Study of terahertz reflection spectra of optically thin RDX samples by terahertz imaging with spectral resolution (Unbekannt)
- Neue Suche nach: Plekhanov, Andrei A.
- Weitere Informationen zu Plekhanov, Andrei A.:
- https://orcid.org/0000-0001-8835-4791
- Neue Suche nach: Akmalov, Artem E.
- Neue Suche nach: Kotkovskii, Gennadii E.
- Neue Suche nach: Kozlovskii, Konstantin I.
- Neue Suche nach: Kuzishchin, Yury A.
- Neue Suche nach: Martynov, Igor L.
- Neue Suche nach: Maksimov, Evgenii M.
- Neue Suche nach: Osipov, Evgenii V.
- Neue Suche nach: Chistyakov, Alexander A.
- Neue Suche nach: Plekhanov, Andrei A.
- Neue Suche nach: Akmalov, Artem E.
- Neue Suche nach: Kotkovskii, Gennadii E.
- Neue Suche nach: Kozlovskii, Konstantin I.
- Neue Suche nach: Kuzishchin, Yury A.
- Neue Suche nach: Martynov, Igor L.
- Neue Suche nach: Maksimov, Evgenii M.
- Neue Suche nach: Osipov, Evgenii V.
- Neue Suche nach: Chistyakov, Alexander A.
In:
Optical Engineering
;
62
, 3
;
034109
;
2023
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Study of terahertz reflection spectra of optically thin RDX samples by terahertz imaging with spectral resolution
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Weitere Titelangaben:Opt. Eng.
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Beteiligte:Plekhanov, Andrei A. ( Autor:in ) / Akmalov, Artem E. ( Autor:in ) / Kotkovskii, Gennadii E. ( Autor:in ) / Kozlovskii, Konstantin I. ( Autor:in ) / Kuzishchin, Yury A. ( Autor:in ) / Martynov, Igor L. ( Autor:in ) / Maksimov, Evgenii M. ( Autor:in ) / Osipov, Evgenii V. ( Autor:in ) / Chistyakov, Alexander A. ( Autor:in )
-
Erschienen in:Optical Engineering ; 62, 3 ; 034109
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Verlag:
- Neue Suche nach: Society of Photo-Optical Instrumentation Engineers
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Erscheinungsdatum:23.03.2023
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Unbekannt
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Schlagwörter:
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Datenquelle:
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