In situ atomic force microscopy combined with a quartz-crystal microbalance study of Ag electrodeposition on Pt thin film (Englisch)
- Neue Suche nach: Iwata, F.
- Neue Suche nach: Saruta, K.
- Neue Suche nach: Sasaki, A.
- Neue Suche nach: Iwata, F.
- Neue Suche nach: Saruta, K.
- Neue Suche nach: Sasaki, A.
In:
Applied Physics A
;
66
, Suppl 1
; S463-S466
;
1998
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:In situ atomic force microscopy combined with a quartz-crystal microbalance study of Ag electrodeposition on Pt thin film
-
Beteiligte:
-
Erschienen in:Applied Physics A ; 66, Suppl 1 ; S463-S466
-
Verlag:
- Neue Suche nach: Springer-Verlag
- Neue Suche nach: Springer
-
Erscheinungsort:Berlin
-
Erscheinungsdatum:1998
-
ISSN:
-
ZDBID:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Print
-
Sprache:Englisch
- Neue Suche nach: 51.00 / 33.60 / 53.09
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 020/3475/3485
-
Schlagwörter:
-
Klassifikation:
BKL: 51.00 Werkstoffkunde: Allgemeines / 33.60 Kondensierte Materie: Allgemeines / 53.09 Werkstoffe der Elektrotechnik Lokalklassifikation TIB: 020/3475/3485 -
Datenquelle:
Inhaltsverzeichnis – Band 66, Ausgabe Suppl 1
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STM atomic resolution images of single-wall carbon nanotubesVenema, L.C. / Wildöer, J.W.G. / Dekker, C. / Rinzler, G.A. / Smalley, R.E. et al. | 1998
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- S167
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Analysis of spectroscopic scanning tunneling microscope imagesLi, Jiutao / Schneider, W.-D. / Berndt, R. et al. | 1998
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Influence of resonant tunneling on the imaging of atomic defects on InAs(110) surfaces by low-temperature scanning tunneling microscopyDepuydt, A. / Maslova, N.S. / Panov, V.I. / Rakov, V.V. / Savinov, S.V. / Van Haesendonck, C. et al. | 1998
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Tunnel channels, spectroscopy and imaging in STMHalbritter, J. et al. | 1998
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Single-electron tunneling in $ Au_{55} $ cluster monolayersChi, L.F. / Hartig, M. / Drechsler, T. / Schwaack, T. / Seidel, C. / Fuchs, H. / Schmid, G. et al. | 1998
- S191
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Investigations of the fine structure of I(V) characteristics for highly oriented pyrolitic graphite surface by means of STM/STS at room temperatureOlejniczak, W. / Klusek, Z. / Bieniecki, M. et al. | 1998
- S197
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Scanning tunneling spectroscopy on n-InAs(110): Landau-level quantization and scattering of electron waves at dopant atomsDombrowski, R. / Wittneven, C. / Morgenstern, M. / Wiesendanger, R. et al. | 1998
- S211
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Feedback stabilized force-sensors: a gateway to the direct measurement of interaction potentialsJarvis, S.P. / Dürig, U. / Lantz, M.A. / Yamada, H. / Tokumoto, H. et al. | 1998
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Fast digital electronics for application in dynamic force microscopy using high-Q cantileversLoppacher, C. / Bammerlin, M. / Battiston, F. / Guggisberg, M. / Müller, D. / Hidber, H.R. / Lüthi, R. / Meyer, E. / Güntherodt, H.J. et al. | 1998
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Intermittent contact: tapping or hammering?Behrend, O.P. / Oulevey, F. / Gourdon, D. / Dupas, E. / Kulik, A.J. / Gremaud, G. / Burnham, N.A. et al. | 1998
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Acoustic phase velocity measurements with nanometer resolution by scanning acoustic force microscopyChilla, E. / Hesjedal, T. / Fröhlich, H.-J. et al. | 1998
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Frequency shift of a resonating cantilever in a.c. force microscopy: towards a realistic modelVairac, P. / Cretin, B. et al. | 1998
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- S235
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Measurement of cantilever vibrations with a new heterodyne laser probe: application to scanning microdeformation microscopyCretin, B. / Vairac, P. et al. | 1998
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Finite element simulations of the resolution in electrostatic force microscopyBelaidi, S. / Lebon, F. / Girard, P. / Leveque, G. / Pagano, S. et al. | 1998
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Comparison of dynamic lever STM and noncontact AFMGuggisberg, M. / Bammerlin, M. / Lüthi, R. / Loppacher, C. / Battiston, F. / Lü, J. / Baratoff, A. / Meyer, E. / Güntherodt, H.-J. et al. | 1998
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Transfer of mechanical vibrations from a sample to an AFM-cantilever – a theoretical descriptionHirsekorn, S. et al. | 1998
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The application of force microscopy to immunodiagnostic systems: imaging and biomolecular adhesion measurementsAllen, S. / Chen, X. / Davies, J. / Davies, M.C. / Dawkes, A.C. / Edwards, J.C. / Roberts, C.J. / Tendler, S.J.B. / Williams, P.M. et al. | 1998
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The velocity dependence of frictional forces in point-contact frictionZwörner, O. / Hölscher, H. / Schwarz, U.D. / Wiesendanger, R. et al. | 1998
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Force titration of amino group-terminated self-assembled monolayers using chemical force microscopyZhang, H. / He, H.-X. / Wang, J. / Mu, T. / Liu, Z.-F. et al. | 1998
- S273
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Surface potential studies using Kelvin force spectroscopyLü, J. / Guggisberg, M. / Lüthi, R. / Kubon, M. / Scandella, L. / Gerber, C. / Meyer, E. / Güntherodt, H.-J. et al. | 1998
- S277
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Analysis of the high-frequency response of atomic force microscope cantileversRabe, U. / Turner, J. / Arnold, W. et al. | 1998
- S283
-
The role of adhesion in tapping-mode atomic force microscopySarid, D. / Hunt, J.P. / Workman, R.K. / Yao, X. / Peterson, C.A. et al. | 1998
- S287
-
Dynamics of the cantilever in noncontact atomic force microscopySasaki, N. / Tsukada, M. / Tamura, R. / Abe, K. / Sato, N. et al. | 1998
- S293
-
Dynamic SFM with true atomic resolution on alkali halide surfacesBammerlin, M. / Lüthi, R. / Meyer, E. / Baratoff, A. / Lü, J. / Guggisberg, M. / Loppacher, C. / Gerber, C. / Güntherodt, H.-J. et al. | 1998
- S295
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Stable operation mode for dynamic noncontact atomic force microscopyUeyama, H. / Sugawara, Y. / Morita, S. et al. | 1998
- S299
-
Influence of atmosphere humidity on tribological properties in scanning probe microscope observationSumomogi, T. / Hieda, K. / Endo, T. / Kuwahara, K. et al. | 1998
- S305
-
Low temperature force microscopy based on piezoresistive cantilevers operating at a higher flexural modeVolodin, A. / Van Haesendonck, C. et al. | 1998
- S309
-
Phase contrast in tapping-mode scanning force microscopyGarcía, R. / Tamayo, J. / Calleja, M. / García, F. et al. | 1998
- S313
-
Quantitative elasticity evaluation by contact resonance in an atomic force microscopeYamanaka, K. / Nakano, S. et al. | 1998
- S319
-
Removal of contamination and oxide layers from UHV-AFM tipsArai, T. / Tomitori, M. et al. | 1998
- S325
-
Force microscopy for the investigation of high-frequency surface acoustic wave devicesHesjedal, T. / Fröhlich, H.-J. / Chilla, E. et al. | 1998
- S329
-
Contrast artifacts in tapping tip atomic force microscopyKühle, A. / Sorensen, A.H. / Zandbergen, J.B. / Bohr, J. et al. | 1998
- S333
-
Analysis of lateral force contribution to the topography in contact mode AFMShang, G. / Qiu, X. / Wang, C. / Bai, C. et al. | 1998
- S337
-
Charge distribution on photorefractive crystals observed with an atomic force microscopeSoergel, E. / Krieger, W. / Vlad, V.I. et al. | 1998
- S341
-
Instrumental aspects of magnetic resonance force microscopyStreckeisen, P. / Rast, S. / Wattinger, C. / Meyer, E. / Vettiger, P. / Gerber, C. / Güntherodt, H.-J. et al. | 1998
- S345
-
Direct measurement of the oscillation amplitude and criteria for high-quality images in shear force microscopyBrückl, H. / Matthes, F. / Reiss, G. et al. | 1998
- S349
-
Surface charge mapping of solid surfaces in water by pulsed-force-mode atomic force microscopyMiyatani, T. / Okamoto, S. / Rosa, A. / Marti, O. / Fujihira, M. et al. | 1998
- S353
-
Imaging of surface atoms revolving on elliptical trajectoriesHesjedal, T. / Chilla, E. / Fröhlich, H.-J. et al. | 1998
- S357
-
Local measurements of viscoelastic properties of fluids using near-field ultrasonicsVan Est, J. / Prugne, C. / Cros, B. / Attal, J. / Cretin, B. et al. | 1998
- S361
-
Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantileverHoummady, M. / Farnault, E. et al. | 1998
- S367
-
Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopyWerner, S. / Rudow, O. / Mihalcea, C. / Oesterschulze, E. et al. | 1998
- S371
-
STM-excited and spectrally resolved luminescence of epitaxial GaN and AlGaN layers grown by MBEOrtsiefer, M. / Liebheit, A. / Schwartzkopff, M. / Radojkovic, P. / Gabriel, T. / Hartmann, E. et al. | 1998
- S377
-
New optical probe using ZnO whiskers: analyses . of sub-wavelength dithering and evanescent wave propagationPieralli, C. / Hoummady, M. et al. | 1998
- S381
-
A low-temperature scanning near-field optical microscope for photoluminescence at semiconductor structuresManke, I. / Pahlke, D. / Lorbacher, J. / Busse, W. / Kalka, T. / Richter, W. / Dähne-Prietsch, M. et al. | 1998
- S385
-
Gallium arsenide probes for scanning near-field probe microscopyHeisig, S. / Oesterschulze, E. et al. | 1998
- S391
-
Spin polarization in near-field optical microscopyKobayashi, K. et al. | 1998
- S397
-
Assessment of NSOM resolution on III-V semiconductor thin filmsLabardi, M. / Gucciardi, P.G. / Allegrini, M. / Pelosi, C. et al. | 1998
- S403
-
Polarized light emission from the metal-metal STM junctionPierce, D.T. / Davies, A. / Stroscio, J.A. / Celotta, R.J. et al. | 1998
- S409
-
Eddy current microscopyHoffmann, B. / Houbertz, R. / Hartmann, U. et al. | 1998
- S415
-
Recombination dynamics of traps in $ SiO_{2} $ layer on Si by scanning capacitance microscopyKang, C.J. / Kim, C.K. / Kuk, Y. / Williams, C.C. et al. | 1998
- S421
-
Scanning capacitance microscope as a tool for the characterization of integrated circuitsBorn, A. / Wiesendanger, R. et al. | 1998
- S427
-
Force microscopy imaging of photopatterned organosilane monolayers: application to probe alignment in AFM patterning following photolithographySugimura, H. / Nakagiri, N. et al. | 1998
- S431
-
Scanning capacitance microscope study of a $ SiO_{2} $/Si interface modified by charge injectionTomiye, H. / Yao, T. et al. | 1998
- S435
-
A study of the spatial variation of electric field in highly resistive metal films by scanning tunneling potentiometryRamaswamy, G. / Raychaudhuri, A.K. / Das Gupta, K. / Sambandamurthy, G. et al. | 1998
- S441
-
Freezing of polarization in a Pb(Zr,Ti)$ O_{3} $ film observed by strain imagingTakata, K. / Miki, H. / Kushida-Abdelghafar, K. / Torii, K. / Fujisaki, Y. et al. | 1998
- S447
-
Double-layer structure, corrosion and corrosion inhibition of copper in aqueous solutionMagnussen, O.M. / Vogt, M.R. / Scherer, J. / Behm, R.J. et al. | 1998
- S453
-
Electrochemical pattern formation in a scanning near-field optical microscopeMüller, A.-D. / Müller, F. / Hietschold, M. et al. | 1998
- S457
-
Tip-induced nanoscale electrochemical deposition of palladium and platinum on an Au(111) electrode surfaceNaohara, H. / Ye, S. / Uosaki, K. et al. | 1998
- S463
-
In situ atomic force microscopy combined with a quartz-crystal microbalance study of Ag electrodeposition on Pt thin filmIwata, F. / Saruta, K. / Sasaki, A. et al. | 1998
- S467
-
Electron tunneling across an interfacial water layer inside an STM junction: tunneling distance, barrier height and water polarization effectHahn, J.R. / Hong, Y.A. / Kang, H. et al. | 1998
- S473
-
STM investigation of step orientation and surface dynamics of Cu(111) in hydrochloric acid electrolyteWilms, M. / Broekmann, P. / Kruft, M. / Stuhlmann, C. / Wandelt, K. et al. | 1998
- S477
-
Studies of the initial oxidation of cobalt in alkaline solutions using scanning electrochemical microscopeErts, D. / Ahlberg, E. / Asbjörnsson, J. / Olin, H. / Prikulis, J. et al. | 1998
- S481
-
In situ scanning probe microscopy investigations of electroactive filmsHäring, P. / Kötz, R. / Repphun, G. / Haas, O. / Siegenthaler, H. et al. | 1998
- S487
-
In-situ AFM observation of crystal growth of NaCl in an aqueous solutionShindo, H. / Ohashi, M. et al. | 1998
- S491
-
The (2×5) carbon overlayer structure on Co(11$\bar{2}$0) studied by STMVenvik, H.J. / Borg, A. et al. | 1998
- S495
-
Interaction of low-energy nitrogen ions with an Si(111)-7×7 surface: STM and LEED investigationsHa, J.S. / Park, K.-H. / Yun, W.S. / Lee, E.-H. / Park, S.-J. et al. | 1998
- S501
-
Site-specific chemistry of carbon tetrachloride decomposition on GaAs(001)Li, L. / Qi, H. / Gan, S. / Han, B.-K. / Hicks, R.F. et al. | 1998
- S507
-
An AFM investigation of the mechanism of secondary nucleation induced by contactFriej, S. / Reyhani, M.M. / Parkinson, G.M. et al. | 1998
- S513
-
Au-step atoms as active sites for CO adsorption on Au and bimetallic Au/Pd(111) surfacesRuff, M. / Frey, S. / Gleich, B. / Behm, R.J. et al. | 1998
- S519
-
Low-temperature scanning tunnelling microscopy study of $ O_{2} $ adsorption on Ru(0001)Nilius, N. / Mitte, M. / Neddermeyer, H. et al. | 1998
- S525
-
Growth of epitaxial layers of Co and CoO on Au(111)Sebastian, I. / Heiler, M. / Meinel, K. / Neddermeyer, H. et al. | 1998
- S529
-
Initial growth of $ Al_{2} $$ O_{3} $ on NiAl(001)Blum, R.-P. / Niehus, H. et al. | 1998
- S535
-
Novel methods for preparing EC STM tipsKazinczi, R. / Szõcs, E. / Kálmán, E. / Nagy, P. et al. | 1998
- S539
-
Crystallization of ion-beam-synthesized SiC layer by thermal annealingWu, W. / Chen, D.H. / Cheung, W.Y. / Xu, J.B. / Wong, S.P. / Kwok, R.W.M. / Wilson, I.H. et al. | 1998
- S545
-
Corrosion and inhibition of copper in different electrolyte solutionsShaban, A. / Kálmán, E. / Telegdi, J. / Pálinkás, G. / Dóra, G. et al. | 1998
- S553
-
Scanning tunneling microscopy of cyclic unsaturated organic molecules on Si(001)Hovis, J.S. / Liu, H. / Hamers, R.J. et al. | 1998
- S559
-
Surface structure of native cellulose microcrystals by AFMBaker, A.A. / Helbert, W. / Sugiyama, J. / Miles, M.J. et al. | 1998
- S565
-
Dewetting of thin collagenous precursor filmsMertig, M. / Thiele, U. / Bradt, J. / Klemm, D. / Pompe, W. et al. | 1998
- S569
-
A scanning probe microscopy study of the physisorption and chemisorption of protein molecules onto carboxylate terminated self-assembled monolayersPatel, N. / Davies, M.C. / Heaton, R.J. / Roberts, C.J. / Tendler, S.J.B. / Williams, P.M. et al. | 1998
- S575
-
Comparison of fixed and living liver endothelial cells by atomic force microscopyBraet, F. / Rotsch, C. / Wisse, E. / Radmacher, M. et al. | 1998
- S579
-
The AFM as a tool for chromosomal dissection – the influence of physical parametersStark, R.W. / Thalhammer, S. / Wienberg, J. / Heckl, W.M. et al. | 1998
- S585
-
Conformational fluctuations of supercoiled DNA molecules observed in real time with a scanning force microscopeZuccheri, G. / Dame, R.T. / Aquila, M. / Muzzalupo, I. / Samorì, B. et al. | 1998
- S591
-
Surface morphology studies of in situ polycondensation microcomposites using atomic force microscopyTian, F. / Wang, C. / Lin, Z. / Li, J.W. / Bai, C.L. et al. | 1998
- S597
-
Influence of the topography on adhesion measured by SFMStifter, T. / Weilandt, E. / Marti, O. / Hild, S. et al. | 1998
- S607
-
In-situ investigation of humidity-induced changes on human hair and antennae of the honey bee, Apis mellifera L., by scanning force microscopyResch, R. / Ehn, R. / Tichy, H. / Friedbacher, G. et al. | 1998
- S613
-
Elastic properties of the cell wall of Magnetospirillum gryphiswaldense investigated by atomic force microscopyArnoldi, M. / Kacher, C.M. / Bäuerlein, E. / Radmacher, M. / Fritz, M. et al. | 1998
- S619
-
A new cell design for potentiostatically controlled in situ atomic force microscopyMadsen, L.L. / Friis, E.P. / Andersen, J.E.T. / Moller, P. / Ulstrup, J. et al. | 1998
- S625
-
Application of atomic force microscopy to protein anatomy:. Imaging of supramolecular structures of self-assemblies formed from synthetic peptidesShibata-Seki, T. / Masai, J. / Ogawa, Y. / Sato, K. / Yanagawa, H. et al. | 1998
- S631
-
Application of protein-coated scanning force microscopy probes in measurements of surface affinity to protein adsorptionChen, X. / Patel, N. / Davies, M.C. / Roberts, C.J. / Tendler, S.J.B. / Williams, P.M. / Davies, J. / Dawkes, A.C. / Edwards, J.C. et al. | 1998
- S635
-
Adlayer formation of DNA base cytosine over natural zeolite heulandite(010) surface by AFMKomiyama, M. / Gu, M. / Shimaguchi, T. / Wu, H.-M. / Okada, T. et al. | 1998
- S639
-
Microbially influenced corrosion visualized by atomic force microscopyTelegdi, J. / Keresztes, Z. / Pálinkás, G. / Kálmán, E. / Sand, W. et al. | 1998
- S643
-
In situ STM tip-induced electropolymerization of poly(3-octylthiophene)Zhou, L. / Ho, P.K.H. / Zhang, P.C. / Li, S.F.Y. / Xu, G.Q. et al. | 1998
- S649
-
Molecular mechanics simulation of uracil adlayers on molybdenum disulfide and graphite surfacesSowerby, S.J. / Edelwirth, M. / Heckl, W.M. et al. | 1998
- S659
-
AFM-tip-induced and current-induced local oxidation of silicon and metalsAvouris, P. / Martel, R. / Hertel, T. / Sandstrom, R. et al. | 1998
- S669
-
Manipulation of $ C_{60} $ molecules on Cu(111) surfaces using a scanning tunneling microscopeCuberes, M.T. / Schlittler, R.R. / Gimzewski, J.K. et al. | 1998
- S675
-
Low-temperature manipulation of Ag atoms and clusters on a Ag(110) surfaceLi, J.T. / Schneider, W.-D. / Berndt, R. et al. | 1998
- S679
-
Ferroelectric domain switching in tri-glycine sulphate and barium-titanate bulk single crystals by scanning force microscopyEng, L.M. / Abplanalp, M. / Günter, P. et al. | 1998
- S685
-
STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo/Si multilayer by reactive ion etchingHartwich, J. / Dreeskornfeld, L. / Heisig, V. / Rahn, S. / Wehmeyer, O. / Kleineberg, U. / Heinzmann, U. et al. | 1998
- S689
-
Indentation effects on atom manipulation on Si(111) surfaces investigated by STMHasunuma, R. / Komeda, T. / Tokumoto, H. et al. | 1998
- S695
-
Scanning tunnelling spectroscopy of dangling-bond wires fabricated on the Si(100)-2×1-H surfaceHashizume, T. / Heike, S. / Wada, Y. / Watanabe, S. / Hasegawa, T. / Kitazawa, K. et al. | 1998
- S701
-
STM-assisted manipulation of Ag nanoparticlesRadojkovic, P. / Schwartzkopff, M. / Gabriel, T. / Hartmann, E. et al. | 1998
- S707
-
Generation and analysis of nano-scale Al islands by STMHu, Xiaoming / von Blanckenhagen, P. et al. | 1998
- S711
-
Deposition of size-selected clusters at hyperthermal energies investigated by STMKaiser, B. / Bernhardt, T.M. / Rademann, K. et al. | 1998
- S715
-
SPM-based nanofabrication using a synchronization techniqueSong, Jiaqing / Liu, Zhongfan / Li, Chunzeng / Chen, Haifeng / He, Huixin et al. | 1998
- S719
-
Mechanism of tip-assisted migration and desorption of DNA base molecules on an $ SrTiO_{3} $(100)-$\sqrt{5}$×$\sqrt{5}$ surfaceAkiyama, R. / Matsumoto, T. / Kawai, T. et al. | 1998
- S723
-
Biomolecular approach to nanotube fabricationMertig, M. / Kirsch, R. / Pompe, W. et al. | 1998
- S729
-
Multi-step process control and characterization of scanning probe lithographyPeterson, C.A. / Ruskell, T.G. / Pyle, J.L. / Workman, R.K. / Yao, X. / Hunt, J.P. / Sarid, D. / Parks, H.G. / Vermeire, B. et al. | 1998
- S735
-
I(V) characteristics of one-dimensional tunnel junction arrangementsVolmar, U.E. / Weber, U. / Houbertz, R. / Hartmann, U. et al. | 1998
- S741
-
Atom extraction from an $ MoS_{2} $ surface with a scanning tunnelling microscope: an ab initio studyCaulfield, J.C. / Fisher, A.J. et al. | 1998
- S745
-
Supramolecular assembly of individual $ C_{60} $ molecules on a monolayer of 4,$ 4^{′} $-dimethylbianthrone moleculesCuberes, M.T. / Schlittler, R.R. / Gimzewski, J.K. et al. | 1998
- S749
-
Electric field effect and atomic manipulation process with the probe tip of a scanning tunneling microscopeBouju, X. / Devel, M. / Girard, C. et al. | 1998
- S753
-
Nanostructure fabrication with a point contact formation between a gold tip and a Si(111)-(7×7) surface with an ultrahigh vacuum scanning tunneling microscopeFujita, D. / Sheng, H.-Y. / Dong, Z.-C. / Nejoh, H. et al. | 1998
- S757
-
Nanoprocessing of metastable nm-period multilayersGorbunov, A.A. / Richter, J. / Pompe, W. et al. | 1998
- S763
-
AFM observation of surface reconstruction of $ C_{60} $ single crystalsKim, Y. / Jiang, L. / Iyoda, T. / Li, J. / Kitazawa, K. / Hashimoto, K. / Fujishima, A. et al. | 1998
- S767
-
Formation of new terraces via diffusion induced by the field gradient in scanning tunneling microscopyMéndez, J. / Gómez-Herrero, J. / Pascual, J.I. / Baró, A.M. et al. | 1998
- S771
-
Tungsten silicide formation on an STM tip during atom manipulationShimizu, T. / Kim, J.-T. / Tokumoto, H. et al. | 1998
- S777
-
Nano-hole formation on gold surface using scanning tunnelling microscopeLebreton, C. / Wang, Z.Z. et al. | 1998
- S783
-
The stability of nanostructures fabricated on Si(111)-7×7 surfaceGao, Juning / Yang, Haiqiang / Zhao, Yufeng / Xue, Zengquan / Pang, Shijin et al. | 1998
- S787
-
STM-induced formation of Ag islands on Ag(111)Freund, J.E. / Edelwirth, M. / Grimminger, J. / Schloderer, R. / Heckl, W.M. et al. | 1998
- S791
-
Field induced oxidation of silicon by SPM: study of the mechanism at negative sample voltage by STM, ESTM and AFMAbadal, G. / Pérez-Murano, F. / Barniol, N. / Aymerich, X. et al. | 1998
- S799
-
AFM investigations for development of printed circuit boardsBreuer, N. / Dietrich, G. / Haubold, S. / Hülsmann, T. / Meyer, H. / Zimmermann, H. et al. | 1998
- S805
-
Scanning probe microscopy on new dental alloysReusch, B. / Geis-Gerstorfer, J. / Ziegler, C. et al. | 1998
- S809
-
Atomic force microscope-based data storage: track servo and wear studyTerris, B.D. / Rishton, S.A. / Mamin, H.J. / Ried, R.P. / Rugar, D. et al. | 1998
- S815
-
Nanoscale evaluation of surface roughness of metal films prepared by laser ablationSumomogi, T. / Sakai, H. / Nakata, M. / Endo, T. et al. | 1998
- S819
-
Correction of surface roughness measurements in SPM imagingDongmo, S. / Vautrot, P. / Bonnet, N. / Troyon, M. et al. | 1998
- S825
-
Nanoindentation on polycarbonate/polymethyl methacrylate BlendsDrechsler, D. / Karbach, A. / Fuchs, H. et al. | 1998
- S831
-
Two-dimensional nanometer-scale calibration based on one-dimensional gratingsGarnaes, J. / Nielsen, L. / Dirscherl, K. / Jørgensen, J.F. / Rasmussen, J.B. / Lindelof, P.E. / Sørensen, C.B. et al. | 1998
- S837
-
A metrological scanning force microscope used for coating thickness and other topographical measurementsBienias, M. / Gao, S. / Hasche, K. / Seemann, R. / Thiele, K. et al. | 1998
- S843
-
Nanohardness measurements for studying local mechanical properties of metalsKempf, M. / Göken, M. / Vehoff, H. et al. | 1998
- S847
-
Lateral metrology using scanning probe microscopes, 2D pitch standards and image processingJorgensen, J.F. / Jensen, C.P. / Garnaes, J. et al. | 1998
- S853
-
Two-dimensional positioning of the scanning tunneling microscope stage using a crystal as a scale referenceKawakatsu, H. / Hoshi, Y. / Bleuler, H. / Kougami, H. / Bossardt, M. / Vezzin, N. et al. | 1998
- S857
-
Design and construction of a high-resolution 3D translation stage for metrological applicationsKoops, K.R. / Banning, R. / Scholte, P.M.L.O. / Heerens, W.C. / Adriaens, J.M.T.A. / de Koning, W.L. et al. | 1998
- S861
-
A three-dimensional scanner for probe microscopy on the millimetre scaleMariani, T. / Frediani, C. / Ascoli, C. et al. | 1998
- S867
-
Characterizing wear processes on orthopaedic materials using scanning probe microscopyCampbell, P.A. / O’Rourke, B. / Dawson, P. / Turner, R.J. / Walmsley, D.G. / Spedding, P.L. / Watters, E.P. et al. | 1998
- S875
-
Theoretical study of the resistance of short (Xe)n wires within an STM junction: the (Xe)2 casePizzagalli, L. / Joachim, C. / Bouju, X. / Girard, C. et al. | 1998
- S879
-
Force interaction in low-amplitude ac-mode atomic force microscopy:. cantilever simulations and comparison with data from Si(111)7×7Erlandsson, R. / Olsson, L. et al. | 1998
- S885
-
Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulationAnczykowski, B. / Cleveland, J.P. / Krüger, D. / Elings, V. / Fuchs, H. et al. | 1998
- S891
-
Influence of tip geometry on fractal analysis of atomic force microscopy imagesMannelquist, A. / Almqvist, N. / Fredriksson, S. et al. | 1998
- S897
-
Electron transport in ballistic electron emission microscopyMenegozzi, R. / Reinhard, P.-G. / Schulz, M. et al. | 1998
- S901
-
A simple adsorbate model in STMBracher, C. / Riza, M. / Kleber, M. et al. | 1998
- S907
-
Electric field effects in scanning tunneling microscope imagingStokbro, K. / Quaade, U. / Grey, F. et al. | 1998
- S911
-
Noise-compliant tip-shape derivationWilliams, P.M. / Davies, M.C. / Roberts, C.J. / Tendler, S.J.B. et al. | 1998
- S915
-
Reconstruction of the surface topography by detected SNOM/PSTM signalsJin, Z. / Wang, K. / Huang, W. et al. | 1998
- S919
-
Dynamical effective potential for tunneling: an exact matrix method and a path-integral techniqueNess, H. / Fisher, A.J. et al. | 1998
- S925
-
A theory of the energy dependent STM image of a charge density waveSacks, W. / Roditchev, D. / Klein, J. et al. | 1998
- S935
-
Nonlinear tip–sample interactions affecting frequency responses of microcantilevers in tapping mode atomic force microscopyHoummady, M. / Rochat, E. / Farnault, E. et al. | 1998
- S939
-
Computer simulations: subwavelength resolution with an apertureless SNOMv. Freymann, G. / Schimmel, T. / Wegener, M. et al. | 1998
- S947
-
Scanning tunneling microscopy of the GaN(000$\bar{1}$) surfaceSmith, A.R. / Feenstra, R.M. / Greve, D.W. / Neugebauer, J. / Northrup, J.E. et al. | 1998
- S953
-
In situ observation of thermal annealing processes of nanoholes on Si(111) 7 × 7Kraus, A. / Hildebrandt, S. / Kulla, R. / Wilhelmi, G. / Neddermeyer, H. et al. | 1998
- S959
-
Ordering in ternary compound semiconductors studied with cross-sectional scanning tunneling microscopyHeinrich, A.J. / Wenderoth, M. / Rosentreter, M.A. / Engel, K. / Schneider, M.A. / Ulbrich, R.G. / Weber, E.R. / Uchida, K. et al. | 1998
- S963
-
Imaging insulating oxides by elevated-temperature STMCastell, M.R. / Muggelberg, C. / Dudarev, S.L. / Sutton, A.P. / Briggs, G.A.D. / Goddard, D.T. et al. | 1998
- S969
-
STM study of the initial oxidation stage of Ge(100) 2×1Fukuda, T. / Ogino, T. et al. | 1998
- S973
-
Photovoltaic characterization of semiconductors with STMHagen, T. / Grafström, S. / Kowalski, J. / Neumann, R. et al. | 1998
- S977
-
STM measurements of barrier height on Si(111)-7×7 and GaAs(110) cleaved surfaces using I(z), z(V) and I(z(V),V) techniquesGrandidier, B. / Nys, J.P. / Stievenard, D. / de la Bro&ıuml;se, X. / Delerue, C. / Lannoo, M. et al. | 1998
- S981
-
Role of Na in the promotion of the Ge(111) surface oxidationJeon, D. / Joo, H.W. / Hashizume, T. et al. | 1998
- S985
-
STM observation of the atomic hydrogen interaction with the Si(111)$\sqrt{31}$×$\sqrt{31}$-In surfaceKatayama, M. / Numata, T. / Kubo, O. / Tani, H. / Saranin, A. / Oura, K. et al. | 1998
- S989
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Monatomic step structure on the Si(001) surfaceKoo, J.-Y. / Yi, J.-Y. / Hwang, C. / Kim, D.-H. / Lee, G. / Lee, S. et al. | 1998
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A UHV STM for in situ characterization of MBE/CVD growth on 4-inch wafersLeifeld, O. / Müller, B. / Grützmacher, D.A. / Kern, K. et al. | 1998
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Topographical and structural investigations of phosphorous-doped silicon filmsSorschag, K. / Gold, H. / Lutz, J. / Kuchar, F. / Pippan, M. / Noll, H. et al. | 1998