Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy (Englisch)
- Neue Suche nach: Scheer, M
- Neue Suche nach: Scheer, M
- Neue Suche nach: Ondráček, M
- Neue Suche nach: Jelínek, P
- Neue Suche nach: Albrecht, F
- Neue Suche nach: Fleischmann, M
- Neue Suche nach: Repp, J
In:
Physical review letters
;
115
, 7
;
2015
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy
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Beteiligte:
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Erschienen in:Physical review letters ; 115, 7
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Verlag:
- Neue Suche nach: American Physical Society
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Erscheinungsort:Ridge, NY
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Erscheinungsdatum:2015
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ISSN:
-
ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 33.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
BKL: 33.00 Physik: Allgemeines -
Datenquelle:
Inhaltsverzeichnis – Band 115, Ausgabe 7
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