Barrier properties of ultrathin amorphous Al-Ni alloy film in Cu/Si or Cu/SiO2 contact system (Englisch)
- Neue Suche nach: Chen, J. H
- Neue Suche nach: Chen, J. H
- Neue Suche nach: Huo, J. C
- Neue Suche nach: Dai, X. H
- Neue Suche nach: Wei, L. J
- Neue Suche nach: Guo, J. X
- Neue Suche nach: Li, X. H
- Neue Suche nach: Wang, L. H
- Neue Suche nach: Lu, C. J
- Neue Suche nach: Wang, J. B
- Neue Suche nach: Liu, B. T
In:
Physica status solidi / A
;
214
, 2
;
2017
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Barrier properties of ultrathin amorphous Al-Ni alloy film in Cu/Si or Cu/SiO2 contact system
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Beteiligte:Chen, J. H ( Autor:in ) / Huo, J. C / Dai, X. H / Wei, L. J / Guo, J. X / Li, X. H / Wang, L. H / Lu, C. J / Wang, J. B / Liu, B. T
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Erschienen in:Physica status solidi / A ; 214, 2
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Verlag:
- Neue Suche nach: Wiley-VCH
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Erscheinungsort:Berlin
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Erscheinungsdatum:2017
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00 / 51.00 / 33.60 / 33.60
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 530.41
- Weitere Informationen zu Dewey Decimal Classification
- Neue Suche nach: 030/3475
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Schlagwörter:
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Klassifikation:
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Datenquelle:
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