscale Low-Voltage SOI MOSFET With Dual Tunnel DiodeAnvarifard, Mohammad Kazem / Orouji, Ali Asghar et al. | 2015
- C1
-
Table of contents| 2015
- C2
-
IEEE Transactions on Electron Devices publication information| 2015
- C3
-
IEEE Transactions on Electron Devices information for authors| 2015
- C4
-
Blank page| 2015