Availability analysis of redundancy model with generally distributed repair time, imperfect switchover, and interrupted repair (Englisch)
- Neue Suche nach: Lee, Y
- Neue Suche nach: Lee, Y
In:
Electronics letters
;
52
, 22
; 1851-1853
;
2016
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Availability analysis of redundancy model with generally distributed repair time, imperfect switchover, and interrupted repair
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Beteiligte:Lee, Y ( Autor:in )
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Erschienen in:Electronics letters ; 52, 22 ; 1851-1853
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Verlag:
- Neue Suche nach: IET
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Erscheinungsort:Stevenage
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Erscheinungsdatum:2016
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 53.50 / 50.23 / 53.70
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 275/5670
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 52, Ausgabe 22
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