An empirical study of factors affecting cross-project aging-related bug prediction with TLAP (Englisch)
- Neue Suche nach: Qin, Fangyun
- Neue Suche nach: Wan, Xiaohui
- Neue Suche nach: Yin, Beibei
- Neue Suche nach: Qin, Fangyun
- Neue Suche nach: Wan, Xiaohui
- Neue Suche nach: Yin, Beibei
In:
Software Quality Journal
;
28
, 1
; 107-134
;
2019
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:An empirical study of factors affecting cross-project aging-related bug prediction with TLAP
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Beteiligte:
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Erschienen in:Software Quality Journal ; 28, 1 ; 107-134
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Verlag:
- Neue Suche nach: Springer US
- Neue Suche nach: Springer Science + Business Media B.V
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Erscheinungsort:Dordrecht [u.a.]
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Erscheinungsdatum:2019
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ISSN:
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ZDBID:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
- Neue Suche nach: 54.52$jSoftware engineering / 54.52
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
BKL: 54.52$jSoftware engineering / 54.52 Software engineering -
Datenquelle:
Inhaltsverzeichnis – Band 28, Ausgabe 1
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