X-ray fluorescence as an additional analytical method for a scanning electron microscope (Englisch)
- Neue Suche nach: Procop, Mathias
- Neue Suche nach: Hodoroaba, Vasile-Dan
- Neue Suche nach: Procop, Mathias
- Neue Suche nach: Hodoroaba, Vasile-Dan
In:
Microchimica Acta
;
161
, 3-4
; 413-419
;
2007
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:X-ray fluorescence as an additional analytical method for a scanning electron microscope
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Beteiligte:Procop, Mathias ( Autor:in ) / Hodoroaba, Vasile-Dan ( Autor:in )
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Erschienen in:Microchimica Acta ; 161, 3-4 ; 413-419
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Verlag:
- Neue Suche nach: Springer-Verlag
- Neue Suche nach: Springer
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Erscheinungsort:Wien [u.a.]
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Erscheinungsdatum:2007
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 35.00 / 35.00 / 35.00
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 560/3650
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 161, Ausgabe 3-4
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