Determination of Low C Concentration in Czochralski-Grown Si for Solar Cell Applications by Liquid-N-Temperature Photoluminescence After Electron Irradiation (Englisch)
- Neue Suche nach: Tajima, Michio
- Neue Suche nach: Kiuchi, Hirotatsu
- Neue Suche nach: Higuchi, Fumito
- Neue Suche nach: Ishikawa, Yoichiro
- Neue Suche nach: Ogura, Atsushi
- Neue Suche nach: Tajima, Michio
- Neue Suche nach: Kiuchi, Hirotatsu
- Neue Suche nach: Higuchi, Fumito
- Neue Suche nach: Ishikawa, Yoichiro
- Neue Suche nach: Ogura, Atsushi
In:
Journal of Electronic Materials
;
47
, 9
; 5056-5060
;
2018
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Determination of Low C Concentration in Czochralski-Grown Si for Solar Cell Applications by Liquid-N-Temperature Photoluminescence After Electron Irradiation
-
Beteiligte:Tajima, Michio ( Autor:in ) / Kiuchi, Hirotatsu ( Autor:in ) / Higuchi, Fumito ( Autor:in ) / Ishikawa, Yoichiro ( Autor:in ) / Ogura, Atsushi ( Autor:in )
-
Erschienen in:Journal of Electronic Materials ; 47, 9 ; 5056-5060
-
Verlag:
- Neue Suche nach: Springer US
- Neue Suche nach: TMS
-
Erscheinungsort:Warrendale, Pa
-
Erscheinungsdatum:2018
-
ISSN:
-
ZDBID:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
- Neue Suche nach: 53.09$jWerkstoffe der Elektrotechnik / 51.40$jWerkstoffe für bestimmte Anwendungsgebiete / 33.61$jFestkörperphysik / 51.10$jMetallphysik / 51.40 / 33.61 / 51.10 / 53.09
- Weitere Informationen zu Basisklassifikation
-
Schlagwörter:
-
Klassifikation:
BKL: 53.09$jWerkstoffe der Elektrotechnik / 51.40$jWerkstoffe für bestimmte Anwendungsgebiete / 33.61$jFestkörperphysik / 51.10$jMetallphysik / 51.40 Werkstoffe für bestimmte Anwendungsgebiete / 33.61 Festkörperphysik / 51.10 Metallphysik / 53.09 Werkstoffe der Elektrotechnik -
Datenquelle:
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