Dielectric characterization of $ BaTiO_{3} $-$ BaM_{1/3} $$ N_{2/3} $ $ O_{3} $ systems (with M=Co, Mg and N=Nb or Ta) (Englisch)
- Neue Suche nach: Weill, F.
- Neue Suche nach: Rehspringer, J. L.
- Neue Suche nach: Poix, P.
- Neue Suche nach: Bernier, J. C.
- Neue Suche nach: Weill, F.
- Neue Suche nach: Rehspringer, J. L.
- Neue Suche nach: Poix, P.
- Neue Suche nach: Bernier, J. C.
In:
Journal of Materials Science
;
27
, 9
; 2321-2325
;
1992
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Dielectric characterization of $ BaTiO_{3} $-$ BaM_{1/3} $$ N_{2/3} $ $ O_{3} $ systems (with M=Co, Mg and N=Nb or Ta)
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Beteiligte:Weill, F. ( Autor:in ) / Rehspringer, J. L. ( Autor:in ) / Poix, P. ( Autor:in ) / Bernier, J. C. ( Autor:in )
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Erschienen in:Journal of Materials Science ; 27, 9 ; 2321-2325
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Verlag:
- Neue Suche nach: Kluwer Academic Publishers
- Neue Suche nach: Springer Science + Business Media B.V.
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Erscheinungsort:Norwell, Mass
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Erscheinungsdatum:1992
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 275/5010
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 27, Ausgabe 9
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- iii
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ErratumGoto, Takashi / Guo, Chen-Yan / Takeya, Hajime / Hirai, Toshio et al. | 1992