Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope (Englisch)
- Neue Suche nach: Tsuruoka, Tohru
- Neue Suche nach: Ushioda, Sukekatsu
- Neue Suche nach: Tsuruoka, Tohru
- Neue Suche nach: Ushioda, Sukekatsu
In:
Microscopy
;
53
, 2
;
169-
;
2004
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope
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Beteiligte:Tsuruoka, Tohru ( Autor:in ) / Ushioda, Sukekatsu ( Autor:in )
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Erschienen in:Microscopy ; 53, 2 ; 169-
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Verlag:
- Neue Suche nach: Oxford University Press
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Erscheinungsdatum:01.04.2004
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 53, Ausgabe 2
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