X-ray diffraction and transmission electron microscopy analysis of ordering and structure in $ Al_{1−x} $$ In_{x} $As thin films (Englisch)
- Neue Suche nach: Forrest, R. L.
- Neue Suche nach: Kulik, J.
- Neue Suche nach: Golding, T. D.
- Neue Suche nach: Moss, S. C.
- Neue Suche nach: Forrest, R. L.
- Neue Suche nach: Kulik, J.
- Neue Suche nach: Golding, T. D.
- Neue Suche nach: Moss, S. C.
In:
Journal of Materials Research
;
15
, 1
; 45-55
;
2000
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:X-ray diffraction and transmission electron microscopy analysis of ordering and structure in $ Al_{1−x} $$ In_{x} $As thin films
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Beteiligte:Forrest, R. L. ( Autor:in ) / Kulik, J. ( Autor:in ) / Golding, T. D. ( Autor:in ) / Moss, S. C. ( Autor:in )
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Erschienen in:Journal of Materials Research ; 15, 1 ; 45-55
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Verlag:
- Neue Suche nach: Springer International Publishing
- Neue Suche nach: Materials Research Society
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Erscheinungsort:Warrendale, Pa.
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Erscheinungsdatum:2000
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ISSN:
-
ZDBID:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 770/5000
- Neue Suche nach: 51.00
- Weitere Informationen zu Basisklassifikation
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Schlagwörter:
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Klassifikation:
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Datenquelle:
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