Electrical Characterization of High Energy Electron Irradiated Ni/4H-SiC Schottky Barrier Diodes (Englisch)
- Neue Suche nach: Paradzah, A. T.
- Neue Suche nach: Omotoso, E.
- Neue Suche nach: Legodi, M. J.
- Neue Suche nach: Auret, F. D.
- Neue Suche nach: Meyer, W. E.
- Neue Suche nach: Diale, M.
- Neue Suche nach: Paradzah, A. T.
- Neue Suche nach: Omotoso, E.
- Neue Suche nach: Legodi, M. J.
- Neue Suche nach: Auret, F. D.
- Neue Suche nach: Meyer, W. E.
- Neue Suche nach: Diale, M.
In:
Journal of Electronic Materials
;
45
, 8
; 4177-4182
;
2016
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Electrical Characterization of High Energy Electron Irradiated Ni/4H-SiC Schottky Barrier Diodes
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Beteiligte:Paradzah, A. T. ( Autor:in ) / Omotoso, E. ( Autor:in ) / Legodi, M. J. ( Autor:in ) / Auret, F. D. ( Autor:in ) / Meyer, W. E. ( Autor:in ) / Diale, M. ( Autor:in )
-
Erschienen in:Journal of Electronic Materials ; 45, 8 ; 4177-4182
-
Verlag:
- Neue Suche nach: Springer US
- Neue Suche nach: TMS
-
Erscheinungsort:Warrendale, Pa.
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Erscheinungsdatum:2016
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ISSN:
-
ZDBID:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 51.40 / 33.61 / 51.10 / 53.09
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/5670
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Schlagwörter:
-
Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 45, Ausgabe 8
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