Structural characterization of SnS crystals formed by chemical vapour deposition (Englisch)
- Neue Suche nach: NALIN MEHTA, A
- Neue Suche nach: NALIN MEHTA, A
- Neue Suche nach: ZHANG, H
- Neue Suche nach: DABRAL, A
- Neue Suche nach: RICHARD, O
- Neue Suche nach: FAVIA, P
- Neue Suche nach: BENDER, H
- Neue Suche nach: DELABIE, A
- Neue Suche nach: CAYMAX, M
- Neue Suche nach: HOUSSA, M
- Neue Suche nach: POURTOIS, G
- Neue Suche nach: VANDERVORST, W
In:
Journal of microscopy
;
268
, 3
; 276-287
;
2017
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Structural characterization of SnS crystals formed by chemical vapour deposition
-
Beteiligte:NALIN MEHTA, A ( Autor:in ) / ZHANG, H / DABRAL, A / RICHARD, O / FAVIA, P / BENDER, H / DELABIE, A / CAYMAX, M / HOUSSA, M / POURTOIS, G
-
Erschienen in:Journal of microscopy ; 268, 3 ; 276-287
-
Verlag:
- Neue Suche nach: Wiley-Blackwell
-
Erscheinungsort:Oxford
-
Erscheinungsdatum:2017
-
ISSN:
-
ZDBID:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 33.18 / 30.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 275/3445
-
Schlagwörter:
-
Klassifikation:
-
Datenquelle:
Inhaltsverzeichnis – Band 268, Ausgabe 3
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 219
-
TOC ‐ Issue Information| 2017
- 221
-
Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM‐XX)WALTHER, THOMAS / JONES, LEWYS et al. | 2017
- 225
-
A reliable approach to prepare brittle semiconducting materials for cross‐sectional transmission electron microscopyDYCUS, J.H. / LEBEAU, J.M. et al. | 2017
- 230
-
Nanoscopic analysis of oxygen segregation at tilt boundaries in silicon ingots using atom probe tomography combined with TEM and ab initio calculationsOHNO, Y. / INOUE, K. / FUJIWARA, K. / KUTSUKAKE, K. / DEURA, M. / YONENAGA, I. / EBISAWA, N. / SHIMIZU, Y. / NAGAI, Y. / YOSHIDA, H. et al. | 2017
- 239
-
Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEMBEYER, ANDREAS / DUSCHEK, LENNART / BELZ, JÜRGEN / OELERICH, JAN OLIVER / JANDIERI, KAKHABER / VOLZ, KERSTIN et al. | 2017
- 248
-
Effective absorption correction for energy dispersive X‐ray mapping in a scanning transmission electron microscope: analysing the local indium distribution in rough samples of InGaN alloy layersWANG, X. / CHAUVAT, M.‐P. / RUTERANA, P. / WALTHER, T. et al. | 2017
- 254
-
FIB‐fabricated complex‐shaped 3D chiral photonic silicon nanostructuresROGOV, O.Y. / ARTEMOV, V.V. / GORKUNOV, M.V / EZHOV, A.A. / KHMELENIN, D.N. et al. | 2017
- 259
-
Atomic structure of ‘W’‐type quantum well heterostructures investigated by aberration‐corrected STEMKÜKELHAN, P. / BEYER, A. / FUCHS, C. / WESELOH, M.J. / KOCH, S.W. / STOLZ, W. / VOLZ, K. et al. | 2017
- 269
-
The structure of InAlGaN layers grown by metal organic vapour phase epitaxy: effects of threading dislocations and inversion domains from the GaN templateBEN AMMAR, H. / MINJ, A. / CHAUVAT, M.‐P. / GAMARRA, P. / LACAM, C. / MORALES, M. / RUTERANA, P. et al. | 2017
- 276
-
Structural characterization of SnS crystals formed by chemical vapour depositionNALIN MEHTA, A. / ZHANG, H. / DABRAL, A. / RICHARD, O. / FAVIA, P. / BENDER, H. / DELABIE, A. / CAYMAX, M. / HOUSSA, M. / POURTOIS, G. et al. | 2017
- 288
-
Comparison of cross‐sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafersNORRIS, D.J. / MYRONOV, M. / LEADLEY, D.R. / WALTHER, T. et al. | 2017
- 298
-
Transmission electron microscopy of AlGaAs/GaAs quantum cascade laser structuresWALTHER, T. / KRYSA, A.B. et al. | 2017
- 305
-
The microstructure, local indium composition and photoluminescence in green‐emitting InGaN/GaN quantum wellsCHERY, N. / NGO, T.H. / CHAUVAT, M.P. / DAMILANO, B. / COURVILLE, A. / DE MIERRY, P. / GRIEB, T. / MEHRTENS, T. / KRAUSE, F.F. / MÜLLER‐CASPARY, K. et al. | 2017
- 313
-
Comparative study of image contrast in scanning electron microscope and helium ion microscopeO'CONNELL, R. / CHEN, Y. / ZHANG, H. / ZHOU, Y. / FOX, D. / MAGUIRE, P. / WANG, J.J. / RODENBURG, C. et al. | 2017
- 321
-
The Journal of Microscopy would like to thank all those referees who reviewed papers for the Journal during 2017. Your assistance and contribution to the Journal is greatly appreciated| 2017