A Novel Approach Using Discrete Grain-Boundary Traps to Study the Variability of 3-D Vertical-Gate NAND Flash Memory Cells (Englisch)
- Neue Suche nach: Pei-Yu Wang
- Neue Suche nach: Pei-Yu Wang
- Neue Suche nach: Bing-Yue Tsui
In:
IEEE transactions on electron devices
;
62
, 8
; 2488-2493
;
2015
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:A Novel Approach Using Discrete Grain-Boundary Traps to Study the Variability of 3-D Vertical-Gate NAND Flash Memory Cells
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Beteiligte:Pei-Yu Wang ( Autor:in ) / Bing-Yue Tsui
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Erschienen in:IEEE transactions on electron devices ; 62, 8 ; 2488-2493
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsort:New York, NY
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Erscheinungsdatum:2015
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 53.50 / 53.00 / 52.50 / 54.20
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Datenquelle:
Inhaltsverzeichnis – Band 62, Ausgabe 8
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