Determination of the reflection coefficient and permittivity of thin cylindrical dielectric and semiconductor specimens at microwave frequencies (Englisch)
- Neue Suche nach: Grigas, I. P.
- Neue Suche nach: Shugurov, V. K.
- Neue Suche nach: Grigas, I. P.
- Neue Suche nach: Shugurov, V. K.
In:
Radiophysics and Quantum Electronics
;
12
, 2
; 246-249
;
1969
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Determination of the reflection coefficient and permittivity of thin cylindrical dielectric and semiconductor specimens at microwave frequencies
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Beteiligte:Grigas, I. P. ( Autor:in ) / Shugurov, V. K. ( Autor:in )
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Erschienen in:Radiophysics and Quantum Electronics ; 12, 2 ; 246-249
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Verlag:
- Neue Suche nach: Kluwer Academic Publishers-Plenum Publishers
- Neue Suche nach: Faraday Press
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Erscheinungsort:New York, NY
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Erscheinungsdatum:1969
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/3447/3470/8000
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Schlagwörter:
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Klassifikation:
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Datenquelle:
Inhaltsverzeichnis – Band 12, Ausgabe 2
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Determination of the reflection coefficient and permittivity of thin cylindrical dielectric and semiconductor specimens at microwave frequenciesGrigas, I. P. / Shugurov, V. K. et al. | 1969
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