An improved lumped capacitance method for dielectric measurement (Englisch)
- Neue Suche nach: Lian, A.
- Neue Suche nach: Zhong, W.
- Neue Suche nach: Lian, A.
- Neue Suche nach: Zhong, W.
In:
Journal of Materials Science
;
25
, 10
; 4349-4355
;
1990
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:An improved lumped capacitance method for dielectric measurement
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Beteiligte:
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Erschienen in:Journal of Materials Science ; 25, 10 ; 4349-4355
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Verlag:
- Neue Suche nach: Kluwer Academic Publishers
- Neue Suche nach: Springer Science + Business Media B.V.
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Erscheinungsort:Norwell, Mass
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Erscheinungsdatum:1990
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 275/5010
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 25, Ausgabe 10
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