High-resolution electron microscopy study of belite (Englisch)
- Neue Suche nach: Wang, Y. G.
- Neue Suche nach: Zou, B. S.
- Neue Suche nach: Kuo, K. H.
- Neue Suche nach: Feng, X. J.
- Neue Suche nach: Wang, L.
- Neue Suche nach: Long, S. Z.
- Neue Suche nach: Wang, Y. G.
- Neue Suche nach: Zou, B. S.
- Neue Suche nach: Kuo, K. H.
- Neue Suche nach: Feng, X. J.
- Neue Suche nach: Wang, L.
- Neue Suche nach: Long, S. Z.
In:
Journal of Materials Science
;
24
, 3
; 877-880
;
1989
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:High-resolution electron microscopy study of belite
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Beteiligte:Wang, Y. G. ( Autor:in ) / Zou, B. S. ( Autor:in ) / Kuo, K. H. ( Autor:in ) / Feng, X. J. ( Autor:in ) / Wang, L. ( Autor:in ) / Long, S. Z. ( Autor:in )
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Erschienen in:Journal of Materials Science ; 24, 3 ; 877-880
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Verlag:
- Neue Suche nach: Kluwer Academic Publishers
- Neue Suche nach: Springer Science + Business Media B.V.
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Erscheinungsort:Norwell, Mass
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Erscheinungsdatum:1989
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ISSN:
-
ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 275/5010
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 24, Ausgabe 3
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