Structural, optical and electrical properties of ZnO:Al thin films for optoelectronic applications (Englisch)
Freier Zugriff
- Neue Suche nach: Ammaih, Youssef
- Neue Suche nach: Lfakir, Abderrazak
- Neue Suche nach: Hartiti, Bouchaib
- Neue Suche nach: Ridah, Abderraouf
- Neue Suche nach: Thevenin, Philippe
- Neue Suche nach: Siadat, Meryane
- Neue Suche nach: Ammaih, Youssef
- Neue Suche nach: Lfakir, Abderrazak
- Neue Suche nach: Hartiti, Bouchaib
- Neue Suche nach: Ridah, Abderraouf
- Neue Suche nach: Thevenin, Philippe
- Neue Suche nach: Siadat, Meryane
In:
Optical and Quantum Electronics
;
46
, 1
; 229-234
;
2013
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Structural, optical and electrical properties of ZnO:Al thin films for optoelectronic applications
-
Beteiligte:Ammaih, Youssef ( Autor:in ) / Lfakir, Abderrazak ( Autor:in ) / Hartiti, Bouchaib ( Autor:in ) / Ridah, Abderraouf ( Autor:in ) / Thevenin, Philippe ( Autor:in ) / Siadat, Meryane ( Autor:in )
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Erschienen in:Optical and Quantum Electronics ; 46, 1 ; 229-234
-
Verlag:
- Neue Suche nach: Springer US
- Neue Suche nach: Springer Science + Business Media B.V
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Erscheinungsort:Dordrecht [u.a.]
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Erscheinungsdatum:2013
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ISSN:
-
ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
- Neue Suche nach: 33.38 / 33.72$jHalbleiterphysik / 33.72 / 33.23$jQuantenphysik / 53.54$jOptoelektronik / 33.18$jOptik / 33.23 / 52.88$jFeinwerktechnik$jMechatronik / 33.18 / 53.54 / 52.88 / 33.38$jQuantenoptik$jnichtlineare Optik
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
BKL: 33.38 Quantenoptik, nichtlineare Optik / 33.72$jHalbleiterphysik / 33.72 Halbleiterphysik / 33.23$jQuantenphysik / 53.54$jOptoelektronik / 33.18$jOptik / 33.23 Quantenphysik / 52.88$jFeinwerktechnik$jMechatronik / 33.18 Optik / 53.54 Optoelektronik / 52.88 Feinwerktechnik, Mechatronik / 33.38$jQuantenoptik$jnichtlineare Optik -
Datenquelle:
Inhaltsverzeichnis – Band 46, Ausgabe 1
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