Characterization of $ ZrO_{2} $ and SiC ceramic thin films prepared by electrostatic atomization (Englisch)
- Neue Suche nach: Miao, P.
- Neue Suche nach: Balachandran, W.
- Neue Suche nach: Xiao, P.
- Neue Suche nach: Miao, P.
- Neue Suche nach: Balachandran, W.
- Neue Suche nach: Xiao, P.
In:
Journal of Materials Science
;
36
, 12
; 2925-2930
;
2001
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Characterization of $ ZrO_{2} $ and SiC ceramic thin films prepared by electrostatic atomization
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Beteiligte:
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Erschienen in:Journal of Materials Science ; 36, 12 ; 2925-2930
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Verlag:
- Neue Suche nach: Kluwer Academic Publishers
- Neue Suche nach: Springer Science + Business Media B.V.
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Erscheinungsort:Norwell, Mass
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Erscheinungsdatum:2001
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ISSN:
-
ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 275/5010
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 36, Ausgabe 12
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