Objective Total Isotropic Sensitivity Measurement (Englisch)
- Neue Suche nach: Qi, Yihong
- Neue Suche nach: Qi, Yihong
- Neue Suche nach: Wu, Jiyu
- Neue Suche nach: Zhang, Zheng
- Neue Suche nach: Liu, Lie
- Neue Suche nach: Yu, Wei
- Neue Suche nach: Orlandi, Antonio
- Neue Suche nach: Fan, Jun
- Neue Suche nach: Yang, Zhiping
In:
IEEE transactions on electromagnetic compatibility
;
PP
, 99
; 1-6
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Objective Total Isotropic Sensitivity Measurement
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Beteiligte:Qi, Yihong ( Autor:in ) / Wu, Jiyu / Zhang, Zheng / Liu, Lie / Yu, Wei / Orlandi, Antonio / Fan, Jun / Yang, Zhiping
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Erschienen in:IEEE transactions on electromagnetic compatibility ; PP, 99 ; 1-6
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Verlag:
- Neue Suche nach: Inst.
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Erscheinungsort:New York, NY
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 53.11 / 53.11
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- Neue Suche nach: 770/5665
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Datenquelle:
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