Z-scan technique for elliptic Gaussian beams (Englisch)
- Neue Suche nach: Tsigaridas, G.
- Neue Suche nach: Fakis, M.
- Neue Suche nach: Polyzos, I.
- Neue Suche nach: Persephonis, P.
- Neue Suche nach: Giannetas, V.
- Neue Suche nach: Tsigaridas, G.
- Neue Suche nach: Fakis, M.
- Neue Suche nach: Polyzos, I.
- Neue Suche nach: Persephonis, P.
- Neue Suche nach: Giannetas, V.
In:
Applied Physics B
;
77
, 1
; 71-75
;
2003
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Z-scan technique for elliptic Gaussian beams
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Beteiligte:Tsigaridas, G. ( Autor:in ) / Fakis, M. ( Autor:in ) / Polyzos, I. ( Autor:in ) / Persephonis, P. ( Autor:in ) / Giannetas, V. ( Autor:in )
-
Erschienen in:Applied Physics B ; 77, 1 ; 71-75
-
Verlag:
- Neue Suche nach: Springer Berlin Heidelberg
- Neue Suche nach: Springer
-
Erscheinungsort:Berlin
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Erscheinungsdatum:2003
-
ISSN:
-
ZDBID:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
-
Sprache:Englisch
- Neue Suche nach: 33.38 / 33.18 / 50.37
- Weitere Informationen zu Basisklassifikation
- Neue Suche nach: 020/3445/3615
-
Schlagwörter:
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Klassifikation:
BKL: 33.38 Quantenoptik, nichtlineare Optik / 33.18 Optik / 50.37 Technische Optik Lokalklassifikation TIB: 020/3445/3615 -
Datenquelle:
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