Determining the Compositional Profile of HgTe/$ Cd_{x} $$ Hg_{1 –} $ xTe Quantum Wells by Single-Wavelength Ellipsometry (Englisch)
- Neue Suche nach: Shvets, V. A.
- Neue Suche nach: Mikhailov, N. N.
- Neue Suche nach: Ikusov, D. G.
- Neue Suche nach: Uzhakov, I. N.
- Neue Suche nach: Dvoretskii, S. A.
- Neue Suche nach: Shvets, V. A.
- Neue Suche nach: Mikhailov, N. N.
- Neue Suche nach: Ikusov, D. G.
- Neue Suche nach: Uzhakov, I. N.
- Neue Suche nach: Dvoretskii, S. A.
In:
Optics and Spectroscopy
;
127
, 2
; 340-346
;
2019
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Determining the Compositional Profile of HgTe/$ Cd_{x} $$ Hg_{1 –} $ xTe Quantum Wells by Single-Wavelength Ellipsometry
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Beteiligte:Shvets, V. A. ( Autor:in ) / Mikhailov, N. N. ( Autor:in ) / Ikusov, D. G. ( Autor:in ) / Uzhakov, I. N. ( Autor:in ) / Dvoretskii, S. A. ( Autor:in )
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Erschienen in:Optics and Spectroscopy ; 127, 2 ; 340-346
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Verlag:
- Neue Suche nach: Pleiades Publishing
- Neue Suche nach: Maik Nauka/Interperiodica Publ.
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Erscheinungsort:Moscow
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Erscheinungsdatum:2019
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ISSN:
-
ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 33.38 / 33.07
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 770/3445/3465/8000
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Schlagwörter:
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Klassifikation:
BKL: 33.38 Quantenoptik, nichtlineare Optik / 33.07 Spektroskopie Lokalklassifikation TIB: 770/3445/3465/8000 -
Datenquelle:
Inhaltsverzeichnis – Band 127, Ausgabe 2
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